A system for depositing a thin film on a substrate using a vapor deposition process is described. The deposition system includes a process chamber having a vacuum pumping system configured to evacuate the process chamber, a substrate holder coupled to the process chamber and configured to support th
A system for depositing a thin film on a substrate using a vapor deposition process is described. The deposition system includes a process chamber having a vacuum pumping system configured to evacuate the process chamber, a substrate holder coupled to the process chamber and configured to support the substrate, a gas distribution system coupled to the process chamber and configured to introduce a film forming composition to a process space in the vicinity of a surface of the substrate, a non-ionizing heat source separate from the substrate holder that is configured to receive a flow of the film forming composition and to cause thermal fragmentation of one or more constituents of the film forming composition when heated, and one or more power sources coupled to the heating element array and configured to provide an electrical signal to the at least one heating element zone. The deposition system further includes a remote source coupled to the process chamber and configured to supply a reactive composition to the process chamber to chemically interact with the substrate, wherein the remote source comprises a remote plasma generator, a remote radical generator, a remote ozone generator, or a water vapor generator, or a combination of two or more thereof.
대표청구항▼
1. A deposition system for depositing a thin film on a substrate, comprising: a process chamber having a vacuum pumping system configured to evacuate said process chamber;a substrate holder coupled to said process chamber and configured to support said substrate;a gas distribution system coupled to
1. A deposition system for depositing a thin film on a substrate, comprising: a process chamber having a vacuum pumping system configured to evacuate said process chamber;a substrate holder coupled to said process chamber and configured to support said substrate;a gas distribution system coupled to said process chamber and configured to introduce a film forming composition to a process space in the vicinity of a surface of said substrate;a non-ionizing heat source comprising an arrangement of one or more heating elements separate from said substrate holder and positioned to receive a flow of said film forming composition in contact with surfaces of said one or more heating elements to interact therewith and to cause thermal fragmentation of one or more constituents of said film forming composition when said one or more heating elements are heated;one or more power sources coupled to said one or more heating elements, and configured to provide an electrical signal to said one or more heating elements; anda remote source positioned entirely outside said process chamber and configured to generate a reactive composition in said remote source, and a gas injection system comprising a plurality of gas nozzles positioned inside said process chamber and a gas line providing a coupling between an outlet of said remote source and said plurality of gas nozzles for conveying said reactive composition generated in said remote source entirely outside said process chamber to said plurality of gas nozzles positioned inside said process chamber, and said gas injection system positioned to introduce said reactive composition into said process chamber within a plane above said substrate and below said arrangement of one or more heating elements to chemically interact with said substrate, said remote source comprising a remote plasma generator, a remote radical generator, a remote ozone generator, a remote water vapor generator, or a combination of two or more thereof. 2. The deposition system of claim 1, wherein said one or more heating elements are resistive heating elements, and said arrangement of said one or more heating elements comprises at least one heating element zone configured to receive said flow of said film forming composition across or through said at least one heating element zone to contact said surfaces of said one or more resistive heating elements in order cause thermal fragmentation of one or more constituents of said film forming composition when heated. 3. The deposition system of claim 1, wherein said plurality of gas nozzles are arranged in said process chamber beyond a peripheral edge of said arrangement of said one or more heating elements. 4. The deposition system of claim 1, wherein said gas injection system comprises a gas injection ring having said plurality of gas nozzles, said gas injection ring being arranged in said process chamber above said substrate and below said arrangement of said one or more heating elements. 5. The deposition system of claim 1, wherein said reactive composition includes atomic oxygen, atomic hydrogen, or atomic nitrogen, or both atomic oxygen and atomic nitrogen. 6. The deposition system of claim 1, said gas injection system further comprising: a first gas valve in said gas line coupling said outlet of said remote source to said plurality of gas nozzles to permit a first flow of said reactive composition to said process chamber; anda second gas line coupling said outlet of said remote source to said vacuum pumping system through a second gas valve to permit a second flow of said reactive composition to said vacuum pumping system without passing through said process chamber. 7. The deposition system of claim 1, wherein said remote source includes a remote water vapor generator. 8. The deposition system of claim 1, wherein said remote source consists of said remote plasma generator, said remote radical generator, or said remote water vapor generator, or a combination of two or more thereof. 9. The deposition system of claim 2, wherein said arrangement of said one or more heating elements comprises a plurality of heating element zones, each including at least one of said one or more resistive heating elements, and each heating element zone of said plurality of heating element zones configured to receive a portion of said flow of said film forming composition across or through said heating element zone to contact said surfaces of said at least one resistive heating element in order to cause pyrolysis of one or more constituents of said film forming composition when heated, wherein each of said plurality of heating element zones is configured electrically independent of one another, and wherein said arrangement comprising said plurality of heating element zones effects delivery of said film forming composition to different regions of said substrate. 10. The deposition system of claim 9, wherein said gas distribution system is configured to control an amount of said flow of said film forming composition to each of said plurality of heating element zones. 11. The deposition system of claim 2, wherein said gas distribution system comprises a plenum configured to receive said film forming composition, and one or more openings aligned with said one or more resistive heating elements of said at least one heating element zone and configured to distribute and flow said film forming composition over said one or more resistive heating elements. 12. The deposition system of claim 2, wherein at least one of said one or more resistive heating elements comprises a metal-containing ribbon or metal-containing wire, and wherein said one or more power sources comprise a direct current (DC) power source, or an alternating current (AC) power source, or a combination thereof. 13. The deposition system of claim 2, wherein said one or more resistive heating elements of said at least one heating element zone comprises: a mounting structure configured to support at least one of said one or more resistive heating elements, said mounting structure comprising: a static mounting device coupled to said mounting structure and configured to fixedly couple said at least one of said one or more resistive heating elements to said mounting structure, anda dynamic mounting device coupled to said mounting structure and configured to automatically compensate for changes in a length of said at least one of said one or more resistive heating elements,wherein said dynamic mounting device comprises a thermal break configured to reduce heat transfer between said dynamic mounting device and said mounting structure, andwherein said at least one of said one or more resistive heating elements comprises a first end fixedly coupled to said static mounting device, a second end fixedly coupled to said static mounting device, a bend coupled to said dynamic mounting device and located between said first end and said second end, a first straight section extending between said first end and said bend, and a second straight section extending between said second end and said bend. 14. The deposition system of claim 1, wherein said substrate holder is coupled to a temperature control system configured to control a temperature of said substrate. 15. The deposition system of claim 1, wherein said substrate holder comprises a backside gas supply system configured to supply a heat transfer gas to a backside of said substrate. 16. The deposition system of claim 15, wherein said backside gas supply system is configured to independently supply said heat transfer gas to a plurality of heat transfer gas supply zones at said backside of said substrate. 17. The deposition system of claim 2, further comprising: a controller coupled to said one or more power sources, said substrate holder, said gas distribution system, and said remote source, and configured to control a temperature of at least one of said at least one heating element zone, a flow rate of said film forming composition, or a flow rate of said reactive composition, or any combination of two or more thereof.
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