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An apparatus for measuring intensity and/or range characteristics of an object(s), comprising: a signal source to emit modulation signals at a frequency(s); an illuminator to illuminate the object(s) by a first modulation signal; a sensor comprising a pixel(s), wherein the sensor creates a sampled c

An apparatus for measuring intensity and/or range characteristics of an object(s), comprising: a signal source to emit modulation signals at a frequency(s); an illuminator to illuminate the object(s) by a first modulation signal; a sensor comprising a pixel(s), wherein the sensor creates a sampled correlated signal by sampling the correlation of a backscattered signal with a second modulation signal within the pixel; and a processor to determine range/intensity characteristics of component returns within the pixel(s) by comparing sampled correlated signals using measurements(s), wherein the measurement(s) comprise first and second modulation signals having a characteristic(s) selected from: (a) two or more different modulation frequencies, (b) a different modulation frequency(s) and an offset of the correlation waveform, and (c) another different modulation frequency(s) and one selected from: the zeroth spatial frequency of the signal returns versus range and an approximation of the zeroth spatial frequency of the signal returns versus range.

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1. An apparatus for measuring at least one of the intensity and range characteristics of at least one object, comprising: a signal source operable to emit at least a first and second modulation signal at one or more frequencies;an illuminator operable to illuminate the at least one object by the fir

1. An apparatus for measuring at least one of the intensity and range characteristics of at least one object, comprising: a signal source operable to emit at least a first and second modulation signal at one or more frequencies;an illuminator operable to illuminate the at least one object by the first modulation signal, wherein the first modulation signal is backscattered from the at least one object to create a first backscattered signal;a sensor comprising at least one pixel, wherein the sensor is operable to create a sampled correlated signal by sampling the correlation of the first backscattered signal with the second modulation signal within the at least one pixel; anda processor operable to determine the at least one of the range and intensity characteristics of two or more component returns within one of the at least one pixel by comparing sampled correlated signals using one or more first measurements, wherein the one or more first measurements result from a system configuration having one or more characteristics selected from the group consisting of:(a) first and second modulation signals comprising two or more different modulation frequencies,(b) first and second modulation signals comprising one or more different modulation frequencies and an offset of a correlation waveform, and(c) first and second modulation signals comprising one or more different modulation frequencies and one selected from the group consisting of a zeroth spatial frequency of the signal returns versus range and an approximation of the zeroth spatial frequency of the signal returns versus range. 2. The apparatus of claim 1, wherein the processor is further operable to determine at least one of the range and intensity characteristics of the two or more component returns within the one of the at least one pixel using two or more measurements at modulation frequencies with an integer ratio frequency ratio. 3. The apparatus of claim 1, wherein the processor is further operable to determine at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel using the one or more first measurements at a non-zero modulation frequency and one selected from the group consisting of a measurement of the zeroth spatial frequency, an approximation of the measurement of the zeroth spatial frequency, and an equivalent of the measurement of the zeroth spatial frequency. 4. The apparatus of claim 1, wherein the processor is further operable to normalise the one or more first measurements in at least one of phase and magnitude by one or more second measurements. 5. The apparatus of claim 4, wherein the processor is further operable to calculate a reference value by applying the one or more normalised measurements to one selected from the group consisting of a reference data matrix, a mathematical model, and a function. 6. The apparatus of claim 5, wherein the processor is further operable to generate a solution tuple by denormalising the reference value with the one or more second measurements in at least one of phase and magnitude. 7. The apparatus of claim 6, wherein the processor is further operable to provide an approximation of at least one of the range and intensity of two or more component returns within the one of the at least one pixel based on at least one of the denormalised measurements, the solution tuples, and the reference values. 8. The apparatus of claim 4, wherein the one or more first measurements comprise a modulation signal at a first non-zero modulation frequency and the one or more second measurements comprise a modulation signal at a second non-zero modulation frequency, wherein the first and second modulation frequencies have an integer ratio frequency ratio,wherein the processor is further operable to calculate an index value by normalising in phase and amplitude the first measurement of the modulation signal at the first non-zero modulation frequency by the second measurement of the modulation signal at the second non-zero modulation frequency,wherein the processor is further operable to calculate a reference value by applying the index value to a reference data matrix, andwherein the processor is further operable to calculate the at least one of the range and intensity of the two or more component returns by denormalising the reference value in phase and magnitude by the second measurement of the modulation signal at the second non-zero modulation frequency. 9. The apparatus of claim 1, wherein the sensor is operable to make multiple measurements at different modulation frequencies with integer ratio frequency ratios, andwherein the processor is operable to solve a set of simultaneous polynomial equations of the form pn=∑m=0M-1⁢am⁢vmrn, wherein pn is complex domain measurement n taken at relative frequency rn, M is the total number of component returns, m is the current return, am encodes the intensity of the component return m , arg(vm) encodes the phase of the component return m , and |vm| encodes information about the distribution of the component return over range. 10. The apparatus of claim 1, wherein the one or more first measurements comprise a modulation signal at a first non-zero modulation frequency and one or more second measurements comprise one selected from the group consisting of (1) the total integrated intensity, (2) the total integrated intensity minus the contribution from ambient light, (3) the zeroth spatial frequency of the signal returns, (4) a modulation signal at a very low modulation frequency, and (5) an equivalent of the total integrated intensity,wherein the processor is further operable to calculate an index value by normalising the modulus of the one or more first measurements by the modulus of one or more second measurements,wherein the processor is further operable to calculate a reference value by applying the index value to one selected from the group consisting of a reference data matrix, a mathematical function, and an operator, andwherein the processor is further operable to calculate, using the reference value, at least one selected from the group consisting of a bound on the phase perturbation of the brightest component return within the one of the at least one pixel, the phase of two or more component returns within the one of the at least one pixel, the phase relationship between two or more component returns within the one of the at least one pixel, the intensity relationship between two or more component returns within the one of the at least one pixel, the intensity of two or more component returns within the one of the at least one pixel, and an indication of the degree of mixing of component returns within the one of the at least one pixel. 11. The apparatus of claim 1, wherein the one or more first measurements comprise a modulation signal at a relative frequency of 2 and one or more second measurements comprise a modulation signal at a relative frequency of 1,wherein the processor is further operable to calculate at least one of (1) a value χ by normalising the one or more first measurements in phase and intensity by the one or more second measurements, wherein χ is a value calculated by normalizing the one or more first measurements in phase and intensity by the one or more second measurements, (2) a value χB by denormalising χ−1 in phase and intensity by the one or more second measurements, andwherein the processor is further operable, using functions of one or more of |χB|, arg(χB), |χ−1|, arg(χ−1), and arg(χ), to calculate at least one of (1) bounds on at least one of the absolute phase of two or more component returns within the one of the at least one pixel, the relative phase of two or more component returns within the one of the at least one pixel, the intensity of two or more component returns within the one of the at least one pixel, and the relative intensity of two or more component returns within the one of the at least one pixel and (2) calculate an indication of the degree of mixing in the one of the at least one pixel. 12. The apparatus of claim 1, wherein the apparatus further comprises an Amplitude Modulated Continuous Wave range imaging system. 13. A method for measuring at least one of the intensity and range characteristics of at least one object, comprising: emitting at least a first and second modulation signal at one or more frequencies;illuminating the at least one object by the first modulation signal, wherein the first modulation signal is backscattered from the at least one object to create a first backscattered signal;creating a sampled correlated signal by sampling the correlation of the first backscattered signal with the second modulation signal within at least one pixel; anddetermining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel by comparing sampled correlated signals using one or more first measurements, wherein the one or more first measurements result from a system configuration having one or more characteristics selected from the group consisting of:(a) first and second modulation signals comprising two or more different modulation frequencies,(b) first and second modulation signals comprising one or more different modulation frequencies and an offset of a correlation waveform, and(c) first and second modulation signals comprising one or more different modulation frequencies and one selected from the group consisting of a zeroth spatial frequency of the signal returns versus range and an approximation of the zeroth spatial frequency of the signal returns versus range. 14. The method of claim 13, wherein the determining the at least one of the range and intensity characteristics of the two or more component returns within the one of the at least one pixel further comprises taking two or more measurements at modulation frequencies with an integer ratio frequency ratio. 15. The method of claim 13, wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises taking the one or more first measurements at a non-zero modulation frequency and one selected from the group consisting of a measurement of the zeroth spatial frequency, an approximation of the measurement of the zeroth spatial frequency, and an equivalent of the measurement of the zeroth spatial frequency. 16. The method of claim 13, wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises normalising the one or more first measurements in at least one of phase and magnitude by one or more second measurements. 17. The method of claim 16, wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises calculating a reference value by applying the one or more normalised measurements to one selected from the group consisting of a reference data matrix, a mathematical model, and a function. 18. The method of claim 17, wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises generating a solution tuple by denormalising the reference value with the one or more second measurements in at least one of phase and magnitude. 19. The method of claim 18, wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises providing an approximation of at least one of the range and intensity of two or more component returns within the one of the at least one pixel based on at least one of the denormalised measurements, the solution tuples, and the reference values. 20. The method of claim 16, wherein the one or more first measurements comprise a modulation signal at a first non-zero modulation frequency and a one or more second measurements comprise a modulation signal at a second non-zero modulation frequency, wherein the first and second modulation frequencies have an integer ratio frequency ratio,wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises calculating an index value by normalising in phase and amplitude the first measurement of the modulation signal at the first non-zero modulation frequency by the second measurement of the modulation signal at the second non-zero modulation frequency,wherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises calculating a reference value by applying the index value to a reference data matrix, andwherein determining the at least one of the range and intensity characteristics of two or more component returns within the one of the at least one pixel further comprises denormalising the reference value in phase and magnitude by the second measurement of the modulation signal at the second non-zero modulation frequency.