Abnormal clock rate detection in imaging sensor arrays
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01R-023/00
G06F-001/14
출원번호
US-0106666
(2013-12-13)
등록번호
US-9207708
(2015-12-08)
발명자
/ 주소
Simolon, Brian
Kurth, Eric A.
Goodland, Jim
Nussmeier, Mark
Högasten, Nicholas
Hoelter, Theodore R.
Strandemar, Katrin
Boulanger, Pierre
Sharp, Barbara
출원인 / 주소
FLIR Systems, Inc.
대리인 / 주소
Haynes and Boone, LLP
인용정보
피인용 횟수 :
1인용 특허 :
52
초록▼
Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effectiv
Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components which may already be implemented as part of the device. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment or decrement a count value in response to the clock signal. The device may include a comparator adapted to select the current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.
대표청구항▼
1. A device comprising: a counter adapted to receive a clock signal and adjust a count value in response to the clock signal;a ramp generator adapted to generate a ramp signal having a slope independent of the clock signal;a comparator adapted to receive a reference signal and the ramp signal, and s
1. A device comprising: a counter adapted to receive a clock signal and adjust a count value in response to the clock signal;a ramp generator adapted to generate a ramp signal having a slope independent of the clock signal;a comparator adapted to receive a reference signal and the ramp signal, and select the current count value in response to the reference signal and the ramp signal; anda processor adapted to determine, based on the selected count value, if a frequency of the clock signal is within a specified range. 2. The device of claim 1, further comprising an imaging sensor array adapted to receive the clock signal, wherein the imaging sensor array is adapted to provide images at a frame rate dependent on the clock frequency. 3. The device of claim 2, wherein the imaging sensor array comprises a plurality of infrared sensors. 4. The device of claim 2, wherein the processor is adapted to disable the imaging sensor array if the clock frequency is outside the specified range. 5. The device of claim 1, further comprising a multiplexer adapted to generate a digital signal comprising the selected count value and pass the digital signal to the processor. 6. The device of claim 1, further comprising a temperature sensor adapted to detect a temperature associated with the device, wherein the processor is adapted to determine if the clock frequency is within the specified range based on whether the selected count value is within a predetermined range for the detected temperature. 7. The device of claim 6, wherein the selected count value is a first value of the counter captured at a first time, wherein the temperature sensor comprises: a temperature sensitive element adapted to provide a temperature-dependent analog signal;an analog-to-digital (A/D) converter adapted to convert the temperature-dependent analog signal to a second count value of the counter captured at a second time; andwherein the processor is adapted to determine the detected temperature using the second current count value. 8. The device of claim 7, wherein a maximum of the predetermined range used by the processor decreases as the clock frequency increases. 9. The device of claim 1, further comprising a buffer adapted to adjust a voltage of the ramp signal passed from the ramp generator to the comparator. 10. The device of claim 1, further comprising a sample-and-hold circuit adapted to provide the reference signal to the comparator. 11. The device of claim 1, wherein the reference signal is a predetermined reference voltage. 12. The device of claim 11, wherein the comparator is adapted to select the current count value when the ramp signal exhibits a voltage substantially equal to the predetermined reference voltage. 13. A method comprising: adjusting a count value in response to a clock signal;generating a ramp signal having a slope independent of the clock signal;selecting the current count value in response to the reference signal and the ramp signal; anddetermining, based on the selected count value, if a frequency of the clock signal is within a specified range. 14. The method of claim 13, further comprising: receiving, by an imaging sensor array, the clock signal; andproviding, by the imaging sensor array, images at a frame rate dependent on the clock frequency. 15. The method of claim 14, wherein the imaging sensor array comprises a plurality of infrared sensors. 16. The method of claim 14, further comprising disabling the imaging sensor array if the clock frequency is outside the specified range. 17. The method of claim 13, further comprising generating a digital signal comprising the selected count value, wherein the determining is performed using the digital signal. 18. The method of claim 13, further comprising detecting a temperature associated with the device, wherein the determining comprises determining if the clock frequency is within the specified range based on whether the selected count value is within a predetermined range for the detected temperature. 19. The method of claim 18, wherein the selected count value is a first value of the counter captured at a first time, the method further comprising: providing a temperature-dependent analog signal;converting the temperature-dependent analog signal to a second count value of the counter captured at a second time; anddetermining the detected temperature using the second current count value. 20. The method of claim 19, further comprising decreasing the predetermined range as the clock frequency increases. 21. The method of claim 13, further comprising adjusting a voltage of the ramp signal between the generating and the selecting. 22. The method of claim 13, wherein the reference signal used during the comparing is provided by a sample-and-hold circuit. 23. The method of claim 13, wherein the reference signal is a predetermined reference voltage. 24. The method of claim 23, wherein the selecting comprises selecting the current count value when the ramp signal exhibits a voltage substantially equal to the predetermined reference voltage.
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