$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Achieving focus in a digital pathology system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
  • G02B-021/36
  • G02B-021/00
  • G02B-021/24
  • H04N-005/232
출원번호 US-0909935 (2013-06-04)
등록번호 US-9213177 (2015-12-15)
발명자 / 주소
  • Olson, Allen
  • Crandall, Greg
  • Soenksen, Dirk G.
출원인 / 주소
  • LEICA BIOSYSTEMS IMAGING, INC.
대리인 / 주소
    Procopio, Cory, Hargreaves & Savitch LLP
인용정보 피인용 횟수 : 1  인용 특허 : 89

초록

Methods and apparatus are provided for computing focus information during scanning digital microscope slide data with a line scan camera. The systems and methods include a dynamically interleaved procedure that works by moving the specimen relative to the objective lens while the height of the objec

대표청구항

1. A system for creating a digital image of a specimen on a microscope slide, the system comprising: a stage configured to support a microscope slide having a specimen;an objective lens;a motion control system configured to move the stage and adjust the height of the objective lens relative to the s

이 특허에 인용된 특허 (89)

  1. Olson, Allen; Crandall, Greg; Soenksen, Dirk G., Achieving focus in a digital pathology system.
  2. Cottingham Hugh V. (49 Mountain Ave. Caldwell NJ 07006), Agglutination detection apparatus.
  3. Silver Robert B., Analytical imaging system and process.
  4. Preston ; Jr. Kendall (4701 E. Glenn St. ; Bldg. 36 Tucson AZ), Apparatus and method for a multi-resolution electro-optical imaging, display and storage/retrieval system.
  5. Layne Scott P. ; Beugelsdijk Tony J., Apparatus for automated testing of biological specimens.
  6. Takeuchi, Naoya, Appearance inspection machine and method for concurrently performing defect detection and classification.
  7. Kam,Zvi; Geiger,Benjamin, Auto-focusing method and device for use with optical microscopy.
  8. Price Jeffrey H. ; Gough David A., Autofocus system for scanning microscopy.
  9. Price Jeffrey H., Autofocus system for scanning microscopy having a volume image formation.
  10. Rutenberg Mark R. ; Hall Thomas L., Automated cytological specimen classification system and method.
  11. Raz Ryan S.,CAX ; Frodis Uri,CAX ; Newman Duncan A.,CAX, Automated scanning of microscope slides.
  12. Yu Kenneth K. (Beaverton OR) Berglund C. Neil (Oregon City OR), Automated system for extracting design and layout information from an integrated circuit.
  13. Reid John F. ; O'Brien John, Automatic machine vision microscope slide inspection system and method.
  14. Olsztyn Paul C. ; Beyer James H. ; Sullivan David, Bacteria colony counter and classifier.
  15. DeWeerd Herman ; Stokes Brian ; Bengtsson Hans ; Honkanen Peter, Bi-directional scanning system with a pixel clock system.
  16. Conzola Vincent C. (Endwell NY) Rittenhouse Norman E. (Endicott NY) Solomon Jeffrey M. (Endicott NY) Toomey Thomas J. (Denver CO) Yablonsky Peter J. (Apalachin NY), Computer controlled, multiple angle illumination system.
  17. Ortyn William E. ; Hayenga Jon W. ; Piloco Louis R., Cytological system autofocus integrity checking apparatus.
  18. Palcic Branko (6012 Adera Street Vancouver ; British Columbia CAX V6M 3J4) Jaggi Bruno (2180 Trafalgar Street Vancouver ; British Columbia CAX V6K 4M8) Nordin Jan (924 Leovista North Vancouver ; Brit, Dynamic microscope image processing scanner.
  19. Jansson Peter A. (Hockessin DE) Rogers Wade T. (West Chester PA) Schwaber James S. (Wilmington DE), Electronic mosaic imaging process.
  20. Jansson Peter A. (Hockessin DE) Rogers Wade T. (West Chester PA) Schwaber James S. (Wilmington DE), Electronic mosaic imaging process.
  21. Amano, Toshitaka; Morimoto, Osamu, Exposure apparatus and device manufacturing method.
  22. Truc James A. ; Peterson Doug ; Anderson James ; Ovsak Gregg J. ; McLean Rob ; Hogenson James A. ; Johnson Bradley ; Deutsch Dennis ; Wolter Peter, Film scanner.
  23. Norita Toshio (Sakai JPX) Ishida Tokuji (Daito JPX) Hamada Masataka (Minamikawachi JPX) Karasaki Toshihiko (Sakai JPX) Taniguchi Nobuyuki (Nishinomiya JPX), Focus condition detecting device.
  24. Bacus, James V.; Bacus, James W., Focusable virtual microscopy apparatus and method.
  25. Bacus, James V.; Bacus, James W., Focusable virtual microscopy apparatus and method.
  26. Montagu Jean I., Focusing in microscope systems.
  27. Currin Bena L. (Pasadena CA) Abdel-Malek Aiman A. (Schenectady NY) Hartley Richard I. (Schenectady NY), Forming, with the aid of an overview image, a composite image from a mosaic of images.
  28. Soenksen, Dirk G., Fully automatic rapid microscope slide scanner.
  29. Soenksen, Dirk G., Fully automatic rapid microscope slide scanner.
  30. Swinson Peter Richard (St Albans GBX) Barber Graham Malcolm Alexander (Hitchin GBX), High resolution film scanner.
  31. Ishibashi Satoshi (Kanagawa JPX) Ogura Kenji (Kanagawa JPX) Yonezawa Susumu (Tokyo JPX), Image information retrieval/display apparatus.
  32. Matsuda Shinya (Kyoto JPX) Fujii Shinichi (Amagasaki JPX), Image pickup apparatus for focusing an object image based on mirror reflected height of the object.
  33. Earl Joseph G. (5100 Covington St. Greenwood MN 55331) Moffitt Michael D. (5570 Covingting Rd. Shorewood MN 55331), Image processing system.
  34. Holmes Duane C., Integrated optical measurement instruments.
  35. Worster Bruce W. ; Crane Dale E. ; Hansen Hans J. ; Fairley Christopher R. ; Lee Ken K., Laser imaging system for inspection and analysis of sub-micron particles.
  36. Dvorkis Paul (Stony Brook NY) Goren David P. (Ronkonkoma NY) Spitz Glenn S. (Far Rockaway NY), Laser scanning system and scanning method for reading bar codes.
  37. Artur Olszak, Lateral-scanning interferometer with tilted optical axis.
  38. Suita Makio (Kawasaki JPX) Kitajima Hironobu (Kawasaki JPX) Yamabe Masaki (Kawasaki JPX), Mark position detecting method and device for aligner and aligner having the device.
  39. Lindow James T. (Saratoga CA) Bennett Simon D. (Los Gatos CA) Smith Ian R. (Los Gatos CA), Method and aparatus for determining surface profiles.
  40. Bacus James V. ; Bacus James W., Method and apparatus for acquiring and reconstructing magnified specimen images from a computer-controlled microscope.
  41. Douglass James W. ; Riding Thomas J. ; Ring James E., Method and apparatus for automated image analysis of biological specimens.
  42. Fairley Christopher R. (San Jose CA) Thompson Timothy V. (San Jose CA) Lee Ken K. (Los Altos CA), Method and apparatus for automatic focusing of a confocal laser microscope.
  43. Fairley Christopher R. ; Thompson Timothy V. ; Lee Ken K., Method and apparatus for automatically focusing a microscope.
  44. Bacus James V. ; Bacus James W., Method and apparatus for creating a virtual microscope slide.
  45. Kegelmeyer ; Jr. W. Philip (11755 Shadow Dr. Dublin CA 94568), Method and apparatus for detecting a desired behavior in digital image data.
  46. Skoll, David F., Method and apparatus for focusing a micro-imaging system onto a tilted or uneven sample to acquire images of the sample.
  47. Gouch, Martin Philip, Method and apparatus for forming a multiple focus stack image.
  48. Trulson Mark (Santa Clara CA) Stern David (Mountain View CA) Fiekowsky Peter (Los Altos CA) Rava Richard (Palo Alto CA) Walton Ian (Menlo Park CA) Fodor Stephen P. A. (Palo Alto CA), Method and apparatus for imaging a sample on a device.
  49. Trulson Mark ; Stern David ; Fiekowsky Peter ; Rava Richard ; Walton Ian ; Fodor Stephen P. A., Method and apparatus for imaging a sample on a device.
  50. Trulson Mark ; Stern David ; Fiekowsky Peter ; Rava Richard ; Walton Ian ; Fodor Stephen P. A., Method and apparatus for imaging a sample on a device.
  51. Kerschmann Russell L. ; Bolles Michael E. ; Hendrickson Andrew D., Method and apparatus for measurement of microtome performance.
  52. Sieckmann, Frank, Method and apparatus for optical measurement of a surface profile of a specimen.
  53. Burt Peter J. ; Irani Michal ; Hsu Stephen Charles ; Anandan Padmanabhan ; Hansen Michael W., Method and apparatus for performing mosaic based image compression.
  54. Olson, Allen; Crandall, Greg; Soenksen, Dirk G., Method and apparatus for pre-focus in a linear array based slide scanner.
  55. Hayenga Jon W. ; Piloco Louis R., Method and apparatus for rapid capture of focused microscopic images.
  56. S?nksen,Dirk; Mainberger,Robert; Schmidt,Guenter, Method and apparatus for scanning a specimen using an optical imaging system.
  57. Bacus, James V.; Bacus, James W., Method and apparatus of mechanical stage positioning in virtual microscopy image capture.
  58. Lin YouLing ; Hennessey A. Kathleen ; Pattikonda Ramakrishna ; Khaja Veera S. ; Reddy Rajasekar, Method and system for anomaly detection.
  59. Worster Bruce W. ; Lee Ken K., Method for characterizing defects on semiconductor wafers.
  60. Jansson Peter A. (Hockessin DE) Rogers Wade T. (West Chester PA) Schwaber James S. (Wilmington DE), Method for operating a microscopical mapping system.
  61. Olson, Allen; Crandall, Greg; Soenksen, Dirk G., Method for pre-focus of digital slides.
  62. Ippolito, Kim; Lapets, Oleg; Sipe, Michael; Shopoff, Randall, Method of determining a best initial focal position estimate.
  63. Smilansky Zeev (Kfar Meishar ILX) Nissim Moshe (Raanana ILX) Harel Eyal (Tel Aviv ILX), Method of inspecting articles.
  64. Davis Thomas G., Method of inspecting ophthalmic lenses.
  65. Calum E. MacAulay CA, Methods and apparatus for improved depth resolution use of out-of-focus information in microscopy.
  66. Kain Robert C., Micro-imaging system.
  67. Yoshinaga Makoto (Hachiouji JPX) Iba Yoichi (Hachiouji JPX) Miyahara Noriyuki (Hachiouji JPX) Kawasaki Masami (Hachiouji JPX) Morita Terumasa (Hachiouji JPX) Nagano Takashi (Hachiouji JPX), Microscope.
  68. Maddison,John R, Microscopy imaging system and method.
  69. Vogt Robert C. ; Trenkle John M., Mosaic construction, processing, and review of very large electronic micrograph composites.
  70. Hildenbrand Walter W. (Brewster NY) Utterback Steven G. (Peekskill NY), Multiple detector system for specimen inspection using high energy backscatter electrons.
  71. Kamentsky Louis A. ; Weissman Mark ; Kamentsky Lee D. ; Gershman Russell ; Pomeroy B. Martin, Network review and analysis of computer encoded slides.
  72. Tsai Bin-Ming Benjamin ; Pon Russell M., Optical inspection of a specimen using multi-channel responses from the specimen using bright and darkfield detection.
  73. Gilblom David L. (Los Altos CA) Castro Peter S. (Los Altos CA), Panoramic time delay and integration video camera system.
  74. Maeda Shunji (Yokohama JPX) Kubota Hitoshi (Fujisawa JPX) Makihira Hiroshi (Yokohama JPX) Hiroi Takashi (Yokohama JPX), Pattern checking method and checking apparatus.
  75. Suzuki Hiroyuki (Tokyo JPX) Furukawa Osamu (Tokyo JPX), Projection exposure method and apparatus with focus detection.
  76. Jaggi Bruno (2180 Trafalgar Street Vancouver ; British Columbia CAX V6K 4M8) Deen Mohammed J. (School of Engineering Design ; Simon Fraser Univ. Burnaby ; B.C. CAX V5A 1S6) Palcic Branko (6012 Adera , Quantitative light microscope using a solid state detector in the primary image plane.
  77. Pearson Eric C. (Waterloo CAX) Strauss Ronald E. (Kitchener CAX) Merchant David B. (Kitchener CAX) Houde Jacques S. (Waterloo CAX) Burjoski Joseph D. (Waterloo CAX) Lammers Scott G. (Kitchener CAX) P, Real-time line scan processor.
  78. McKean Ronald A. (Royal Oak MI) Stiegman Jeff (Ann Arbor MI), Scanning and storage of electrophoretic records.
  79. Park Sang-Il ; Linker Frederick I. ; Smith Ian R., Scanning probe microscope having a single viewing device for on-axis and oblique angle views.
  80. Bradley Jonathan N., Storage and retrieval of large digital images.
  81. Ledley Robert S., Super fast tuberculosis diagnosis and sensitivity testing method.
  82. Burt Peter J. ; Irani Michal ; Hsu Stephen Charles ; Anandan Padmanabhan ; Hansen Michael W., System for automatically aligning images to form a mosaic image.
  83. Wetzel, Arthur W.; Gilbertson, II, John R.; Beckstead, Jeffrey A.; Feineigle, Patricia A.; Hauser, Christopher R.; Palmieri, Jr., Frank A., System for creating microscopic digital montage images.
  84. Wetzel,Arthur W.; Gilbertson, II,John R.; Beckstead,Jeffrey A.; Feineigle,Patricia A.; Hauser,Christopher R.; Palmieri, Jr.,Frank A., System for creating microscopic digital montage images.
  85. So, Peter T. c.; Engelward, Bevin; Ragan, Timothy; Bahlman, Karsten; Kim, Ki-Hean; Laiho, Lily Hsu; Huang, Hayden, Systems and methods for volumetric tissue scanning microscopy.
  86. Takashi Kaneko JP; Naoki Mitsumoto JP; Nobuaki Kawahara JP, Total-focus imaging apparatus using a variable-focus lens.
  87. William Paul Cockshott GB; Robert Bartholomew Lambert GB, Vector quantization codebook generation method.
  88. Overbeck James W., Wide field of view and high speed scanning microscopy.
  89. Overbeck,James W., Wide field of view and high speed scanning microscopy.

이 특허를 인용한 특허 (1)

  1. Price, Jeffrey H.; Fuller, Derek N.; Kellner, Albert L.; Azimi, Behrad, Multifunction autofocus system and method for automated microscopy.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로