A sensor is disclosed that can include a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light. The sensor can also include an imaging device positioned proximate the light component and operab
A sensor is disclosed that can include a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light. The sensor can also include an imaging device positioned proximate the light component and operable to directly receive the first beam of light and the second beam of light and convert these into electric signals. The imaging device and the light component can be movable relative to one another. The sensor can further include a light location module configured to receive the electric signals and determine locations of the first beam of light and the second beam of light on the imaging device. In addition, the sensor can include a position module configured to determine a relative position of the imaging device and the light component based on the locations of the first beam of light and the second beam of light on the imaging device.
대표청구항▼
1. A sensor, comprising: a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light, wherein the second beam of light is non-parallel to the first beam of light;an imaging device positioned proxim
1. A sensor, comprising: a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light, wherein the second beam of light is non-parallel to the first beam of light;an imaging device positioned proximate the light component and operable to directly receive the first beam of light and the second beam of light and convert the first beam of light and the second beam of light into electric signals, wherein the imaging device and the light component are movable relative to one another;one or more elastic members that connect the light component to the imaging device, wherein the one or more elastic members are operable to facilitate relative movement of the imaging device and the light component;a light location module configured to receive the electric signals and determine locations of the first beam of light and the second beam of light on the imaging device; anda position module configured to determine a relative position of the imaging device and the light component based on the locations of the first beam of light and the second beam of light on the imaging device. 2. The sensor of claim 1, wherein the imaging device and the light component are movable relative to one another in a first translational degree of freedom and the position module is further configured to determine the relative position of the imaging device and the light component with respect to the first translational degree of freedom, and wherein the first beam of light is directed substantially perpendicular to an axis of the first translational degree of freedom. 3. The sensor of claim 2, wherein the imaging device and the light component are movable relative to one another in a second translational degree of freedom and the position module is further configured to determine the relative position of the imaging device and the light component with respect to the second translational degree of freedom, and wherein the first beam of light is directed substantially perpendicular to an axis of the second translational degree of freedom. 4. The sensor of claim 1, wherein the imaging device and the light component are movable relative to one another in a first rotational degree of freedom and the position module is further configured to determine the relative position of the imaging device and the light component with respect to the first rotational degree of freedom, and wherein the first beam of light is directed substantially perpendicular to an axis of the rotational degree of freedom. 5. The sensor of claim 4, wherein the imaging device and the light component are movable relative to one another in a second rotational degree of freedom and the position module is further configured to determine the relative position of the imaging device and the light component with respect to the second rotational degree of freedom, and wherein the first beam of light is directed substantially parallel to an axis of the second rotational degree of freedom. 6. The sensor of claim 1, wherein center locations of the first and second beams of light on the imaging device are determined utilizing a statistical method applied to the locations of the first beam of light and the second beam of light on the imaging device. 7. The sensor of claim 1, wherein the imaging device comprises a charge-coupled device (CCD) or a complementary metal oxide semiconductor (CMOS). 8. The sensor of claim 1, wherein the imaging device comprises a color separation mechanism. 9. The sensor of claim 1, wherein the imaging device comprises a plurality of imaging devices. 10. The sensor of claim 1, wherein the first light source comprises an LED, a laser, an organic LED, a field emission display element, a surface-conduction electron-emitter display unit, a quantum dot, a cell containing an electrically charged ionized gas, a fluorescent lamp, a hole through which light from a larger light source located external to the plane of light emission can pass, or combinations thereof. 11. The sensor of claim 1, further comprising at least one of a collimator and a lens operable with the first light source. 12. The sensor of claim 1, further comprising a mass associated with at least one of the imaging device and the light component. 13. The sensor of claim 1, further comprising a clock. 14. The sensor of claim 1, wherein the imaging device is anchored to a surface, and the position module is further configured to determine a strain on the surface in one or more degrees of freedom based on the relative position of the imaging component and the light component. 15. A multi degree of freedom sensor, comprising: a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light non-parallel to the first beam of light;an imaging device positioned proximate to the light component and operable to directly receive the first beam of light and the second beam of light and convert the first beam of light and the second beam of light into electric signals, wherein the imaging device and the light component are movable relative to one another in at least two translational degrees of freedom and at least two rotational degrees of freedom;one or more elastic members that connect the light component to the imaging device, wherein the one or more elastic members are operable to facilitate relative movement of the imaging device and the light component;a light location module configured to receive the electric signals and determine locations of the first beam of light and the second beam of light on the imaging device; anda position module configured to determine a relative position of the imaging device and the light component based on the locations of the first beam of light and the second beam of light on the imaging device. 16. The sensor of claim 15, further comprising a clock. 17. The multi degree of freedom sensor of claim 15, wherein the imaging device is anchored to a surface, and the position module is further configured to determine a strain on the surface in one or more degrees of freedom based on the relative position of the imaging component and the light component. 18. A multi degree of freedom sensor, comprising: a light component in support of a plurality of light sources operable to direct beams of light, wherein at least two of the beams of light are non-parallel to one another;an imaging device positioned proximate the light component and operable to directly receive the beams of light and convert the beams of light into electric signals, wherein the imaging device and the light component are movable relative to one another in a plurality of translational degrees of freedom and a plurality of rotational degrees of freedom;one or more elastic members that connect the light component to the imaging device, wherein the one or more elastic members are operable to facilitate relative movement of the imaging device and the light component;a light location module configured to receive the electric signals and determine locations of the beams of light on the imaging device; anda position module configured to determine a relative position of the imaging device and the light component based on the locations of the beams of light on the imaging device. 19. The sensor of claim 18, wherein at least one beam of light is directed substantially perpendicular to an axis of a translational degree of freedom. 20. The sensor of claim 18, wherein at least one beam of light is directed substantially parallel to an axis of a rotational degree of freedom. 21. The multi degree of freedom sensor of claim 18, wherein the imaging device is anchored to a surface, and the position module is further configured to determine a strain on the surface based on the relative position of the imaging component and the light component. 22. A method for facilitating a displacement measurement, comprising: directing, by a first light source, a first beam of light;directing, by a second light source, a second beam of light, wherein the first light source and the second light source are supported by a light component;directly receiving, by an imaging device positioned proximate the light component, the first beam of light and the second beam of light;converting, by the imaging device, the first beam of light and the second beam of light into electric signals, wherein the second beam of light is non-parallel to the first beam of light;connecting, by one or more elastic members, the light component to the imaging device;receiving, by a light location module, the electric signals;determining, by the light location module, locations of the first beam of light and the second beam of light on the imaging device;determining, by a position module, a relative position of the imaging device and the light component based on the locations of the first beam of light and the second beam of light on the imaging device; andfacilitating, by the one or more elastic members, relative movement of the imaging device and the light component. 23. The method of claim 22, wherein facilitating relative movement of the imaging device and the light component comprises facilitating relative movement in at least one of a translational degree of freedom and a rotational degree of freedom. 24. The method for facilitating a displacement measurement of claim 22, wherein the imaging device is anchored to a surface, and the method further comprising: determining a strain on the surface in one or more degrees of freedom based on the relative position of the imaging component and the light component.
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이 특허에 인용된 특허 (9)
Park, Yong-hwa; You, Jang-woo; Cho, Yong-chul, 3-dimensional image acquisition apparatus and method of extracting depth information in the 3D image acquisition apparatus.
Kohlenberger Charles W. (Fullerton CA) Kirkpatrick Craig G. (Santa Ana CA) Estrada John A. (South San Gabriel CA) Chang George Q. (La Habra CA), Sensor for measuring dynamic variations in strain.
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