Optical multi-pass cell for long path-length spectroscopy
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01N-021/03
G01J-003/02
출원번호
US-0572702
(2014-12-16)
등록번호
US-9250175
(2016-02-02)
발명자
/ 주소
McManus, J. Barry
출원인 / 주소
AERODYNE RESEARCH, INC.
대리인 / 주소
Cesari and McKenna, LLP
인용정보
피인용 횟수 :
1인용 특허 :
3
초록▼
In one embodiment, an improved multi-pass cell for a long path-length spectrometer is designed to include a perturbing mirror that causes a base pattern of reflections to be repeated multiple times, where each subsequent base pattern of reflections is rotated about the axis at an angle from a prior
In one embodiment, an improved multi-pass cell for a long path-length spectrometer is designed to include a perturbing mirror that causes a base pattern of reflections to be repeated multiple times, where each subsequent base pattern of reflections is rotated about the axis at an angle from a prior base pattern, to circulate the base patters about the cell. The base pattern may be a Herriott cell pattern. The improved multi-pass cell may be constructed with a concave front mirror centered along an axis of the cell, and a concave back mirror centered along the axis and facing the front mirror. The perturbing mirror may be centered along the axis, facing the front mirror and located at a perturbing mirror spacing in front of the back mirror or behind the back mirror, depending on the implementation.
대표청구항▼
1. A multi-pass cell for a spectrometer, comprising: a concave front mirror centered along an axis of the multi-pass cell;a concave back mirror centered along the axis and facing the front mirror; anda perturbing mirror centered along the axis, facing the front mirror, and offset from the back mirro
1. A multi-pass cell for a spectrometer, comprising: a concave front mirror centered along an axis of the multi-pass cell;a concave back mirror centered along the axis and facing the front mirror; anda perturbing mirror centered along the axis, facing the front mirror, and offset from the back mirror by a perturbing mirror spacing, the perturbing mirror either having either a convex curvature and being offset in front of the back mirror relative to the front mirror or having a concave curvature and being offset behind the back mirror relative to the front mirror,wherein the perturbing mirror is configured to cause a base pattern of reflections of a beam injected into the multi-pass cell to be repeated multiple times, each subsequent base pattern rotated about the axis at an angle from a prior base pattern. 2. The multi-pass cell of claim 1, wherein the base pattern is a Herriott cell pattern. 3. The multi-pass cell of claim 1, wherein the front mirror, the back mirror and the perturbing mirror are each spherical mirrors. 4. The multi-pass cell of claim 1, wherein the perturbing mirror has a convex curvature and is disposed in front of the back mirror relative to the front mirror. 5. The multi-pass cell of claim 1, wherein the perturbing mirror has a concave curvature and is disposed behind the back mirror relative to the front mirror. 6. The multi-pass cell of claim 1, wherein the front mirror includes an off-axis coupling hole through which the beam is injected into the multi-pass cell and via which the beam exits the multi-pass cell. 7. The multi-pass cell of claim 1, further comprising a diverter mirror coupled to the front mirror or the back mirror, and configured to receive and redirect the beam as the beam is injected into the multi-pass cell. 8. The multi-pass cell of claim 7, wherein the diverter mirror is coupled to the front mirror. 9. The multi-pass cell of claim 7, wherein the diverter mirror is coupled to the back mirror. 10. The multi-pass cell of claim 7, wherein the diverter beam is located proximate to the center of the front mirror or the back mirror. 11. The multi-pass cell of claim 7, wherein the diverter beam is located proximate to an outer edge of the front mirror or the back mirror. 12. The pass cell of claim 1, wherein the perturbing mirror spacing (sp) is set as: sp=(dcxo/y1)sin(π/Nx), where xo is the origin of an x-axis of a coordinate system, y1 is a y-axis coordinate of an aim-in point for the beam, dc is a distance between the front mirror and the back mirror, and Nx is a multiplication factor. 13. The multi-pass cell of claim 1, wherein a radius of curvature of the perturbing mirror (rcp) is set as: rcp=sp/[−1+(1+cos(2π/Nx))/2(1−sp/rco)], where sp is the perturbing mirror spacing, Nx is the pattern multiplication factor and rco is a radius of curvature of the front mirror and the back mirror. 14. A multi-pass cell for a spectrometer, comprising: a concave front mirror;a concave back mirror facing the front mirror; anda convex perturbing mirror facing the front mirror, the perturbing mirror offset in front of the back mirror back mirror relative to the front mirror by a perturbing mirror spacing,wherein the perturbing mirror is configured to cause a base pattern of reflections of a beam injected into the multi-pass cell to be repeated multiple times, each subsequent base pattern rotated from a prior base pattern. 15. The multi-pass cell of claim 1, wherein the base pattern is a Herriott cell pattern. 16. A method for constructing a multi-pass cell for a spectrometer, comprising: selecting a base pattern of reflections for a beam injected into the multi-pass cell, the selected base pattern including a plurality of reflections between a front mirror and a back mirror of the multi-pass cell;setting an a base pattern shape, the pattern shape defining a horizontal and a vertical size of the base pattern;calculating a pattern multiplication factor that indicates how many time the base pattern will circulate;calculating a perturbing mirror spacing and a radius of curvature for a perturbing mirror;assembling the multi-pass cell by placing the front mirror centered along an axis of the multi-pass cell, placing the back mirror centered along the axis and facing the front mirror, and placing a perturbing mirror having the radius of curvature at the perturbing mirror spacing from the back mirror, the perturbing mirror facing the front mirror and centered along the axis,wherein the perturbing mirror spacing and the radius of curvature of the perturbing mirror cause the perturbing mirror to circulate the base pattern having the pattern shape according to the pattern multiplication factor. 17. The method of claim 16, wherein the perturbing mirror spacing is calculated based, at least in part, on a distance between the front mirror and the back mirror and the pattern multiplication factor. 18. The method of claim 17, wherein the perturbing mirror spacing (Sp) is selected as sp=(dcxo/y1)sin(π/Nx), where xo is the origin of the x-axis of a coordinate system, y1 is a y-axis coordinate of an aim-in point for the beam, cc is a distance between the front mirror and the back mirror, and Nx is the pattern multiplication factor. 19. The method of claim 16, wherein the radius of curvature is calculated based, at least in part, on the perturbing mirror spacing, the pattern multiplication factor, and a radius of curvature of the front mirror and the back mirror. 20. The method of claim 19, wherein the radius of curvature (rcp) is selected as: rcp=sp/[−1+(1+cos(2π/Nx))/2(1−sp/rco)], where Ssp is the perturbing mirror spacing, Nx is the pattern multiplication factor and rco is a radius of curvature of the front mirror and the back mirror.
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