Near-IR laser-induced vibrational overtone absorption systems and methods for material detection
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01H-001/00
G01N-021/64
G01N-021/3563
G01N-021/359
출원번호
US-0748874
(2013-01-24)
등록번호
US-9335267
(2016-05-10)
발명자
/ 주소
Sausa, Rosario
Cabalo, Jerry B.
출원인 / 주소
The United States of America as represented by the Secretary of the Army
대리인 / 주소
Compton, Eric B.
인용정보
피인용 횟수 :
1인용 특허 :
15
초록▼
Embodiments of present invention are directed to near infrared (IR) laser-induced vibrational absorption systems and methods for material detection. According to one embodiment, a system for detecting materials may include: at least one laser configured to output light in the near IR spectrum so as
Embodiments of present invention are directed to near infrared (IR) laser-induced vibrational absorption systems and methods for material detection. According to one embodiment, a system for detecting materials may include: at least one laser configured to output light in the near IR spectrum so as to excite at least one vibrational overtone frequency, at least one combination band frequency, or a combination thereof, of a sample comprised of one or more of materials; a detector configured to detect a physical phenomenon of the sample in response to laser excitation; and an analyzer configured to the analyze the detected physical phenomenon and to identify the one or more materials based comparison of the detected signatures with known signatures of one more materials.
대표청구항▼
1. A system for detecting materials comprising: (a) at least one laser configured to output light in the near infrared (IR) spectrum, the wavelength of the output laser light corresponding to a frequency associated with at least one vibrational overtone absorption transition, at least one combinatio
1. A system for detecting materials comprising: (a) at least one laser configured to output light in the near infrared (IR) spectrum, the wavelength of the output laser light corresponding to a frequency associated with at least one vibrational overtone absorption transition, at least one combination band absorption transition, or a combination thereof, of a sample comprised of one or more materials so as to be absorbed and to excite the sample;(b) a detector configured to detect an excited physical phenomenon of the sample in response to absorption of the output laser light at the frequency associated with the at least one vibrational overtone absorption transition, the at least one combination band absorption transition, or the combination thereof; and(c) an analyzer configured to analyze the detected excited physical phenomenon and to identify the one or more materials based on comparison of the detected excited physical phenomenon with known signatures of the one or more materials. 2. The system of claim 1, wherein the at least one laser operates so as to output light having a wavelength between about 0.75 to 2.0 μm. 3. The system of claim 1, wherein said one or more materials are one or more of the following: explosives, propellants, chemical warfare agents, industrial pollutants or benign materials. 4. The system of claim 1, wherein said one or more materials are formulated with peroxides. 5. The system of claim 1, wherein said one or more materials are in a vapor phase. 6. The system of claim 1, wherein said one or more materials are in water. 7. The system of claim 1, wherein said one or more materials are residues on a surface. 8. The system of claim 1, wherein said one or more materials are in a liquid phase. 9. The system of claim 1, wherein the at least one laser is pulsed. 10. The system of claim 1, wherein the at least one laser is tunable. 11. The system of claim 1, wherein the at least one laser is continuous. 12. The system of claim 1, wherein the detector comprises a microphone. 13. The system of claim 12, further comprising an acoustic mirror to concentrate photoacoustic signals to the microphone. 14. The system of claim 1, wherein said detector is configured to measure or detect: (a) a change in pressure in the sample and/or its environment;(b) a change in temperature in the sample and/or its environment;(c) a change in the displacement of the sample and/or its environment;(d) a change in index of refraction in the sample and/or its environment;(e) a change in reflectivity in the sample and/or its environment; and/or(f) a change in light emission from the sample and/or environment. 15. The system of claim 1, wherein the at least one laser is configured to probe a change in the sample and/or its environment. 16. The system of claim 1, wherein said detector comprises a frequency filtering device, a signal digitizer, a signal analyzer, or any combination thereof. 17. A method for detecting and monitoring materials comprising: (a) exciting at least one vibrational overtone absorption transition, at least one combination band absorption transition, or a combination thereof, of a sample comprised of one or more materials using at least one laser which outputs light in the near infrared (IR) spectrum, the wavelength of the output laser light corresponding to a frequency associated with the at least one vibrational overtone absorption transition, at least one combination band absorption transition, or the combination thereof, of the sample;(b) detecting an excited physical phenomenon of the sample in response to absorption of the output laser light at the frequency associated with the at least one vibrational overtone absorption transition, the at least one combination band absorption transition, or the combination thereof; and(c) analyzing the detected excited physical phenomenon to identify the one or more materials based on comparison of the detected excited physical phenomenon with known signatures of the one or more materials. 18. The method of claim 17, wherein the at least one laser operates so as to output light having a wavelength between about 0.75 to 2.0 μm. 19. The method of claim 17, wherein said detecting comprises measuring or detecting: (a) a change in pressure in the sample and/or its environment;(b) a change in temperature in the sample and/or its environment;(c) a change in the displacement of the sample and/or its environment;(d) a change in index of refraction in the sample and/or its environment;(e) a change in reflectivity in the sample and/or its environment; and/or(f) a change in light emission from the sample and/or environment. 20. The method of claim 17, further comprising: operating the at least one laser to probe a change in the sample and/or its environment.
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