Method of fabricating light-emitting device package
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-021/66
G01R-031/26
H01L-033/50
H01L-033/54
H01L-033/58
G01B-011/06
출원번호
US-0741192
(2015-06-16)
등록번호
US-9368694
(2016-06-14)
우선권정보
KR-10-2014-0134475 (2014-10-06)
발명자
/ 주소
Jung, Raphael
Im, Jae-hyung
Kwak, Young-sun
출원인 / 주소
SAMSUNG ELECTRONICS CO., LTD.
대리인 / 주소
Muir Patent Law, PLLC
인용정보
피인용 횟수 :
0인용 특허 :
42
초록▼
A method of fabricating a light-emitting device package includes preparing a carrier including a first surface and a second surface disposed opposite the first surface, forming a phosphor layer on the first surface of the carrier, emitting first light from a test light-emitting device toward the sec
A method of fabricating a light-emitting device package includes preparing a carrier including a first surface and a second surface disposed opposite the first surface, forming a phosphor layer on the first surface of the carrier, emitting first light from a test light-emitting device toward the second surface of the carrier, analyzing second light passing through the phosphor layer, and determining a thickness of the phosphor layer based on the analysis.
대표청구항▼
1. A method of fabricating a light-emitting device package, the method comprising steps of: preparing a carrier including a first surface and a second surface disposed opposite the first surface;forming a phosphor layer on the first surface of the carrier;emitting first light from a test light-emitt
1. A method of fabricating a light-emitting device package, the method comprising steps of: preparing a carrier including a first surface and a second surface disposed opposite the first surface;forming a phosphor layer on the first surface of the carrier;emitting first light from a test light-emitting device toward the second surface of the carrier;analyzing second light passing through the phosphor layer; anddetermining a thickness of the phosphor layer based on the analysis. 2. The method of claim 1, wherein the step of forming the phosphor layer comprises: coating the first surface of the carrier with phosphor; andshaping the phosphor using a mold. 3. The method of claim 2, wherein the mold includes at least one of a blade and a roller. 4. The method of claim 1, wherein the second light includes first transmitted light having a wavelength range substantially the same as a wavelength range of the first light and second transmitted light having a wavelength range different from the wavelength range of the first light, wherein the step of determining the thickness of the phosphor layer comprises calculating a ratio of luminous intensity of the second transmitted light to luminous intensity of the first transmitted light. 5. The method of claim 1, wherein the first light emitted by the test light-emitting device comprises blue light. 6. The method of claim 1, wherein the second light emitted by the phosphor layer comprises blue light and yellow light. 7. The method of claim 6, wherein the step of determining the thickness of the phosphor layer comprises: collecting a luminous intensity spectrum with respect to the wavelength of the second light; andcalculating a ratio of a maximum luminous intensity of the yellow light to a maximum luminous intensity of the blue light in the luminous intensity spectrum. 8. The method of claim 7, wherein the thickness of the phosphor layer is represented by an equation: d=a1*lnIyIb+b1, wherein d is the thickness of the phosphor layer, Iy is the maximum luminous intensity of the yellow light, Ib is the maximum luminous intensity of the blue light in the luminous intensity spectrum, and each of a1 and b1 is a constant. 9. The method of claim 6, wherein the step of determining the thickness of the phosphor layer comprises: collecting a luminous intensity spectrum relative to the wavelength of the second light; andcalculating a ratio of a total amount of light in a wavelength range of yellow light to a total amount of light in a wavelength range of blue light. 10. The method of claim 9, wherein the thickness of the phosphor layer is represented by an equation: d=a2*lnIytIbt+b2, wherein d is the thickness of the phosphor layer, Iyt is the total amount of light in a wavelength range of the yellow light, Ibt is the total amount of light in a wavelength range of the blue light, and each of a2 and b2 is a constant. 11. A method of fabricating a light-emitting device package, the method comprising steps of: coating a first surface of a carrier with phosphor;forming a phosphor layer by shaping the phosphor using a mold;measuring a thickness of the phosphor layer in real-time using a test light-emitting device and a photodetector;determining whether the measured thickness is equal to a desired thickness; andcontrolling the thickness of the phosphor layer by adjusting the mold, according to the determination. 12. The method of claim 11, wherein the controlling of the thickness of the phosphor layer comprises adjusting a height of the mold with reference to the first surface of the carrier. 13. The method of claim 11, wherein the test light-emitting device faces a second surface disposed opposite the first surface of the carrier, and the photodetector faces the first surface of the carrier. 14. The method of claim 11, wherein the photodetector detects light that is continuously emitted by the phosphor layer during the formation of the phosphor layer. 15. The method of claim 11, wherein the photodetector detects light emitted by the phosphor layer, only for a specific time period during the formation of the phosphor layer. 16. A method of fabricating a light-emitting device package, the method comprising steps of: coating a first surface of a carrier with phosphor;moving one of a blade and the carrier with reference to another, along a direction parallel to the first surface so as to form a phosphor layer on the carrier;providing a test light-emitting device at a first side of the carrier and the phosphor layer so as to emit first light to the phosphor layer, and a photodetector positioned at a second side of the carrier and the phosphor layer opposite to the first side so as to collect second light originated from the test light-emitting device and converted by the phosphor layer;analyzing spectrum of the second light collected by the photodetector; andadjusting a distance between the blade and the first surface based on the analysis of spectrum. 17. The method of claim 16, wherein the second light includes first transmitted light having a wavelength range substantially the same as a wavelength range of the first light and second transmitted light having a wavelength range different from the wavelength range of the first light, wherein the step of analyzing the second light comprises one selected from the group consisting of determining a ratio of luminous intensity of the second transmitted light to luminous intensity of the first transmitted light, determining a ratio of a maximum luminous intensity of the second transmitted light to a maximum luminous intensity of the first transmitted light, and determining a ratio of a total amount of light in a wavelength range of the second transmitted light to a total amount of light in a wavelength range of the first transmitted light. 18. The method of claim 17, wherein the step of adjusting the distance includes: if the determined ratio is greater than an upper limit of a corresponding predetermined range, decreasing the distance between the blade and the first surface,if the determined ratio is less than a lower limit of the corresponding predetermined range, increasing the distance between the blade and the first surface, andif the determined ratio is within the corresponding predetermined range, maintaining the distance between the blade and the first surface. 19. The method of claim 16, further comprising steps of: attaching the phosphor layer to a plurality of light-emitting devices each emitting substantially the same light as the test light-emitting device; andsingulating the phosphor layer so as to form a plurality of light-emitting device packages. 20. The method of claim 16, further comprising steps of: singulating the phosphor layer so as to form a plurality of singulated phosphor layers; andattaching one of the plurality of singulated phosphor layers to a light-emitting device emitting substantially the same light as the test light-emitting device.
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