Broadband or mid-infrared fiber light sources
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G02B-006/00
G01J-003/42
H01S-003/30
G01J-003/10
G01B-009/02
G01J-003/02
H01S-005/00
H01S-005/10
H01S-005/14
G02F-001/35
H01S-003/067
H01S-003/094
H01S-003/102
출원번호
US-0715960
(2015-05-19)
등록번호
US-9400215
(2016-07-26)
발명자
/ 주소
Islam, Mohammed N.
출원인 / 주소
Omni Medsci, Inc.
대리인 / 주소
Brooks Kushman P.C.
인용정보
피인용 횟수 :
0인용 특허 :
166
초록▼
A diagnostic system includes a semiconductor light emitter(s) configured to generate an input beam having a wavelength shorter than about 2.5 microns. An optical amplifier(s) configured to receive a portion of the input beam communicates an intermediate beam to an output end of the optical amplifier
A diagnostic system includes a semiconductor light emitter(s) configured to generate an input beam having a wavelength shorter than about 2.5 microns. An optical amplifier(s) configured to receive a portion of the input beam communicates an intermediate beam to an output end of the optical amplifier. An optical fiber(s) configured to receive a portion of the intermediate beam forms an output beam with an associated wavelength. A subsystem having lenses or mirrors receives a received portion of the output beam and delivers a delivered portion of the output beam to a sample. The delivered portion has a temporal duration greater than approximately 30 picoseconds and a repetition rate between continuous wave and Megahertz or higher. A time averaged intensity of the delivered portion is less than approximately 50 MW/cm2. A light detection system collects and analyzes a fraction of the delivered portion that reflects or transmits from the sample.
대표청구항▼
1. A diagnostic system comprising: one or more semiconductor light emitters configured to generate an input beam, wherein at least a portion of the input beam comprises a wavelength shorter than about 2.5 microns;one or more optical amplifiers configured to receive at least the portion of the input
1. A diagnostic system comprising: one or more semiconductor light emitters configured to generate an input beam, wherein at least a portion of the input beam comprises a wavelength shorter than about 2.5 microns;one or more optical amplifiers configured to receive at least the portion of the input beam and to communicate an intermediate beam to an output end of the one or more optical amplifiers; andone or more optical fibers configured to receive at least a portion of the intermediate beam and to form an output beam with an output beam wavelength;a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm2; anda light detection system capable of collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample. 2. The diagnostic system of claim 1, wherein at least one of the one or more optical amplifiers comprises a cladding-pumped fiber amplifier or laser. 3. The diagnostic system of claim 1, wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 4. The diagnostic system of claim 1, wherein the light detection system further comprises a grating and a linear array of semiconductor detectors or a multi-spectral detector. 5. The diagnostic system of claim 1, wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 6. The diagnostic system of claim 1, wherein the light detection system further comprises Fourier Transform Infrared spectroscopy. 7. The diagnostic system of claim 1, wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion. 8. A diagnostic system comprising: a plurality of semiconductor light emitters, each of the light emitters configured to generate an optical beam;a beam combiner configured to receive at least a portion of the optical beams from the plurality of semiconductor light emitters and to generate a multiplexed optical beam; andan optical fiber or waveguide configured to receive at least a portion of the multiplexed optical beam and to communicate the at least a portion of the multiplexed optical beam to form an output beam having at least one wavelength;a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample comprising skin or tissue, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm2; anda light detection system capable of collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample. 9. The diagnostic system of claim 8, wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 10. The diagnostic system of claim 8, wherein the light detection system further comprises a grating and a linear array of semiconductor detectors or a multi-spectral detector. 11. The diagnostic system of claim 8, wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 12. The diagnostic system of claim 8, wherein the light detection system further comprises Fourier Transform Infrared spectroscopy. 13. The diagnostic system of claim 8, wherein the light detection system analyzes overtone and combinational bands of chemical species within the sample. 14. The diagnostic system of claim 8, wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion, and wherein the spectral fingerprinting examines a spectral pattern of absorption or reflection to identify a chemical composition. 15. A diagnostic system comprising: one or more semiconductor light emitters configured to generate an optical beam, wherein at least a portion of the optical beam comprises a wavelength shorter than about 2.5 microns;an optical fiber or waveguide configured to receive at least a portion of the optical beam and to communicate the at least a portion of the optical beam to form an output beam having at least one wavelength;a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample comprising skin or tissue, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm2; anda light detection system collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample, wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 16. The diagnostic system of claim 15, wherein the pulsed mode signal is related to a pulse repetition rate of the one or more semiconductor light emitters. 17. The diagnostic system of claim 15, wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 18. The diagnostic system of claim 15, wherein the light detection system further comprises a Fourier Transform Infrared spectroscopy or a grating with a linear array of semiconductor detectors or a multi-spectral detector. 19. The diagnostic system of claim 15, wherein the light detection system analyzes overtone and combinational bands of chemical species within the sample. 20. The diagnostic system of claim 15, wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion, and wherein the spectral fingerprinting examines a spectral pattern of absorption or reflection to identify a chemical composition.
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