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다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
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Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0798195 (2015-07-13) |
등록번호 | US-9442082 (2016-09-13) |
우선권정보 | GB-0309371.3 (2003-04-25); GB-0309374.7 (2003-04-25); GB-0309379.6 (2003-04-25); GB-0309383.8 (2003-04-25); GB-0309385.3 (2003-04-25); GB-0309387.9 (2003-04-25); GB-0525593.0 (2005-12-16); GB-0903198.0 (2009-02-25) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 0 인용 특허 : 487 |
The present specification discloses an X-ray system for processing X-ray data to determine an identity of an object under inspection. The X-ray system includes an X-ray source for transmitting X-rays, where the X-rays have a range of energies, through the object, a detector array for detecting the t
The present specification discloses an X-ray system for processing X-ray data to determine an identity of an object under inspection. The X-ray system includes an X-ray source for transmitting X-rays, where the X-rays have a range of energies, through the object, a detector array for detecting the transmitted X-rays, where each detector outputs a signal proportional to an amount of energy deposited at the detector by a detected X-ray, and at least one processor that reconstructs an image from the signal, where each pixel within the image represents an associated mass attenuation coefficient of the object under inspection at a specific point in space and for a specific energy level, fits each of pixel to a function to determine the mass attenuation coefficient of the object under inspection at the point in space; and uses the function to determine the identity of the object under inspection.
1. An X-ray system for processing X-ray data to determine an identity of an object under inspection, comprising: an X-ray source for transmitting a plurality of X-rays, wherein said X-rays have a range of energies, through the object; anda detector array for detecting said transmitted X-rays, wherei
1. An X-ray system for processing X-ray data to determine an identity of an object under inspection, comprising: an X-ray source for transmitting a plurality of X-rays, wherein said X-rays have a range of energies, through the object; anda detector array for detecting said transmitted X-rays, wherein said detector array comprises a first set of detectors and a second set of detectors, wherein each of said first set of detectors comprise scintillator material and a filter configured relative to the scintillator material such that the transmitted X-rays pass through the filter before passing through the scintillator material, wherein each of said second set of detectors comprise scintillator material and do not comprise a filter, and wherein 1% to 4% of the detector array comprises the first set of detectors and wherein 99% to 96% of the detector array comprises the second set of detectors. 2. The X-ray system of claim 1 wherein the filter comprises copper with a thickness ranging from 0.2 to 0.5 mm. 3. The X-ray system of claim 1 wherein the first set of detectors detect a higher net energy X-ray spectrum than the second set of detectors. 4. The X-ray system of claim 1 wherein the first set of detectors and the second set of detectors are arranged in a tessellated pattern in the detector array. 5. The X-ray system of claim 1 wherein the first set of detectors and the second set of detectors are arranged in alternating rows in the detector array. 6. The X-ray system of claim 1 wherein output signals from said first set of detectors are used to generate a first image and wherein output signals from said second set of detectors are used to generate a second image. 7. The X-ray system of claim 6 wherein the first image has a lower resolution than said second image. 8. The X-ray system of claim 7 wherein the first image has a higher energy than said second image. 9. The X-ray system of claim 8 wherein the first image and second image are used in combination to generate a dual energy analysis of said object.
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