Device and method for particle beam production
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H05H-007/08
H05H-007/00
A61N-005/10
출원번호
US-0380446
(2010-06-24)
등록번호
US-9451688
(2016-09-20)
우선권정보
EP-09163686 (2009-06-24)
국제출원번호
PCT/EP2010/059001
(2010-06-24)
§371/§102 date
20120313
(20120313)
국제공개번호
WO2010/149740
(2010-12-29)
발명자
/ 주소
Jongen, Yves
출원인 / 주소
Ion Beam Applications S.A.
대리인 / 주소
Fitch, Even, Tabin & Flannery LLP
인용정보
피인용 횟수 :
5인용 특허 :
2
초록▼
The present invention relates to a pulsed beam particle accelerator which can be used for particle radiation therapy. More particular, a device and method are provided to control the number of particles within a beam pulse. The particle accelerator comprises means for varying the number of particles
The present invention relates to a pulsed beam particle accelerator which can be used for particle radiation therapy. More particular, a device and method are provided to control the number of particles within a beam pulse. The particle accelerator comprises means for varying the number of particles within each beam pulse of said pulsed ion beam from a minimum value to a maximum value as function of the value of a beam control parameter. For each particle irradiation the required number of particles for each beam pulse is controlled by defining a value for said beam control parameter based on calibration data.
대표청구항▼
1. A particle accelerator of the type synchrocyclotron for producing an energetic pulsed ion beam, said accelerator comprising an ion source for producing ions and a radio frequency acceleration system for accelerating said ions, said accelerator comprising: Means for varying the number of particles
1. A particle accelerator of the type synchrocyclotron for producing an energetic pulsed ion beam, said accelerator comprising an ion source for producing ions and a radio frequency acceleration system for accelerating said ions, said accelerator comprising: Means for varying the number of particles within each beam pulse of said pulsed ion beam from a minimum value to a maximum value as function of the value of a beam control parameter, said parameter being related to the operation of the ion source and/or of the RF system,A beam control device comprising: a first interface for receiving an external instruction specifying the required number of particles for each beam pulse;a calibration table or parameter values of a mathematical function defining the relation between the value of said beam control parameter and said number of particles within a beam pulse, said table or parameters being stored on a suitable storing means;means for determining the required value of said beam control parameter corresponding to said required number of particles using said calibration table or said mathematical function;a second interface for sending said required value of said beam control parameter to said means for varying the number of particles;the particle accelerator further compromising:control means for automatically generating said calibration table or said mathematical function by defining a number of different values for said beam control parameter, producing for each said value a beam pulse and measuring the corresponding number of particles within each produced beam pulse. 2. The particle accelerator according to claim 1 wherein: the first interface is configured for receiving an external signal specifying the measured number of particles within a beam pulse, said measurement being performed with a beam monitor; andwherein the beam control device further comprises means for updating said calibration table or said parameter values in dependence of said measured number of particles. 3. The particle accelerator according to claim 2 further comprising: control means for automatically readjusting said calibration table or said mathematical function after each beam pulse produced by said accelerator, said readjusting being made by comparing the said measured number of particles with the said required number of particles. 4. The particle accelerator according to claim 1, wherein said means for varying the number of particles within each beam pulse comprises means for varying the arc current of said ion source. 5. The particle accelerator according to claim 1, wherein said means for varying the number of particles within each beam pulse comprises means for varying the acceleration voltage of said radio frequency acceleration system. 6. The particle accelerator according to claim 1, wherein said means for varying the number of particles within each beam pulse comprises means for varying the time period during which the said ion source is turned on. 7. The particle accelerator according to claim 1, wherein said means for varying the number of particles within each beam pulse comprises means for varying the time difference between the moment the ion source is turned on and the moment the ions can start acceleration using said radio frequency acceleration system. 8. A particle radiotherapy system comprising a particle accelerator according claim 1. 9. The particle radiotherapy system according to claim 8 further comprising: A spot scanning beam delivery device configured to provide a series of spot irradiations. 10. The particle radiotherapy system according to claim 9 whereby said spot scanning beam delivery device is configured to use a single beam pulse for each spot irradiation. 11. The particle radiotherapy system according to claim 9 wherein said spot scanning beam delivery device is configured to use two beam pulses to deliver the total required number of particles for each said spot irradiation, said particle radiotherapy device is further comprising: Means to define the required number of particles for the first of said two beam pulses as being a given percentage of the total required number of particles to be delivered for said spot irradiation;Means to specify the required number of particles of the second of said two beam pulses as being the said total required number of particles for said spot irradiation minus the measured number of particles already delivered with said first beam pulse. 12. The particle radiotherapy system according to claim 9 wherein said spot scanning beam delivery device is configured to use a variable number of beam pulses for each said spot irradiation, said particle radiotherapy device further comprising: Means to define the required number of particles for all beam pulses of said variable number of beam pulses such that the sum of the required number of particles of all beam pulses except the last beam pulse equals a given percentage of the total number of particles to be delivered for said spot irradiation;Means to specify the required number of particles for the last beam pulse of said variable number of beam pulses as being the total number of particles to be delivered for the said spot irradiation minus the measured number of particles already delivered for said spot irradiation. 13. A method for controlling the number of particles within a beam pulse from a pulsed beam particle beam accelerator, of the type synchrocyclotron, said beam pulses being usable for performing particle beam irradiations, said accelerator comprising means to vary the number of particles within each beam pulse as a function of the value of a beam control parameter, said beam control parameter being related to the operation of the ion source and/or the RF system, said method comprising the steps of: Generating calibration data comprising the sub-steps of: 1. Applying a value of said beam control parameter to said means for varying the number of particles;2. Producing and extracting a beam pulse from said accelerator;3. Measuring number of particles within said extracted beam pulse;3. Storing said measured number of particles within said extracted beam pulse; and4. Repeating steps 1 to 4 for a series of beam control parameter values;Performing particle beam production comprising the sub-steps of: 1. Receiving an external instruction specifying for each beam pulse the required number of particles within a beam pulse;2. Determining the required value of said beam control parameter corresponding to said required number of particles using said calibration data;3. Applying said required value of beam control parameter to said means for varying number of particles;4. Producing and extracting beam pulse from said accelerator. 14. The method according to claim 13 wherein said step of performing particle beam production further comprises the sub-steps of: 5. Measuring the number of particles within said extracted beam pulse;6. Making a comparison between said measured number of particles with said required number of particles;7. Applying a correction to said calibration data based on said comparison. 15. A method for performing a series of spot irradiations by a number of beam pulses with the system of claim 9, wherein the method comprises for each spot of said series of spot irradiations the steps of: defining the total required number of particles T1 to be delivered to said spot,specifying a total number of beam pulses for delivering said number of particles T1 and defining a required number of particles for each beam pulse of said total number of beam pulses,applying said beam pulses, except the last beam pulse,measuring the number of particles A1 of said beam pulses except the last beam pulse,before applying the last beam pulse, calculating the difference T1−A1 between the total required number of particles and the measured number of particles,specifying the required amount of particles in the last beam pulse A2 as equal to said difference T1−A1,applying the last beam pulse. 16. A particle accelerator of the type synchrocyclotron configured to produce an energetic pulsed ion beam, the accelerator comprising: an ion source configured to produce a pulsed ion beam comprising ions;a radio frequency acceleration system configured to accelerate the ions, wherein the number of particles within a beam pulse of the pulsed ion beam is varied from a minimum value to a maximum value as function of the value of a beam control parameter, the parameter being related to the operation of the ion source and/or of the RF system; anda beam control device comprising: a first interface configured to receive an external instruction specifying the required number of particles for each beam pulse;a memory configured to store a calibration table or parameter values of a mathematical function defining the relation between the value of the beam control parameter and the number of particles within a beam pulse; anda second interface configured to send a required value of the beam control parameter corresponding to the required number of particles using the calibration table or the mathematical function; anda controller configured to automatically generate the calibration table or the mathematical function by defining a number of different values for the beam control parameter, producing for each different value a beam pulse and measuring the corresponding number of particles within each produced beam pulse.
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이 특허에 인용된 특허 (2)
Yanagisawa,Masaki; Hiramoto,Kazuo; Akiyama,Hiroshi, Charged particle beam extraction system and method.
Gall, Kenneth P.; Zwart, Gerrit Townsend; Van der Laan, Jan; Molzahn, Adam C.; O'Neal, III, Charles D.; Sobczynski, Thomas C.; Cooley, James, Controlling intensity of a particle beam.
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