System and method for measuring passive intermodulation (PIM) in a device under test (DUT)
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H04B-017/00
H04B-017/10
G01R-025/04
H04B-017/11
출원번호
US-0601454
(2015-01-21)
등록번호
US-9455792
(2016-09-27)
발명자
/ 주소
Truesdale, Derek
Whiteley, Wesley
출원인 / 주소
ANRITSU COMPANY
대리인 / 주소
Tucker Ellis LLP
인용정보
피인용 횟수 :
1인용 특허 :
24
초록▼
In an embodiment, a method for calculating PIM associated with a DUT comprises obtaining a first measurement of PIM with the DUT connected to the measuring instrument, introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument,
In an embodiment, a method for calculating PIM associated with a DUT comprises obtaining a first measurement of PIM with the DUT connected to the measuring instrument, introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument, obtaining, upon introducing the shift, a second measurement of PIM with the DUT connected to the measuring instrument and calculating the PIM associated with the DUT based on the first measurement and the second measurement.
대표청구항▼
1. A method of calculating passive intermodulation (PIM) associated with a device under test (DUT) using a measuring instrument configured to generate test signals, the method comprising: obtaining a first measurement of PIM with the DUT connected to the measuring instrument;introducing a shift in a
1. A method of calculating passive intermodulation (PIM) associated with a device under test (DUT) using a measuring instrument configured to generate test signals, the method comprising: obtaining a first measurement of PIM with the DUT connected to the measuring instrument;introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument;obtaining, upon introducing the shift, a second measurement of PIM with the DUT connected to the measuring instrument; andcalculating the PIM associated with the DUT based on the first measurement and the second measurement;wherein the shift in the phase offset is introduced by increasing a transmission path between a signal source of the measuring instrument and the DUT. 2. The method of claim 1, wherein obtaining the first measurement and the second measurement includes generating a first tone having a fixed frequency,generating a second tone having a variable frequency,sweeping the variable frequency of the second tone within a frequency band, andmeasuring intermodulation generated in response to the first tone and the second tone and received at the measuring instrument; andwherein calculating the PIM associated with the DUT includes subtracting the first measurement and the second measurement. 3. The method of claim 1, wherein the transmission path is increased via an additional transmission line connected between the measuring instrument and the DUT. 4. The method of claim 1, wherein the transmission path is increased via an alternative signal path from the signal source of the measuring instrument to an output of the measuring instrument. 5. The method of claim 1, wherein the transmission path is increased by a length that is at least one quarter of a wavelength of a PIM having a frequency lowest within a band of frequencies of PIM generated at the DUT. 6. The method of claim 5, wherein the transmission path is increased by a length that is at least three eighths of a wavelength of a PIM having a frequency lowest within a band of frequencies of PIM generated at the DUT. 7. The method of claim 1, wherein the shift in the phase offset of PIM generated at the DUT in response to test signals generated by the measuring instrument is approximately 180°. 8. The method of claim 1, wherein obtaining a first measurement includes obtaining a peak value and a minimum value in a first trace generated by the measuring instrument; andwherein obtaining a second measurement includes obtaining a peak value and a minimum value in a second trace generated by the measuring instrument. 9. The method of claim 8, wherein the shift in the phase offset of PIM generated at the DUT in response to test signals generated by the measuring instrument is approximately 270° or more;wherein obtaining the first and second measurements is performed a plurality of times; andwherein the calculation of PIM associated with the DUT is an estimation based on peak values and minimum values in the plurality of measurements. 10. The method of claim 1, further comprising: calibrating the measuring instrument based on the obtained first measurement; andwherein upon calibrating the measuring instrument, the second measurement is a net measurement and the PIM associated with the DUT is calculated based on the net measurement. 11. The method of claim 1, further comprising: determining whether the calculated PIM exceeds a threshold; andcommunicating, to a user via the measuring instrument, whether the calculated PIM exceeds the threshold. 12. The method of claim 1, wherein obtaining the first measurement and the second measurement includes generating a first tone having a fixed frequency,generating a second tone having a fixed frequency,varying a length of a transmission path between a signal source of the measuring instrument and the DUT, andmeasuring intermodulation generated in response to the first tone and the second tone and received at the measuring instrument; andwherein calculating the PIM associated with the DUT includes subtracting the first measurement and the second measurement. 13. A measuring instrument for calculating passive intermodulation (PIM) associated with a device under test (DUT), the system comprising: a signal generator for generating test signals;a test port;a transmission path extending between the signal generator and the test port;a computer readable non-transitory storage medium and processor operating thereon, wherein the computer readable non-transitory storage medium includes instructions that when executed in response to user input cause the measuring instrument to obtain a first measurement of PIM with the DUT connected to the measuring instrument,obtain, upon the introduction of a shift in a phase offset of PIM generated at the DUT in response to test signals generated by the measuring instrument, a second measurement of PIM with the DUT connected to the measuring instrument, andcalculate PIM in the DUT based on the first measurement and the second measurement. 14. The measuring instrument of claim 13, wherein the computer readable, non-transitory storage medium further includes instructions that when executed in response to user input cause the measuring instrument to obtain the first measurement and the second measurement by causing the measuring instrument to generate a first tone having a fixed frequency,generate a second tone having a variable frequency,sweep the variable frequency of the second tone within a frequency band, andmeasure intermodulation generated in response to the first tone and the second tone and received at the measuring instrument. 15. The measuring instrument of claim 13, wherein the computer readable, non-transitory storage medium further includes instructions that when executed in response to user input cause the measuring instrument to obtain the first measurement by obtaining a peak value and a minimum value in a first trace generated by the measuring instrument, andobtain a second measurement by obtaining a peak value and a minimum value in a second trace generated by the measuring instrument. 16. The measuring instrument of claim 13, wherein the computer readable, non-transitory storage medium further includes instructions that when executed in response to user input cause the measuring instrument to calibrate the measuring instrument based on the obtained first measurement; andwherein upon calibrating the measuring instrument, the second measurement is a net measurement and the PIM associated with the DUT is calculated based on the net measurement. 17. The measuring instrument of claim 13, wherein the computer readable, non-transitory storage medium further includes instructions that when executed in response to user input cause the measuring instrument to determine whether the calculated PIM exceeds a threshold, andcommunicate, to a user via the measuring instrument, whether the calculated PIM exceeds the threshold. 18. A computer readable, non-transitory storage medium including instructions that when executed in response to user input cause a measuring instrument comprising a signal generator for generating test signals, a test port, and a transmission path extending between the signal generator and the test port to perform the operations comprising: obtaining a first measurement of passive intermodulation (PIM) with the DUT connected to the measuring instrument;introducing a shift in a phase offset of PIM generated at the DUT in response to test signals generated by the measuring instrument by increasing a transmission path between a signal source of the measuring instrument and the DUT;obtaining, upon the introduction of the shift in the phase offset of the PIM generated at the DUT in response to test signals generated by the measuring instrument, a second measurement of PIM with the DUT connected to the measuring instrument; andcalculating PIM attributable to the DUT based on the first measurement and the second measurement.
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