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Method and composition for electrodeposition of copper in microelectronics with dipyridyl-based levelers 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C25D-005/02
  • C25D-003/38
  • H05K-003/42
  • H01L-021/768
  • C25D-007/12
  • H01L-021/288
  • H01L-023/532
출원번호 US-0325601 (2014-07-08)
등록번호 US-9613858 (2017-04-04)
발명자 / 주소
  • Paneccasio, Jr., Vincent
  • Lin, Xuan
  • Hurtubise, Richard
  • Chen, Qingyun
출원인 / 주소
  • Paneccasio, Jr., Vincent
대리인 / 주소
    Carmody Torrance Sandak & Hennessey LLP
인용정보 피인용 횟수 : 0  인용 특허 : 40

초록

A method and composition for metallizing a via feature in a semiconductor integrated circuit device substrate, using a leveler compound which is a dipyridyl compound.

대표청구항

1. An electrolytic deposition composition comprising: (a) a source of copper ions;(b) a suppressor, wherein the suppressor comprises at least one amine functional group;(c) an accelerator, wherein the accelerator is an organic sulfur compound; and(d) a leveler compound, wherein the leveler compound

이 특허에 인용된 특허 (40)

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