최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0747490 (2015-06-23) |
등록번호 | US-9677877 (2017-06-13) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 0 인용 특허 : 322 |
A current problem with 3D scanners using structured light patterns is choosing a single light pattern to accommodate all possible object/range conditions. Objects far from the 3D scanner often require different patterns than objects that located close to the 3D scanner. In addition, large objects of
A current problem with 3D scanners using structured light patterns is choosing a single light pattern to accommodate all possible object/range conditions. Objects far from the 3D scanner often require different patterns than objects that located close to the 3D scanner. In addition, large objects often require different patterns than small objects. To automatically sense and adapt to a wide variety of size/range conditions, the present invention embraces a 3D scanner for dimensioning that has two projectors for projecting two different light patterns. Based on the scanning requirements for a particular object, one of the two projected patterns may be used to obtain information regarding the shape of an object. In one possible embodiment, this shape information is used to obtain the object's dimensions.
1. A dual-projector three-dimensional (3D) scanner, comprising: a structured-light projection subsystem, comprising a first projector configured for projecting a first light pattern onto an object, and a second projector configured for projecting a second light pattern onto the object;a camera for c
1. A dual-projector three-dimensional (3D) scanner, comprising: a structured-light projection subsystem, comprising a first projector configured for projecting a first light pattern onto an object, and a second projector configured for projecting a second light pattern onto the object;a camera for capturing pattern images of the first light pattern reflected from the object or the second light pattern reflected from the object; anda computing-and-control subsystem communicatively coupled to the structured-light projection subsystem and the camera, the computing-and-control subsystem configured to: (i) obtain the object's scanning requirements,(ii) activate, depending on the object's scanning requirements, either the first projector or the second projector,(iii) capture, using the camera, a pattern image, and(iv) process the pattern image to produce a range image. 2. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the computing-and-control subsystem is further configured to analyze the range image to obtain the object's dimensions. 3. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the first light pattern's pattern-feature density is lower than the second light pattern's pattern-feature density. 4. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the first light pattern's optical intensity is lower than the second light pattern's optical intensity. 5. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the first projector's field of view is smaller than the second projector's field of view. 6. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the object's scanning requirements include the object's size. 7. The dual-projector three-dimensional (3D) scanner according to claim 6, wherein the first projector is activated when the object's size is less than about 1 cubic centimeter and the second projector is activated when the object's size is greater than about 1 cubic meter. 8. The dual-projector three-dimensional (3D) scanner according to claim 1, wherein the object's scanning requirements include the object's range. 9. The dual-projector three-dimensional (3D) scanner according to claim 8, wherein the first projector is activated when the object is within a range of about 0.5 meter to about 2 meters and the second projector is activated when the object is within a range of about 2 meters to about 4 meters. 10. A method for dimensioning an object using a dual-projector three-dimensional (3D) scanner, the method comprising: activating one of the 3D scanner's two projectors to project a light pattern onto the object,capturing, using the camera, a preliminary pattern image,analyzing at least a portion of the preliminary pattern image,based on the analysis, selecting one of the 3D scanner's two projectors, anddimensioning the object using the selected projector;wherein the step of dimensioning comprises: activating the selected projector;capturing, using the camera, a pattern image;generating, using the pattern image, a range image; andderiving, using the range image, the object's dimensions. 11. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 10, wherein the step of analyzing comprises determining the object's range. 12. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 10, wherein the step of analyzing comprises determining the object's size. 13. A method for dimensioning an object using a dual-projector three-dimensional (3D) scanner, the method comprising: activating a first projector to project a first light pattern onto the object,capturing, using a camera, a first pattern image of the first light pattern reflected from the object,activating a second projector to project a second light pattern onto the object,capturing, using a camera, a second pattern image of the second light pattern reflected from the object,evaluating the first pattern image and the second pattern image,selecting, based on the evaluation, either the first pattern image or the second pattern image, anddimensioning the object using the selected pattern image;wherein the step of dimensioning comprises: generating, using the selected pattern image, a range image; andderiving, using the range image, the object's dimensions. 14. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 13, wherein the step of evaluating comprises detecting that at least a portion of the first pattern image or the second pattern image is saturated. 15. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 13, wherein the step of evaluating comprises detecting that the intensity of pattern features in either the first pattern image or the second pattern image is too low for dimensioning. 16. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 13, wherein the step of evaluating comprises detecting that the density of pattern features in either the first pattern image or the second pattern image is either too high or too low for dimensioning at or above a particular accuracy. 17. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 13, wherein the first light pattern's pattern-feature density is lower than the second light pattern's pattern-feature density. 18. The method for dimensioning an object using a dual-projector three-dimensional (3D) scanner according to claim 13, wherein the first light pattern's optical intensity is lower than the second light pattern's optical intensity.
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