A method for detecting structures (41, 42) such as edges and material transitions on and/or in an object (40) under investigation has an antenna arrangement which transmits microwave signals and registers the signals reflected from the object (40) under investigation in magnitude and phase. A three-
A method for detecting structures (41, 42) such as edges and material transitions on and/or in an object (40) under investigation has an antenna arrangement which transmits microwave signals and registers the signals reflected from the object (40) under investigation in magnitude and phase. A three-dimensional image of the object (40) under investigation is reconstructed at sampling points of the object under investigation from the latter. It operates with the method steps: determination of a spatial position of a structure (41, 42) from the magnitude of the reflected signal,determination of the sign of the reflection coefficient of the reflected signal at the spatial position of the structure (41, 42), andidentification of structures (41, 42) on the basis of the spatial arrangement of the sign of the reflection coefficient.
대표청구항▼
1. A method for detecting structures, especially edges and material transitions on and/or in an object under investigation, comprising: providing an antenna arrangement from which microwave signals are transmitted and from which the signals reflected from the object under investigation are registere
1. A method for detecting structures, especially edges and material transitions on and/or in an object under investigation, comprising: providing an antenna arrangement from which microwave signals are transmitted and from which the signals reflected from the object under investigation are registered in magnitude and phase, wherein a three-dimensional image of the object under investigation is reconstructed from these: determining a spatial position of a structure from the magnitude of the reflected signal,determining the sign of the reflection coefficient of the reflected signal at the spatial position of the structure, andidentifying structures on the basis of the spatial arrangement of the sign of the reflection coefficient,wherein an illumination boundary of the object under investigation and/or an edge in a material are determined if an irregular sequence of sign changes is detected within a spatial region. 2. The method according to claim 1, wherein the precise spatial position of the structure is determined by preparing an image in the region of the originally determined spatial position with a narrower grid of sampling points. 3. The method according to claim 1, wherein the precise spatial position of the structure is determined by interpolation of the signal magnitude between sampling points in the region of the originally determined spatial position. 4. The method according to claim 1, wherein the sign of the reflection coefficient is determined from the phase behavior of the reflected signal, andwherein a negative sign of the reflection coefficient is present if a sudden phase change is determined in the reflected signal, and a positive sign of the reflection coefficient is present if a steady course of the phase of the reflected signal is determined. 5. The method according to claim 4, wherein a sudden phase change is detected if the phase of the reflected signal at the position of the structure is less than −90° or more than +90°, andwherein a steady course of the phase is detected if the phase of the reflected signal at the position of the structure is less than +90° and more than −90°. 6. The method according to claim 1, wherein the spatial extension and the spatial shape of a limiting surface of a material transition are identified through coherent regions with identical phase behavior. 7. The method according to claim 1, wherein an inclusion made from a material with a permittivity which differs from the permittivity of the surrounding object under investigation is determined if, within the object under investigation, a coherent region with a negative sign follows an adjacent coherent region with a positive sign or vice versa. 8. The method according to claim 7, wherein the inclusion comprises a material with a relatively higher permittivity than the material of the surrounding object under investigation if a coherent region with a negative sign is initially detected, and following this, a coherent region with a positive sign is detected, and the inclusion provides a material with a relatively lower permittivity than the material of the surrounding object under investigation if a coherent region with a positive sign is initially detected, and following this, a coherent region with negative sign is detected. 9. The method according to claim 1, wherein the material has high permittivity and/or conductivity. 10. A device for detecting structures, especially edges and material transitions on and/or in an object under investigation, comprising: an antenna arrangement which provides a plurality of transmission and reception antennas, wherein each transmission antenna transmits microwave signals in succession, and all of the reception antennas register the signals reflected from the object under investigation in magnitude and phase, andan evaluation unit, which provides an imaging unit which reconstructs a three-dimensional image of the object under investigation from the registered, reflected signals,wherein the evaluation unit further provides: a localization unit which determines a spatial position of a structure from the magnitude of the reflected signal,a phase unit which determines the sign of the reflection coefficient of the reflected signal at the spatial position of the structure, anda grouping unit which identifies the structure on the basis of the spatial arrangement of the sign of the reflection coefficient,wherein the grouping unit determines an illumination boundary of the object under investigation and/or an edge in a material if an irregular sequence of sign changes is detected within a spatial region. 11. The device according to claim 10, wherein the localization unit determines the precise spatial position of the structure by interpolation of the signal magnitude between sampling points and/or by preparing a further image in the region of the originally determined spatial position with a narrower grid of sampling points. 12. The device according to claim 10, wherein the phase unit determines the sign of the reflection coefficient from the phase behavior of the reflected signal,wherein a negative sign of the reflection coefficient is present if it determines a sudden phase change in the reflected signal, andwherein a positive sign of the reflection coefficient is present if it determines a steady course of the phase of the reflected signal. 13. The device according to claim 12, wherein the phase unit detects a sudden phase change if the phase of the reflected signal at the position of the structure is less than −90° or more than +90°, and detects a steady course of the phase if the phase of the reflected signal at the position of the structure is less than +90° and more than −90°. 14. The device according to claim 10, wherein the grouping unit identifies a spatial extension and a spatial shape of a limiting surface of a material transition with reference to coherent regions with identical phase behavior. 15. The device according to claim 10, wherein the grouping unit determines an inclusion made from a material with a permittivity which differs from the permittivity of the surrounding object under investigation if a coherent region with a negative sign follows an adjacent coherent region with a positive sign within the object under investigation or vice versa. 16. The device according to claim 10, wherein the grouping unit detects an inclusion made from a material with a higher permittivity than the material of the object under investigation if a region with a negative sign is initially detected, and following this, a region with a positive sign is detected within the object under investigation orthat it detects an inclusion made from a material with a relatively lower permittivity than the material of the object under investigation if a region with positive sign is initially detected, and following this, a region with negative sign is detected. 17. The device according to claim 10, wherein the material has high permittivity and/or conductivity. 18. The device according to claim 10, wherein the imaging unit displays the determined spatial structures and/or the permittivity of the determined structures. 19. A computer program with program-code means which executes the method steps of claim 1 when the program is executed on a programmable computer and/or a digital signal processor. 20. A computer-readable storage medium with program-code means stored upon it which executes the method steps of claim 1 when the program is executed on a programmable computer and/or a digital signal processor.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (8)
Lancashire David C,GBX ; Barnes Bartholomew A. F.,GBX ; Udall Stephen J,GBX, Block adaptive quantization.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.