Apparatus and method for estimating formation lithology using X-ray flourescence
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01N-023/223
E21B-049/06
E21B-049/10
G01N-033/24
출원번호
US-0409289
(2012-03-01)
등록번호
US-9708907
(2017-07-18)
발명자
/ 주소
Li, Fusheng
출원인 / 주소
BAKER HUGHES INCORPORATED
대리인 / 주소
Cantor Colburn LLP
인용정보
피인용 횟수 :
0인용 특허 :
28
초록▼
An apparatus for estimating properties of an earth formation includes a carrier configured to be disposed in a borehole in the earth formation, and a sample retriever configured to remove a sample of the earth formation, the sample including solid components of the earth formation. The apparatus als
An apparatus for estimating properties of an earth formation includes a carrier configured to be disposed in a borehole in the earth formation, and a sample retriever configured to remove a sample of the earth formation, the sample including solid components of the earth formation. The apparatus also includes an analysis assembly including a chamber disposed with the carrier and configured to hold the sample, an X-ray source configured to irradiate the sample with X-ray radiation while the sample is disposed in the chamber, and one or more X-ray detectors configured to detect radiation emitted from the sample in response to irradiation from the X-ray source.
대표청구항▼
1. An apparatus for estimating properties of an earth formation, comprising: a carrier configured to be disposed in a borehole in the earth formation;a sample retriever configured to remove a sample of the earth formation, the sample including solid components of the earth formation;a sample process
1. An apparatus for estimating properties of an earth formation, comprising: a carrier configured to be disposed in a borehole in the earth formation;a sample retriever configured to remove a sample of the earth formation, the sample including solid components of the earth formation;a sample processing unit disposed in the carrier, the sample processing unit configured to process the sample into a fluid state by reducing the solid components to a granular form;a sample conveyor configured to advance the processed sample including the granular solid components to an analysis assembly after the sample is processed into the fluid state; andthe analysis assembly configured to receive the processed sample in the fluid state, the analysis assembly including a chamber disposed with the carrier and configured to hold the processed sample, an X-ray source configured to irradiate the granular solid components with X-ray radiation while the processed sample is disposed in the chamber, and one or more X-ray detectors configured to detect radiation emitted from the processed sample in response to irradiation from the X-ray source. 2. The apparatus of claim 1, wherein the sample processing unit is configured to process the sample by mixing the granular solid components with a liquid. 3. The apparatus of claim 1, wherein the sample processing unit includes a mixing tool configured to stir the granular sample prior to irradiating the granular sample. 4. The apparatus of claim 1, further comprising a processing unit configured to be disposed in the borehole with the carrier and communicably connected to the one or more X-ray detectors. 5. The apparatus of claim 4, wherein the processing unit is configured to receive signal data from the one or more X-ray detectors and generate at least one measurement spectrum from the signal data. 6. The apparatus of claim 5, wherein the processing unit is further configured to: identify one or more peaks in the measurement spectrum and estimate a concentration of one or more elements based on the one or more peaks;select one or more elemental spectra from a stored library, each of the one or more elemental spectra corresponding to a spectral contribution of each estimated element; andcompare each of the one or more elemental spectra to the measurement spectrum and adjusting the estimated concentration of the one or more elements based on the comparison. 7. The apparatus of claim 6, wherein the processing unit is configured to estimate the concentration of each of the one or more elements by identifying an element based on a location of a corresponding peak and estimating the concentration of the element based on a height of the corresponding peak. 8. The apparatus of claim 6, wherein the processing unit is further configured to calculate a mathematical model of the sample based on the estimated concentrations, and is further configured to calculate each of the one or more elemental spectra from the mathematical model. 9. The apparatus of claim 6, wherein the processing unit is configured to compare each of the one or more elemental spectra by performing a fit of each of the one or more elemental spectra to the measurement spectrum and calculating a concentration of each element corresponding to each elemental spectra based on the fit. 10. The apparatus of claim 8, wherein the mathematical model is a Monte Carlo model, and the processing unit is configured to compare each of the one or more elemental spectra by performing a library least squares fit of each of the one or more elemental spectra to the measurement spectra. 11. The apparatus of claim 6, wherein the processing unit is connected in communication with a surface location and is configured to transmit results of the comparison to the surface location. 12. A method of estimating properties of an earth formation, comprising: disposing an X-ray spectroscopy tool in a borehole in the earth formation;removing a sample of the earth formation, the sample including solid components of the earth formation;processing the sample into a fluid state, wherein processing includes reducing the solid components to a granular form;advancing the processed sample including the granular solid components to an analysis assembly after the sample is processed into the fluid state;irradiating the granular solid components with X-ray radiation by the analysis assembly while the processed sample is disposed in the tool and in the fluid state, and detecting radiation emitted from the processed sample in response to the irradiation;receiving a measurement spectrum of the radiation emitted from the processed sample;identifying one or more peaks in the measurement spectrum and estimating a concentration of one or more elements based on the one or more peaks;selecting one or more elemental spectra from a stored library, each elemental spectrum corresponding to a spectral contribution of each estimated element; andcomparing each of the one or more elemental spectra to the measurement spectrum and adjusting the estimated concentration of the one or more elements based on the comparison. 13. The method of claim 12, wherein estimating the concentration of the one or more elements includes identifying an element based on a location of a corresponding peak and estimating a concentration of the element based on a height of the one or more peaks. 14. The method of claim 12, further comprising calculating a mathematical model of the sample based on the estimated concentrations. 15. The method of claim 14, wherein the mathematical model is a Monte Carlo model. 16. The method of claim 14, further comprising calculating each of the one or more elemental spectra from the mathematical model. 17. The method of claim 12, wherein comparing includes performing a fit of each of the one or more elemental spectra to the measurement spectra and calculating a concentration of each element corresponding to each elemental spectra based on the fit. 18. The method of claim 17, wherein the fit is a least squares fit. 19. The method of claim 14, wherein the mathematical model is a Monte Carlo model, and comparing includes performing a least squares fit of each of the elemental spectra to the measurement spectra. 20. The method of claim 12, further comprising transmitting results of the comparison to the surface location in real time.
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