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A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port por

A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

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1. A method comprising: positioning a test slot, a loader assembly, and an exchange assembly in a testing rack;opening an access port portion of a test deck with the exchange assembly without separating top and bottom covers of the test deck;replacing a first individual data storage component with a

1. A method comprising: positioning a test slot, a loader assembly, and an exchange assembly in a testing rack;opening an access port portion of a test deck with the exchange assembly without separating top and bottom covers of the test deck;replacing a first individual data storage component with a second individual data storage component with the exchange assembly as directed by a rack controller of the testing rack;closing the access port portion of the test deck with the exchange assembly;engaging the test deck with a test slot with the loader assembly; andconducting a data component test with the test deck and test slot as directed by a deck controller of the test deck. 2. The method of claim 1, wherein the test slot is adapted to provide a plurality of different temperatures to the test deck. 3. The method of claim 1, wherein the exchange assembly comprises first and second end effectors that respectively open the access port portion and replaces the slider assembly. 4. The method of claim 3, wherein the loader assembly comprises a third end effector that engage and disengage the test deck with the test slot. 5. The method of claim 1, wherein the test deck comprises a housing defined by the top and bottom covers that encloses a single data storage medium and a single data access assembly. 6. The method of claim 1, wherein the data storage component comprises a transducing head or a head gimbal assembly. 7. A apparatus comprising a test rack having a rack controller, first test slot, exchange assembly, and a loader assembly, the loader assembly comprising at least one horizontal conveyor and a vertical actuator configured to move a test deck to and from the first test slot to an exchange assembly, the exchange assembly configured to open an access port portion of the test deck as directed by the rack controller and replace a slider assembly housed within the test deck, the first test slot configured to test the slider assembly as directed by a deck controller of the test deck. 8. The apparatus of claim 7, wherein the first test slot has a barrier to protect against electromagnetic interference, thermal disturbances, and acoustic disturbances. 9. The apparatus of claim 7, wherein the deck controller is different and independent of the rack controller. 10. The apparatus of claim 7, wherein the first test slot is positioned in vertical alignment with a second test slot, the first and second test slots each accessed by a single vertical actuator. 11. The apparatus of claim 10, wherein the first and second test slots are connected via a cooling duct adapted to provide cooling to each test slot. 12. A method comprising: engaging first and second test decks with respective first and second test slots via a loader assembly in a test rack, each test deck have an independent deck controller;conducting first and second data component tests with the respective first and second test slots as directed by the respective deck controllers;opening an access port portion of the first test deck with an exchange assembly as directed by a rack controller of the test rack; andreplacing a first tested slider assembly housed within the first test deck with a first untested slider assembly via an exchange assembly as directed by the rack controller. 13. The method of claim 12, wherein the replacing step is conducted while the second deck is under test in the second test slot. 14. The method of claim 12, wherein the first tested slider assembly is replaced with the first untested slider assembly in response to the first tested slider assembly passing a least one data component test. 15. The method of claim 12, wherein the second test deck comprises a second tested slider assembly, the second tested slider assembly replaced with a second untested slider assembly in response the second tested slider assembly having a lower performance metric than the second tested slider assembly. 16. The method of claim 12, wherein the first and second data component tests have different test times. 17. The method of claim 12, wherein the first and second data component tests have different testing temperatures. 18. The method of claim 12, wherein a data storage medium and actuator remain enclosed within the first test deck while the first tested slider assembly is removed and replaced in the first test deck. 19. The method of claim 12, wherein the first test deck repeatedly is tested, opened, and engaged to replace a tested slider assembly with an untested slider assembly. 20. The method of claim 12, wherein the exchange assembly loads a second untested slider assembly into the second test deck while the first test deck is under test, the second test deck comprising a data storage medium and actuator without a slider assembly prior to the second untested slider assembly being loaded.