Systems and methods for detecting the presence of a selected volume of material in a sample processing device
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01N-021/00
C12Q-001/68
B01L-003/00
G01N-021/64
G01N-035/02
G01N-035/04
출원번호
US-0881506
(2015-10-13)
등록번호
US-9725762
(2017-08-08)
발명자
/ 주소
Ludowise, Peter D.
Whitman, David A.
Armantrout, Kyle C.
Exner, Maurice
Jacky, Lucien A. E.
Tabb, Michelle
출원인 / 주소
Diasorin S.P.A.
대리인 / 주소
Fainberg, Michael
인용정보
피인용 횟수 :
0인용 특허 :
242
초록▼
Systems and methods for processing sample processing devices. The system can include a sample processing device comprising a detection chamber, a motor configured to rotate the sample processing device about an axis of rotation, and an optical module operatively positioned relative to the sample pro
Systems and methods for processing sample processing devices. The system can include a sample processing device comprising a detection chamber, a motor configured to rotate the sample processing device about an axis of rotation, and an optical module operatively positioned relative to the sample processing device and configured to determine whether a selected volume of material is present in the detection chamber of the sample processing device. The method can include rotating the sample processing device about an axis of rotation, and determining whether a selected volume of material is present in the detection chamber, while rotating the sample processing device. In some embodiments, determining whether a selected volume of material is present can be performed by optically interrogating the detection chamber for an optical property of the material.
대표청구항▼
1. A system for processing sample processing devices, the system comprising: a sample processing device comprising a detection chamber;a motor configured to rotate the sample processing device about an axis of rotation;an optical module operatively positioned relative to the sample processing device
1. A system for processing sample processing devices, the system comprising: a sample processing device comprising a detection chamber;a motor configured to rotate the sample processing device about an axis of rotation;an optical module operatively positioned relative to the sample processing device and configured to determine whether a selected volume of material is present in the detection chamber of the sample processing device while the motor rotates the sample processing device about the axis of rotation. 2. The system of claim 1, wherein the optical module includes a plurality of optical channels, and wherein at least one of the optical channels is configured to determine whether a selected volume of material is present in the detection chamber of the sample processing device. 3. The system of claim 1, wherein the sample processing device further includes an input chamber, anda channel positioned to fluidly couple the input chamber and the detection chamber. 4. The system of claim 3, wherein the sample processing device further includes a valve positioned in the channel, wherein when the valve is closed, the input chamber and the detection chamber are not in fluid communication via the channel, and wherein when the valve is open, the input chamber and the detection chamber are in fluid communication via the channel. 5. The system of claim 3, wherein the input chamber includes a metering chamber configured to meter a selected amount of a sample to the detection chamber. 6. The system of claim 1, wherein the optical module is operatively positioned relative to the sample processing device via a gantry, and wherein the optical module is configured to be positioned at a plurality of gantry positions, relative to the axis of rotation, and is further configured to optically interrogate the detection chamber at a plurality of gantry positions. 7. The system of claim 6, wherein the plurality of gantry positions correspond to different radial positions in the detection chamber, relative to the axis of rotation. 8. The system of claim 6, wherein a first gantry position is positioned radially outwardly of a second gantry position. 9. The system of claim 1 wherein the optical module is operatively positioned relative to the sample processing device via a gantry, and wherein the optical module is configured to be positioned at a predetermined gantry position, relative to the axis of rotation, and is further configured to optically interrogate the detection chamber at the predetermined gantry position. 10. The system of claim 9, wherein the detection chamber includes an inner boundary located nearest the axis of rotation, and wherein the optical module is configured to optically interrogate the detection chamber at a gantry position proximate the inner boundary of the detection chamber. 11. The system of claim 1, wherein the optical module is configured to optically interrogate the detection chamber to determine whether a selected volume of material is present in the detection chamber. 12. The system of claim 1, wherein the optical module is configured for multiplex fluorescence detection. 13. The system of claim 1, wherein the optical module is configured to determine whether a selected volume of material is present in the detection chamber by emitting an electromagnetic signal into the detection chamber, anddetecting backscattered reflection of the electromagnetic signal. 14. The system of claim 1, wherein the optical module is configured to determine whether a selected volume of material is present in the detection chamber by emitting an electromagnetic signal into the detection chamber, anddetecting fluorescence emitted by a material in the detection chamber. 15. The system of claim 1, wherein the optical module is configured to determine whether a selected volume of material is present in the detection chamber by emitting an electromagnetic signal into the detection chamber at a first wavelength, anddetecting electromagnetic signals emitted from the detection chamber at a second wavelength, after emitting an electromagnetic signal into the detection chamber at a first wavelength. 16. The system of claim 1, wherein the optical module is further configured to determine an amount of material that is present in the detection chamber.
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