Tamper-respondent assembly with nonlinearity monitoring
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G08B-013/08
G08B-013/12
H05K-001/18
H05K-001/02
G01N-027/20
출원번호
US-0194738
(2016-06-28)
등록번호
US-9858776
(2018-01-02)
발명자
/ 주소
Busby, James A.
Isaacs, Phillip Duane
출원인 / 주소
INTERNATIONAL BUSINESS MACHINES CORPORATION
대리인 / 주소
Maranzano, Teddi
인용정보
피인용 횟수 :
3인용 특허 :
120
초록▼
Tamper-respondent assemblies and methods of fabrication are provided which include at least one tamper-respondent sensor and a detector. The at least one tamper-respondent sensor includes conductive lines which form, at least in part, at least one tamper-detect network of the tamper-respondent senso
Tamper-respondent assemblies and methods of fabrication are provided which include at least one tamper-respondent sensor and a detector. The at least one tamper-respondent sensor includes conductive lines which form, at least in part, at least one tamper-detect network of the tamper-respondent sensor(s). The detector monitors the tamper-respondent sensor(s) by applying an electrical signal to the conductive lines of the at least one tamper-respondent sensor to monitor for a non-linear conductivity change indicative of a tamper event at the tamper-respondent sensor(s). For instance, the detector may monitor a second harmonic of the electrical signal applied to the conductive lines for the non-linear conductivity change indicative of the tamper event, such as an attempted shunt of one or more conductive lines of the tamper-respondent sensor(s).
대표청구항▼
1. A tamper-respondent assembly comprising: at least one tamper-respondent sensor including conductive lines forming, at least in part, at least one tamper-detect network of the at least one tamper-respondent sensor;a detector to monitor the at least one tamper-respondent sensor, the detector applyi
1. A tamper-respondent assembly comprising: at least one tamper-respondent sensor including conductive lines forming, at least in part, at least one tamper-detect network of the at least one tamper-respondent sensor;a detector to monitor the at least one tamper-respondent sensor, the detector applying an electrical signal to the conductive lines of the at least one tamper-respondent sensor to monitor over time for a non-linear conductivity change, where the non-linear conductivity change is indicative of a tamper event at the at least one tamper-respondent sensor; andwherein the detector monitors a second harmonic of the electrical signal applied to the conductive lines for the non-linear conductivity change indicative of the tamper event at the at least one tamper-respondent sensor. 2. The tamper-respondent assembly of claim 1, wherein the electrical signal has both known DC characteristics and known AC characteristics. 3. The tamper-respondent assembly of claim 1, wherein the tamper event comprises a shunt of one or more conductive lines of the conductive lines of the at least one tamper-respondent sensor, the non-linear conductivity change resulting from the shunt contacting the one or more conductive lines. 4. The tamper-respondent assembly of claim 1, wherein the at least one tamper-respondent sensor comprises at least one flexible layer, and the conductive lines are disposed on the at least one flexible layer to form, at least in part, the at least one tamper-detect network. 5. The tamper-respondent assembly of claim 1, further comprising: a circuit board; andthe at least one tamper-respondent sensor comprises an embedded tamper-respondent sensor embedded within the circuit board, the conductive lines being conductive lines embedded within the circuit board. 6. The tamper-respondent assembly of claim 1, wherein the detector periodically applies the electrical signal to the conductive lines. 7. The tamper-respondent assembly of claim 1, wherein the conductive lines of the at least one tamper-respondent sensor each have a line width Wl≦200 μm. 8. The tamper-respondent assembly of claim 1, wherein the conductive lines of the at least one tamper-respondent sensor comprise metal lines or metal alloy lines. 9. A tamper-respondent assembly comprising: at least one electronic component;an enclosure surrounding, at least in part, the at least one electronic component;a tamper-respondent sensor associated with the enclosure and facilitating forming a secure volume about the at least one electronic component, the tamper-respondent sensor comprising conductive lines forming, at least in part, a tamper-detect network of the tamper-respondent sensor;a detector to monitor the tamper-respondent sensor, the detector applying an electrical signal to the conductive lines of the tamper-respondent sensor to monitor over time for a non-linear conductivity change, where the non-linear conductivity charge is indicative of a tamper event at the tamper-respondent sensor; andwherein the detector monitors a second harmonic of the electrical signal applied to the conductive lines for the non-linear conductive change indicative of the tamper event at the at least one tamper-respondent sensor. 10. The tamper-respondent assembly of claim 9, wherein the tamper event comprises a shunt of one or more conductive lines of the conductive lines of the tamper-respondent sensor, and the non-linear conductivity change results from the shunt contacting the one or more conductive lines. 11. The tamper-respondent assembly of claim 9, wherein the tamper-respondent sensor comprises at least one flexible layer, and the conductive lines are disposed on the at least one flexible layer to form, at least in part, the at least one tamper-detect network. 12. The tamper-respondent assembly of claim 11, wherein the tamper-respondent sensor is mounted to an inner surface of the enclosure. 13. The tamper-respondent assembly of claim 12, further comprising: a circuit board; andan embedded tamper-respondent sensor embedded within the circuit board, wherein the tamper-respondent sensor and the embedded tamper-respondent sensor together facilitate defining the secure volume about the at least one electronic component. 14. The tamper-respondent assembly of claim 9, wherein the conductive lines of the tamper-respondent sensor comprise metal lines or metal alloy lines, and the conductive lines each have a line width Wl≦200 μms. 15. A fabrication method comprising: fabricating a tamper-respondent assembly, the fabricating comprising: providing at least one tamper-respondent sensor comprising conductive lines forming, at least in part, at least one tamper-detect network of the at least one tamper-respondent sensor;providing a detector to monitor the at least one tamper-respondent sensor, the detector applying an electrical signal to the conductive lines of the at least one tamper-respondent sensor to monitor over time for a non-linear conductivity change, where the non-linear conductivity charge is indicative of a tamper event at the at least one tamper-respondent sensor; andwherein the detector monitors a second harmonic of the electrical signal applied to the conductive lines for the non-linear conductivity change indicative of the tamper event at the at least one tamper-respondent sensor. 16. The fabrication method of claim 15, wherein the applying by the detector comprises periodically applying the electrical signal to the conductive lines, and wherein the electrical signal has both known DC characteristics and known AC characteristics. 17. The fabrication method of claim 15, further comprising: providing an enclosure surrounding, at least in part, at least one electronic component;associating the at least one tamper-respondent sensor with the enclosure to facilitate forming a secure volume about the at least one electronic component;providing a circuit board with an embedded tamper-respondent sensor embedded within the circuit board; andmounting the enclosure with the tamper-respondent sensor to the circuit board, wherein the at least one tamper-respondent sensor associated with the enclosure and the embedded tamper-respondent sensor within the circuit board together facilitate defining the secure volume about the at least one electronic component.
Verrier Philippe (Le Port Marly FRX) Poulenard Roger (Le Peco FRX), Arrangement for protecting an electronic card and its use for protecting a terminal for reading magnetic and/or micropro.
Angelopoulos, Marie; Graham, Teresita O.; Purushothaman, Sampath; Weingart, Steve H., Data protection by detection of intrusion into electronic assemblies.
Kleijne Theodoor A. (Dreumel NLX) de Bruin Johannes A. J. (Montfoort NLX) Goossens Jan B. (De Bilt NLX), Data security device for protecting stored data.
Shirakami, Takashi; Yamazaki, Naoya; Iino, Kazuhiro; Tada, Yoshiaki; Ueda, Satoshi, Heat transfer mechanism, heat dissipation system, and communication apparatus.
Bumler Heinz (Mnchen DEX) Hoffmann Richard (Gaimersheim DEX) Schirmer Klaus (Ingolstadt DEX) Zeides Otto (Ingolstadt DEX), Housing for installation in motor vehicles.
Dellmo, Russell Wayne; Petkus, Eric Edmond; Yancy, Bruce Wayne, Modular cryptographic device providing multi-mode wireless LAN operation features and related methods.
Perreault,Paul G; Clark,Douglas A; Heitmann,Kjell A, System and method for installing a tamper barrier wrap in a PCB assembly, including a PCB assembly having improved heat sinking.
Mori Ryoichi (24-12 ; Hakusan 1-chome Bunkyo-ku ; Tokyo JPX), Tamper resistant module having logical elements arranged in multiple layers on the outer surface of a substrate to prote.
Comerford Liam D. (Carmel NY) Ledermann Peter G. (Pleasantville NY) Levy Lawrence I. (Yorktown Heights NY) White Steve R. (New York NY), Tamper resistant packaging for information protection in electronic circuitry.
Farquhar, Donald S.; Feger, Claudius; Markovich, Voya; Papathomas, Konstantinos I.; Poliks, Mark D.; Shaw, Jane M.; Szeparowycz, George; Weingart, Steve H., Tamper-responding encapsulated enclosure having flexible protective mesh structure.
Farquhar, Donald S.; Feger, Claudius; Markovich, Voya; Papathomas, Konstantinos I.; Poliks, Mark D.; Shaw, Jane M.; Szeparowycz, George; Weingart, Steve H., Tamper-responding encapsulated enclosure having flexible protective mesh structure.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.