A novel solution is proposed for processing a test tube transported on a test tube carrier by a conveyor so that spilling of the liquid in the test tube is reduced or even prevented, particularly an arrangement for sequencing and guiding travel of test tube carriers transported on at least one conve
A novel solution is proposed for processing a test tube transported on a test tube carrier by a conveyor so that spilling of the liquid in the test tube is reduced or even prevented, particularly an arrangement for sequencing and guiding travel of test tube carriers transported on at least one conveyor. The arrangement includes at least one rotatable deviator positioned to intersect the at least one conveyor. The deviator includes a horizontal deviator plate including at least one grip for receiving a test tube carrier. One contact surface is positioned vertically at a distance from the deviator plate and aligned with the grip. The contact surface is formed to contact the test tube carrier at a distance from the contact level of the grip and the carrier.
대표청구항▼
1. An arrangement for sequencing and guiding travel of test tube carriers transported on at least one conveyor, the arrangement comprising: at least one conveyor,one rotatable deviator positioned to intersect the at least one conveyor, the deviator comprising a horizontal deviator plate including at
1. An arrangement for sequencing and guiding travel of test tube carriers transported on at least one conveyor, the arrangement comprising: at least one conveyor,one rotatable deviator positioned to intersect the at least one conveyor, the deviator comprising a horizontal deviator plate including at least one grip for receiving a test tube carrier, andat least one push plate positioned in proximity of the deviator plate and having two pushing surfaces formed as arcs that start as tangents of a circle defined by tracks that a bottom of a recess of the grip travels and then curve outwards from said circle. 2. The arrangement according to the claim 1, further comprising: at least two deviators having horizontal deviator plates having four pushing surfaces formed as an arc that starts as a tangent of a circle defined by the track that the bottom of the recess of the grip travels and then curves outwards from said circle, wherein the at least one push plate is positioned in proximity of the horizontal deviator plates of the at least two deviators. 3. The arrangement according to claim 1, further comprising at least one contact surface positioned vertically at a distance from the deviator plate and aligned with the grip, the contact surface being formed to contact the test tube carrier at a distance from the contact level of the grip and the carrier. 4. The arrangement according to claim 1, wherein the grip is a recess on a circular plate. 5. The arrangement according to claim 3, wherein the contact surface is a recess on a circular plate. 6. The arrangement according to claim 3, wherein the grip and the contact surface are formed as a part of an arc of a circle. 7. The arrangement according to claim 3, wherein at least one deviator comprises at least four grips and contact surfaces. 8. The arrangement according to claim 1, further comprising at least two deviators arranged to both intersect two conveyors. 9. The arrangement according to claim 1, further comprising at least one test tube carrier comprising a circular glide plate having a diameter and a thickness, a neck part on top of the glide plate having a diameter smaller than the glide plate and a length, a meshing plate having a diameter and a thickness and being placed at a distance from the glide plate. 10. The arrangement according to claim 9, wherein the glide plate comprises a RFID chip and the diameter of the neck part is smaller than the largest dimension of the chip. 11. The arrangement according to claim 10, wherein the carrier comprises a detection surface positioned between the neck part and the meshing plate, the detection surface having a diameter smaller than the diameter of the meshing plate and a thickness, the diameter of the detection surface being larger than the diameter of the neck part. 12. The arrangement according to claim 11, wherein the carrier comprises a detection surface positioned on the opposite side of the meshing plate in relation to the neck part, the detection surface having a diameter smaller than the diameter of the meshing plate and a thickness, the diameter being larger than the diameter of the neck part. 13. The arrangement according to claim 10, wherein the glide plate comprises a seat for a RFID chip to which the chip can be installed from the bottom surface of the glide plate opposite to the neck part so that the chip can be read from the bottom of the carrier formed by the bottom surface of the glide plate. 14. The arrangement according to claim 1, wherein the pushing surface follows the circle. 15. The arrangement according to claim 1, wherein the deviator is configured to rotate in either a clockwise or counter-clockwise direction. 16. The arrangement according to claim 1, wherein the pushing surfaces are located on opposing sides of the circle. 17. A method for sequencing and guiding travel of test tube carriers transported on at least one conveyor, comprising: receiving at least one test tube carrier on one rotatable deviator positioned to intersect the at least one conveyor by at least one grip formed on a horizontal deviator plate for receiving the test tube carrier,rotating the at least one test tube carrier by the deviator, andpushing said at least one test tube carrier from the deviator by at least one push plate positioned in proximity of the deviator plate and having two pushing surfaces formed as arcs that starts as tangents of a circle defined by tracks that a bottom of a recess of grip travels and then curve outwards from said circle. 18. The method according to claim 17, further comprising supporting said test tube carrier against tilting by at least one contact surface positioned vertically at a distance from the deviator plate and aligned with the grip, the contact surface being formed to contact said test tube carrier at a distance from the contact level of the grip and said carrier so that said carrier contacts the surface of said grip and said contact surface simultaneously when said carrier enters said deviator. 19. The method according to claim 18, further comprising transporting at least one test tube carrier comprising a circular glide plate having a diameter and a thickness, a neck part on top of the glide plate having a length and a diameter smaller than the glide plate, and a meshing plate having a diameter and a thickness and being placed at a distance from the glide plate, wherein the glide plate comprises a RFID chip and the diameter of the neck part is smaller than the largest dimension of the chip.
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이 특허에 인용된 특허 (14)
Pawloski James C. (Troy OH) Bliss Gary S. (Beavercreek OH) Siemon Ronald L. (Springfield OH), Carrier puck.
Hoppmann Kurt H. (Falls Church VA) Lin James G. (Springfield VA) Schmitt Werner H. (Falls Church VA), Rotary puck conveying, accumulating and qualifying mechanism.
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