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A three-dimensional multispectral imaging sensor and method for forming a three-dimensional multispectral imaging sensor are provided. The three-dimensional multispectral imaging sensor includes a monolithic structure having a plurality of layers. Each of the layers is formed from light detecting ma

A three-dimensional multispectral imaging sensor and method for forming a three-dimensional multispectral imaging sensor are provided. The three-dimensional multispectral imaging sensor includes a monolithic structure having a plurality of layers. Each of the layers is formed from light detecting materials for detecting light of respective different non-overlapping wavelengths and having respective different bandgaps.

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1. A three-dimensional multispectral imaging sensor, comprising: a monolithic structure having at least three layers, each of the layers being formed from light detecting materials for detecting light of respective different non-overlapping wavelengths and having respective different bandgaps,where

1. A three-dimensional multispectral imaging sensor, comprising: a monolithic structure having at least three layers, each of the layers being formed from light detecting materials for detecting light of respective different non-overlapping wavelengths and having respective different bandgaps,where the light detecting materials in each of the layers are staggered with respect to each other without any overlap of any portion of the light detecting materials there between. 2. The three-dimensional multispectral imaging sensor of claim 1, further comprising address lines, and wherein the light detecting materials in each of the layers form a respective light detector that is separately addressed by the address lines. 3. A three-dimensional multispectral imaging sensor, comprising: a first layer formed from a first light detecting material for detecting light having a wavelength within a first range;a second layer, on the first layer, formed from a second light detecting material for detecting light having a wavelength within a second range; anda third layer, on the second layer, formed from a third light detecting material for detecting light having a wavelength within a third range,wherein the first range, the second range, and the third range are different and are non-overlapping,where the light detecting materials in each of the layers are staggered with respect to each other without any overlap of any portion of the light detecting materials there between. 4. The three-dimensional multispectral imaging sensor of claim 3, where at least portions of the light detecting materials in each of the layers form a respective pixel. 5. The three-dimensional multispectral imaging sensor of claim 3, wherein a three-dimensional multispectral pixel of the three-dimensional multispectral imaging sensor is formed from at least a portion of the light detecting materials on each of the first, second, and third layers. 6. The three-dimensional multispectral imaging sensor of claim 3, wherein the first range corresponds to visible light, the second range corresponds to near infrared light, and the third range corresponds to mid-infrared light. 7. The three-dimensional multispectral imaging sensor of claim 3, wherein the first layer is formed on a substrate. 8. The three-dimensional multispectral imaging sensor of claim 3, wherein the substrate comprises at least one of glass, quartz, and Silicon. 9. The three-dimensional multispectral imaging sensor of claim 3, further comprising a respective optically transparent interlayer dielectric layer disposed between the first and second layers and between the second and third layers. 10. The three-dimensional multispectral imaging sensor of claim 3, further comprising address lines, and wherein the light detecting materials in each of the layers form a respective light detector that is separately addressed by the address lines. 11. The three-dimensional multispectral imaging sensor of claim 3, wherein the first light detecting material, the second light detecting material, and the third light detecting material having different bandgaps. 12. The three-dimensional multispectral imaging sensor of claim 11, wherein the first light detecting material has a bandgap within a first range, the second light detecting material has a bandgap within a second range, and the third light detecting material has a bandgap within a third range, wherein the ranges are non-overlapping with respect to each other. 13. The three-dimensional multispectral imaging sensor of claim 3, wherein the first light detecting material, the second light detecting material, and third light detecting material form a three-dimensional monolithic structure. 14. The three-dimensional multispectral imaging sensor of claim 13, wherein the first light detecting material is Cadmium Sulfide, the second light detecting material is Lead(II) Sulfide, and the third light detecting material is Lead(II) Selenide. 15. The three-dimensional multispectral imaging sensor of claim 3, wherein the first layer comprises a first plurality of discrete light detectors for detecting the light having the wavelength within the first range,the second layer comprises a second plurality of discrete light detectors for detecting the light having the wavelength within the second range, andthe third layer comprises a third plurality of discrete light detectors for detecting the light having the wavelength within the third range. 16. A method for forming a three-dimensional multispectral imaging sensor, comprising: forming a first layer from a first light detecting material for detecting light having a wavelength within a first range;forming a second layer, on the first layer, from a second light detecting material for detecting light having a wavelength within a second range; andforming a third layer, on the second layer, from a third light detecting material for detecting light having a wavelength within a third range,wherein the first range, the second range, and the third range are different and are non-overlapping,where the light detecting materials in each of the layers are staggered with respect to each other without any overlap of any portion of the light detecting materials there between. 17. The method of claim 16, where the light detecting materials in each layer form a respective pixel. 18. The method of claim 16, wherein the first layer, the second layer, and the third layer are formed as a three-dimensional monolithic structure. 19. The method of claim 16, wherein forming the first layer comprises forming a first plurality of discrete light detectors for detecting the light having the wavelength within the first range,forming the second layer comprises forming a second plurality of discrete light detectors for detecting the light having the wavelength within the second range, andforming the third layer comprises forming a third plurality of discrete light detectors for detecting the light having the wavelength within the third range.