초록 ▼

The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterized by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbit

The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterized by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (14), the optical microscope system further comprising a control system (32) connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronized control of the operation of the at least one scan head and the at least two optical measuring head.

대표청구항 ▼

1. Optical microscope system for the simultaneous measurement of at least two spatially distinct regions of interest, comprising at least two scan heads and at least two distinct optical measuring heads that can be simultaneously focused on spatially non-overlapping arbitrary regions of interest, ea

1. Optical microscope system for the simultaneous measurement of at least two spatially distinct regions of interest, comprising at least two scan heads and at least two distinct optical measuring heads that can be simultaneously focused on spatially non-overlapping arbitrary regions of interest, each optical measuring head being optically connectable with at least one scan head, the optical microscope system further comprising a control system connected to the at least one scan head and the optical measuring heads, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring heads characterised by comprising an optical multiplexer having at least two output ports that are optically coupled to the at least two optical measuring heads and having at least two input ports that are optically coupled with the at least two scan heads and having selective filters within the optical multiplexer capable of creating optical beam paths between any one of the at least two input ports and any one of the at least two output ports. 2. Optical microscope system for the simultaneous measurement of at least two spatially distinct regions of interest, comprising at least two distinct optical measuring heads that can be simultaneously focused on spatially non-overlapping arbitrary regions of interest, each optical measuring head being optically connectable with at least one scan head, the optical microscope system further comprising a control system connected to the at least one scan head and the optical measuring heads, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring heads, characterised by that the synchronisation provided by the control system has a jitter less than 500 μsec. 3. Optical microscope system according to claim 1, characterised by that the at least two distinct optical measuring heads can be simultaneously focused on spatially non-overlapping arbitrary regions of interest that are spaced apart from each other by at least 1 mm, preferably by at least 1 cm. 4. Optical microscope system according to claim 1, characterised by that the at least two distinct optical measuring heads have distinct optical axes. 5. Optical microscope system according to claim 1, characterised by comprising at least two scan heads, that are each optically connectable with at least one optical imaging means. 6. Optical microscope system according to claim 5, characterised by that each scan head is tuned for a different wavelength. 7. Optical microscope system according to claim 5, characterised by that each scan head is optically coupled to a light source, preferably laser source, or lamp capable of providing an optical beam having a wavelength that corresponds to wavelength to which the scan head is tuned. 8. Optical microscope system according to claim 5, characterised by that said at least two scan heads are tuned to same wavelength and are optically coupled with same light source. 9. Optical microscope system according to claim 1, characterised by that at least one optical measuring head of said at least two distinct optical measuring heads comprises a microscope objective. 10. Optical microscope system according to claim 1, characterised by that at least one optical measuring head of said at least two distinct optical measuring heads comprises a GRIN lens. 11. Optical microscope system according to claim 1, characterised by that at least one optical measuring head of said at least two distinct optical measuring heads comprises a lens designed as an optical adaptor for eye or other tissue stimulation and imaging. 12. Optical microscope system for the simultaneous measurement of at least two spatially distinct regions of interest, comprising at least two distinct optical measuring heads that can be simultaneously focused on spatially non-overlapping arbitrary regions of interest, each optical measuring head being optically connectable with at least one scan head, the optical microscope system further comprising a control system connected to the at least one scan head and the optical measuring heads, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring heads, characterised by having three optical measuring heads: a first optical measuring head which comprises a microscope objective, a second optical measuring head which comprises a GRIN lens, and a third optical measuring head which comprises an optical adaptor for eye stimulation and imaging. 13. Optical microscope system according to claim 1, characterised by having at least two scan heads of which at least one scan head is suitable for performing 3-dimensional scanning. 14. Optical microscope system according to claim 1, characterised by having at least one scan head that is capable of photoactivation. 15. Optical microscope system for the simultaneous measurement of at least two spatially distinct regions of interest, comprising at least two scan heads and at least two distinct optical measuring heads that can be simultaneously focused on spatially non-overlapping arbitrary regions of interest, each optical measuring head being optically connectable with at least one scan head, the optical microscope system further comprising a control system connected to the at least one scan head and the optical measuring heads, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring heads characterised by having at least two scan heads of which at least one scan head is suitable for performing 3-dimensional scanning.