Systems and methods are provided to measure a voltage across a two-state dipole. The systems and methods measure voltages across two measurement paths of operational circuitry at first and second sensor terminals. The operational circuitry is configured to decouple the first and second sensor termin
Systems and methods are provided to measure a voltage across a two-state dipole. The systems and methods measure voltages across two measurement paths of operational circuitry at first and second sensor terminals. The operational circuitry is configured to decouple the first and second sensor terminal based on a dipole voltage. The systems and methods further estimate the dipole voltage based on the voltages of the two measurement paths.
대표청구항▼
1. A voltage measurement system for a two-state dipole comprising: a reference terminal electrically coupled to a first dipole terminal of the two-state dipole and a measurement terminal electrically coupled to a second dipole terminal of the two-state dipole;an isolation circuit electrically couple
1. A voltage measurement system for a two-state dipole comprising: a reference terminal electrically coupled to a first dipole terminal of the two-state dipole and a measurement terminal electrically coupled to a second dipole terminal of the two-state dipole;an isolation circuit electrically coupled to the measurement terminal;a compensation circuit electrically coupled to the isolation circuit, wherein the isolation circuit is configured to decouple the measurement terminal from the compensation circuit based on a voltage at the measurement terminal; anda measurement circuit having three terminals, a first terminal is electrically coupled to the reference terminal, a second terminal is electrically coupled to the compensation circuit, a third terminal is electrically coupled to a node interposed between the compensation circuit and the isolation circuit, the measurement circuit configured to measure a first voltage at the second terminal and a second voltage at the third terminal, wherein the measurement circuit is configured to estimate a voltage of the two-state dipole based on the first and second voltages. 2. The voltage measurement system of claim 1, wherein the isolation circuit comprises one or more diodes, wherein a cathode of the one or more diodes is electrically coupled to the measurement terminal, and the compensation circuit comprises at least one diode, wherein a cathode of the at least one diode is electrically coupled to the isolation circuit; and a power supply electrically coupled to the compensation circuit. 3. The voltage measurement system of claim 2, wherein the measurement circuit is configured to estimate the voltage of the two-state dipole based on a number of the one or more diodes of the isolation circuit and the at least one diode of the compensation circuit. 4. The voltage measurement system of claim 3, wherein the measurement circuit is configured to define a ratio based on the number of the one or more diodes of the isolation circuit and the at least one diode of the compensation circuit, the estimation of the voltage of the two-state dipole is determined by subtracting from the first voltage a difference between the first and second voltages multiplied by the ratio plus one. 5. The voltage measurement system of claim 2, wherein the isolation circuit is electrically coupled to a resistor in series with the one or more diodes, the compensation circuit includes a resistor, wherein a relationship between a resistance of the resistor of the compensation circuit and a resistance of the resistor electrically coupled to the isolation circuit is based on a number of the one or more diodes of the isolation circuit and the at least one diode of the compensation circuit. 6. The voltage measurement system of claim 5, wherein temperature coefficient of the resistor electrically coupled to the isolation circuit and temperature coefficient of the resistor of the compensation circuit are the same within a non-zero predetermined coefficient threshold. 7. The voltage measurement system of claim 2, wherein thermal and electrical characteristics of the one or more diodes of the isolation circuit and the at least one diode of the compensation circuit are within a non-zero predetermined threshold with respect to each other. 8. The voltage measurement system of claim 2, wherein the power supply includes a current source. 9. The voltage measurement system of claim 1, wherein the compensation circuit includes a voltage clamping circuit that is configured to limit the second voltage at the third terminal of the measurement circuit. 10. The voltage measurement system of claim 9, wherein the voltage clamping circuit comprises a diode in parallel with the compensation circuit and having an anode coupled to the third terminal. 11. The voltage measurement system of claim 1, further comprising a voltage clamping circuit configured to limit a voltage at the node interposed between the compensation circuit and the isolation circuit and a current of the isolation circuit based on a second voltage at the third terminal with respect to the reference terminal. 12. The voltage measurement system of claim 11, wherein the voltage clamping circuit comprises a diode having an anode electrically coupled to the reference terminal and a cathode electrically coupled to the isolation circuit. 13. The voltage measurement system of claim 1, wherein a location of the isolation circuit and the compensation circuit are configured such that a first ambient temperature of the isolation circuit and a second ambient temperature of the compensation circuit are substantially similar. 14. The voltage measurement system of claim 1, wherein the two-state dipole includes an isolated gate bipolar transistor (IGBT), a power metal oxide semiconductor field-effect transistor, a diode, a thyristor, or a field coil of a field excited synchronous machine. 15. The voltage measurement system of claim 1, wherein the isolation circuit includes a first semiconductor switch and the compensation circuit includes a second semiconductor switch. 16. The voltage measurement system of claim 15, wherein the measurement circuit includes a control bus electrically coupled to the first and second semiconductor switches, the measurement circuit is configured to activate the first semiconductor switch or the second semiconductor switch based on electrical characteristics of the control bus. 17. A method for measuring a voltage of a two-state dipole, comprising: measuring voltages across two measurement paths of an operational circuitry electrically coupled to the two-state dipole using a measurement circuit at a first sensor terminal and a second sensor terminal of the measurement circuit, wherein the operational circuitry comprises a compensation circuit and an isolation circuit electrically coupled to the compensation circuit, and is configured to decouple the first sensor terminal and the second sensor terminal from the compensation circuit based on a voltage of the two-state dipole; andestimating a voltage of the two-state dipole based on the voltages across two measurement paths of the operational circuitry electrically coupled to the two-state dipole using the measurement circuit, wherein the measurement circuit is configured to estimate the voltage of the two-state dipole based on the isolation circuit and the compensation circuit. 18. The method of claim 17, further comprising injecting a measuring current to the two-state dipole via the operational circuitry, and wherein thermal and electrical characteristics of the operational circuitry is configured to be within a non-zero predetermined threshold. 19. The method of claim 18, wherein the estimating step is based on a number of one or more diodes of the isolation circuit and at least one diode of the compensation circuit. 20. A voltage measurement system for a two-state dipole, comprising: reference and measurement terminals electrically coupled to opposing terminals of a dipole;an isolation circuit electrically coupled to the measurement terminal, the isolation circuit having one or more diodes, wherein cathodes of the one or more diodes are electrically coupled to the measurement terminal;a compensation circuit electrically coupled to the isolation circuit, the compensation circuit having at least one diode, wherein a cathode of the at least one diode is electrically coupled to the isolation circuit, the isolation circuit being configured to decouple the measurement terminal from the compensation circuit based on a voltage at the measurement terminal;a power supply electrically coupled to the compensation circuit; anda measurement circuit having three terminals, a first terminal is electrically coupled to the reference terminal, a second terminal is electrically coupled to the power supply, a third terminal is electrically coupled to a node interposed between the compensation circuit and the isolation circuit, the measurement circuit configured to measure a first voltage at the second terminal and a second voltage at the third terminal, wherein the measurement circuit is configured to estimate a voltage of the two-state dipole based on the first voltage and the second voltage and a number of the one or more diodes of the isolation circuit and the at least one diode of the compensation circuit.
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이 특허에 인용된 특허 (1)
Jansen, Uwe, Temperature detection for a semiconductor component.
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