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|국가/구분||United States(US) Patent 등록|
|국제특허분류(IPC7판)||G01N-027/20 B64G-001/52 B64G-001/56 G07C-005/08 B64G-001/22|
|발명자 / 주소|
|출원인 / 주소|
|대리인 / 주소||
|인용정보||피인용 횟수 : 0 인용 특허 : 11|
Methods and systems may provide for a structure having a plurality of interconnected panels, wherein each panel has a plurality of detection layers separated from one another by one or more non-detection layers. The plurality of detection layers may form a grid of conductive traces. Additionally, a monitor may be coupled to each grid of conductive traces, wherein the monitor is configured to detect damage to the plurality of interconnected panels in response to an electrical property change with respect to one or more of the conductive traces. In one exa...
1. A method comprising: transmitting a test signal to a plurality of interconnected panels, wherein each panel has a plurality of detection layers that form a grid of conductive traces and wherein each detection layer includes one or more known defect traces, and wherein the panel has a trace continuity signature that is defined by the known defect traces of the detection layers in the panel; andidentifying one or more damage zones in the plurality of interconnected panels based on a response of the grid of conductive traces to the test signal and trace ...