Light detection and ranging (LIDAR) scanning systems and methods
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01S-017/10
G01S-017/42
G02B-026/10
G01S-007/481
G01S-007/484
G01S-017/89
출원번호
US-0962837
(2015-12-08)
등록번호
US-10175344
(2019-01-08)
발명자
/ 주소
Jungwirth, Douglas R.
출원인 / 주소
The Boeing Company
대리인 / 주소
Butscher, Joseph M.
인용정보
피인용 횟수 :
0인용 특허 :
3
초록▼
A scanning system and method scan an area of interest. The scanning system may include a first scanner that deflects a light signal. The light signal that is deflected by the first scanner is output as an initially-deflected light signal. A second scanner receives the initially-deflected light signa
A scanning system and method scan an area of interest. The scanning system may include a first scanner that deflects a light signal. The light signal that is deflected by the first scanner is output as an initially-deflected light signal. A second scanner receives the initially-deflected light signal and deflects the initially-deflected light signal. The initially-deflected signal that is deflected by the second scanner is output as a subsequently-deflected light signal.
대표청구항▼
1. A scanning system configured to scan an area of interest, wherein the scanning system comprises: a first scanner configured to deflect a light signal, wherein the light signal that is deflected by the first scanner is output as an initially-deflected light signal;a second scanner configured to re
1. A scanning system configured to scan an area of interest, wherein the scanning system comprises: a first scanner configured to deflect a light signal, wherein the light signal that is deflected by the first scanner is output as an initially-deflected light signal;a second scanner configured to receive the initially-deflected light signal and deflect the initially-deflected light signal, wherein the initially-deflected signal that is deflected by the second scanner is output as a subsequently-deflected light signal; anda deflection mirror disposed between the first and second scanners, wherein the deflection mirror comprises an aperture through which the initially-deflected light signal passes. 2. The scanning system of claim 1, wherein the first scanner and the second scanner cooperate to move the subsequently-deflected light signal over a combined scan path. 3. The scanning system of claim 1, wherein the first scanner is configured to deflect the light signal at a first rate, and wherein the second scanner is configured to deflect the initially-deflected light signal at a second rate that differs from the first rate. 4. The scanning system of claim 3, wherein the first rate is faster than the second rate. 5. The scanning system of claim 1, wherein the first scanner is configured to deflect the light signal at a first scan angle, and wherein the second scanner is configured to deflect the initially-deflected light signal at a second scan angle that differs from the first scan angle. 6. The scanning system of claim 5, wherein the second scan angle is greater than the first scan angle. 7. The scanning system of claim 1, wherein the first scanner is a one-dimensional scanner, and wherein the second scanner is a two-dimensional scanner. 8. The scanning system of claim 1, wherein the first scanner is one of an acousto-optic scanner, an electro-optic scanner, a piezo electric scanner, or a high speed mechanical scanner. 9. The scanning system of claim 1, wherein the second scanner comprises a mirror configured to be actuated with respect to two different axes. 10. The scanning system of claim 1, further comprising a light source configured to emit the light signal into the first scanner. 11. The scanning system of claim 1, further comprising a detector configured to receive reflected light signals from an object within the area of interest. 12. The scanning system of claim 11, further comprising at least one lens configured to focus the reflected light signals into the detector. 13. A scanning method that is configured to scan an area of interest, wherein the scanning method comprises: receiving a light signal at a first scanner;initially deflecting the light signal with the first scanner;outputting the light signal that is deflected by the first scanner as an initially-deflected light signal;passing the initially-deflected light signal through an aperture of a deflection mirror that is disposed between the first scanner and a second scanner;receiving the initially-deflected light signal at the second scanner;deflecting the initially-deflected light signal with the second scanner; andoutputting the initially-deflected light signal that is deflected by the second scanner as a subsequently-deflected light signal. 14. The scanning method of claim 13, further comprising moving the subsequently-deflected light signal over a combined scan path. 15. The scanning method of claim 13, wherein the initially deflecting the light signal comprises initially deflecting the light signal at a first rate, and wherein the deflecting the initially-deflected light signal comprises deflecting the initially-deflected light signal at a second rate that differs from the first rate. 16. The scanning method of claim 15, wherein the first rate is faster than the second rate. 17. The scanning method of claim 13, wherein the initially deflecting the light signal comprises initially deflecting the light signal at a first scan angle, and wherein the deflecting the initially-deflected light signal comprises deflecting the initially-deflected light signal at a second scan angle that differs from the first scan angle. 18. The scanning method of claim 17, wherein the second scan angle is greater than the first scan angle. 19. A Light Detection and Ranging (LIDAR) scanning system configured to scan an area of interest, wherein the LIDAR scanning system comprises: a light source configured to emit a light signal;a first scanner configured to receive the light signal from the light source and deflect a light signal over a first scan angle at a first rate, wherein the light signal that is deflected by the first scanner is output as an initially-deflected light signal;a second scanner configured to receive the initially-deflected light signal and deflect the initially-deflected light signal over a second scan angle that is greater than the first scan angle at a second rate that is slower than the first rate, wherein the initially-deflected signal that is deflected by the second scanner is output as a subsequently-deflected light signal, wherein the second scanner comprises a mirror that is configured to be actuated with respect to two different axes, wherein the first scanner and the second scanner cooperate to move the subsequently-deflected light signal over a combined scan path;a deflection mirror disposed between the first and second scanners, wherein the deflection mirror comprises an aperture through which the initially-deflected light signal passes;at least one lens configured to focus reflected light signals from an object within the area of interest that are deflected into the at least one lens by the deflection mirror;a detector configured to receive the reflected light signals focused by the at least one lens; anda control unit configured to form one or more images based on the reflected light signals received by the detector.
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이 특허에 인용된 특허 (3)
Diehl Christian (Munich DEX) Kirsche Horst (Munich DEX), Laser scanning device for fastest possible deflection or sweep velocities.
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