최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0916473 (2018-03-09) |
등록번호 | US-10185860 (2019-01-22) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 0 인용 특허 : 338 |
A method for evaluating an output pattern printed on a medium is described. A reference pattern is stored. The output pattern is printed on the medium based correspondingly on the stored reference pattern. A scan based instance of the output pattern is rendered, which has a set of features at least
A method for evaluating an output pattern printed on a medium is described. A reference pattern is stored. The output pattern is printed on the medium based correspondingly on the stored reference pattern. A scan based instance of the output pattern is rendered, which has a set of features at least corresponding to the printed output pattern and zero or more features additional thereto. A difference image, having the zero or more features of the rendered scan instance, is computed based on a comparison of the rendered scan instance to the stored reference pattern. Upon the zero or more features including at least one feature, the computed difference image is evaluated in relation to a proximity of at least one feature to locations pixels of the reference pattern.
1. An evaluation method, comprising: receiving a reference pattern corresponding to an output pattern over a network, wherein the output pattern is printed on a medium based on the received reference pattern;rendering a scan based instance of the output pattern, wherein the rendered scan based insta
1. An evaluation method, comprising: receiving a reference pattern corresponding to an output pattern over a network, wherein the output pattern is printed on a medium based on the received reference pattern;rendering a scan based instance of the output pattern, wherein the rendered scan based instance comprises: a set of features at least corresponding to the printed output pattern; andzero or more defect features in addition to the set of features at least corresponding to the printed output pattern, the zero or more defect features comprising zero or more printed defect features;computing a difference image based on a comparison of the rendered scan based instance to the received reference pattern, the computed difference image comprising the zero or more defect features of the rendered scan based instance; andevaluating the computed difference image if the zero or more printed defect features comprise at least one printed defect feature in proximity to at least one feature of one or more picture elements of the received reference pattern. 2. The evaluation method of claim 1, comprising: determining, based on the evaluation step, that the proximity comprises an unacceptably small separation between a position of one or more pixels of the at least one of the zero or more defect features to the location of the one or more received reference pattern pixels; andpresenting a warning, based on the determining step, in relation to the unacceptably small separation. 3. The evaluation method of claim 2, wherein the unacceptably small separation relates to a spatial distance between one or more pixels of the at least one of the zero or more defect features and a position of at least one of the one or more pixels of the received reference pattern. 4. The evaluation method of claim 2, comprising the step of adjusting a subsequent printing of the output pattern based on the determining step, wherein the at least one of the zero or more defect features is eliminated from an output pattern of the subsequent printing. 5. The evaluation method of claim 1, comprising the step of determining that the proximity of the at least one of the zero or more defect features is acceptable in relation to the position of each of a plurality of pixels of the received reference pattern. 6. The evaluation method of claim 5, wherein the determining that the proximity is acceptable relates to an acceptably large separation between each pixel of the at least one of the zero or more defect features to the location of each of the one or more received reference pattern pixels. 7. The evaluation method of claim 5, comprising, upon the determining that the proximity is acceptable in relation to the position of the received reference pattern, the steps of indicating that the at least one of the zero or more defect features is acceptable. 8. The evaluation method of claim 1, wherein the step of rendering the scan based instance comprises the step of scanning the output pattern printed on the medium, the scan based instance rendered based on the scanning step. 9. The evaluation method of claim 1, comprising generating a print quality report comprising whether the printed output pattern complies with a specification, a manner in which the printed output pattern differs from the received reference pattern, steps to correct deviations, statistics related to acceptable and unacceptable defects, and/or a total number of defects. 10. A system, comprising: a scanner operable for receiving a reference pattern corresponding to an output pattern over a network and rendering a scan based instance of the output pattern, wherein the rendered scan based instance comprises: a set of features at least corresponding to the printed output pattern; andzero or more defect features in addition to the set of features at least corresponding to the printed output pattern, the zero or more defect features comprising zero or more printed defect features; andone or more image processors operable for: computing a difference image based on a comparison of the rendered scan based instance to the received reference pattern, the computed difference image comprising the zero or more defect features of the rendered scan based instance; andevaluating the computed difference image if the zero or more printed defect features comprise at least one printed defect feature in proximity to at least one feature of one or more picture elements of the received reference pattern. 11. The system of claim 10, wherein the computation of the difference image by the one or more image processors comprises performing an ‘exclusive OR’ (XOR) logical operation over the pixels of the rendered scan based instance of the output pattern, relative to each corresponding pixel of the received reference pattern. 12. The system of claim 10, wherein the evaluation of the computed difference image by the one or more image processors comprises: determining, based on the evaluation of the computed difference image, that the proximity comprises an unacceptably small separation between a position of one or more pixels of the at least one of the zero or more defect features to the location of the one or more received reference pattern pixels; andpresenting a warning, based on the determining step, in relation to the unacceptably small separation. 13. The system of claim 12, wherein the unacceptably small separation relates to a spatial distance between the one or more pixels of the at least one of the zero or more defect features and a position of at least one of the one or more pixels of the received reference pattern. 14. The system of claim 10, comprising a printer component operable for printing the output pattern on the medium based on the received reference pattern. 15. The system of claim 14, wherein the printer component is further operable for adjusting a subsequent printing of the output pattern based on the determining step, wherein the at least one of the zero or more defect features is eliminated from an output pattern of the subsequent printing. 16. The system of claim 14, wherein the received reference pattern comprises a graphic model, wherein the printer component is further operable for printing the output pattern wherein the printed output pattern corresponds to the received reference pattern based on the graphic model. 17. The system of claim 10, comprising a scanner component operable for scanning the output pattern printed on the medium and for the rendering of the scan based instance. 18. The system of claim 10, wherein the system generates a print quality report comprising whether the printed output pattern complies with a specification, a manner in which the printed output pattern differs from the received reference pattern, steps to correct deviations, statistics related to acceptable and unacceptable defects, and/or a total number of defects. 19. A method, comprising: receiving a reference pattern corresponding to an output pattern printed on a medium;scanning the printed output pattern to determine (i) a set of features of the printed output pattern and (ii) zero or more printed defect features of the printed output pattern;computing a difference image by comparing the scanned, printed output pattern to the received reference pattern, the computed difference image comprising the zero or more printed defect features;evaluating the computed difference image if the zero or more printed defect features comprise at least one printed defect feature in proximity to at least one feature of one or more picture elements of the received reference pattern; anddetermining, based on the evaluation step, that the proximity of at least one printed defect feature to at least one feature of one or more picture elements of the received reference pattern comprises an unacceptably small separation between a position of one or more pixels of the at least one of the zero or more printed defect features to the location of the one or more received reference pattern pixels. 20. The method of claim 19, comprising generating a print quality report comprising whether the printed output pattern complies with a specification, a manner in which the printed output pattern differs from the received reference pattern, steps to correct deviations, statistics related to acceptable and unacceptable defects, and/or a total number of defects.
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