Scanning projectors and image capture modules for 3D mapping
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H04N-013/271
G01B-011/25
G06T-017/00
H04N-013/365
H04N-013/254
H04N-013/398
H04N-005/33
H04N-013/363
출원번호
US-0588719
(2017-05-08)
등록번호
US-10218963
(2019-02-26)
발명자
/ 주소
Shpunt, Alexander
Pesach, Benny
Akerman, Ronen
출원인 / 주소
APPLE INC.
대리인 / 주소
Kligler & Associates
인용정보
피인용 횟수 :
0인용 특허 :
4
초록▼
Apparatus for mapping includes a radiation source, which is configured to emit a beam of radiation, and a detector and optics, which define a sensing area of the detector. A scanning mirror assembly is configured to receive and scan the emitted beam over a selected angular range within a region of i
Apparatus for mapping includes a radiation source, which is configured to emit a beam of radiation, and a detector and optics, which define a sensing area of the detector. A scanning mirror assembly is configured to receive and scan the emitted beam over a selected angular range within a region of interest while scanning the sensing area over the selected angular range in synchronization with the scanned beam from the radiation source. A processor is configured to process signals output by the detector in order to construct a three-dimensional (3D) map of an object in the region of interest.
대표청구항▼
1. Apparatus for mapping, comprising: a radiation source, which is configured to emit a beam of radiation;a detector and optics, which define a sensing area of the detector;a scanning mirror assembly, which is configured to receive and scan the emitted beam over a selected angular range within a reg
1. Apparatus for mapping, comprising: a radiation source, which is configured to emit a beam of radiation;a detector and optics, which define a sensing area of the detector;a scanning mirror assembly, which is configured to receive and scan the emitted beam over a selected angular range within a region of interest while scanning the sensing area over the selected angular range in synchronization with the scanned beam from the radiation source; anda processor, which is configured to process signals output by the detector in order to construct a three-dimensional (3D) map of an object in the region of interest. 2. The apparatus according to claim 1, wherein the processor is configured to control the scanning mirror assembly dynamically so as to modify a scan area of the apparatus. 3. The apparatus according to claim 2, wherein the processor is configured to identify the object in a first 3D map of the region of interest, and to adjust a scan range of the scanning mirror assembly based on the first 3D map so as to map the identified object with high resolution in a second 3D map. 4. The apparatus according to claim 1, and comprising at least one beam sensor, which is positioned at a selected angle within the angular range so as to receive the scanned beam periodically and verify thereby that the scanning mirror assembly is operating. 5. The apparatus according to claim 4, wherein the processor is configured to inhibit emission of the beam from the radiation source when the beam sensor fails to receive the scanned beam periodically. 6. The apparatus according to claim 1, wherein the processor is configured to process the signals in order to measure a time of flight of light pulses to and from the object. 7. The apparatus according to claim 1, wherein the radiation source comprises: a first radiation source, which emits an infrared beam, which is received by the detector in order to output the signals; anda second radiation source, which emits a visible light beam, which is modulated to project a visible image onto the region of interest,wherein the scanning mirror assembly is configured to project both the infrared beam and the visible light beam onto the region of interest simultaneously. 8. A method for mapping, comprising: using a scanning mirror assembly, scanning a beam of radiation over a selected angular range within a region of interest while scanning a sensing area of a detector, using the scanning mirror assembly, over the selected angular range in synchronization with the scanned beam; andprocessing signals output by the detector in order to construct a three-dimensional (3D) map of an object in the region of interest. 9. The method according to claim 8, wherein scanning the beam of radiation and scanning the sensing area comprise controlling the scanning mirror assembly dynamically so as to modify a scan area of the 3D map. 10. The method according to claim 9, and comprising identifying the object in a first 3D map of the region of interest, and adjusting a scan range of the scanning mirror assembly based on the first 3D map so as to map the identified object with high resolution in a second 3D map. 11. The method according to claim 8, and comprising positioning at least one beam sensor at a selected angle within the angular range so as to receive the scanned beam periodically and verify thereby that the scanning mirror assembly is operating. 12. The method according to claim 11, and comprising inhibiting emission of the beam when the beam sensor fails to receive the scanned beam periodically. 13. The method according to claim 8, wherein processing the signals comprises measuring a time of flight of light pulses to and from the object. 14. The method according to claim 8, wherein scanning the beam comprises scanning an infrared beam, which is received by the detector in order to output the signals, and wherein the method comprises scanning a visible light beam together with the infrared beam, while modulating the visible light beam so as to project a visible image onto the region of interest. 15. The method according to claim 14, wherein modulating the visible light beam comprises generating the visible image responsively to the 3D map. 16. Apparatus for mapping, comprising: an illumination module, comprising: a first radiation source, which is configured to emit a beam of infrared radiation;a second radiation source, which is configured to emit a visible light beam; anda scanner, which is configured to receive and scan both the infrared beam and the visible light beam simultaneously over a selected angular range onto a region of interest;a detector, which is configured to receive the infrared radiation that is reflected from an object in the region of interest; anda processor, which is configured to process signals output by the detector in order to construct a three-dimensional (3D) map of the object, while modulating the visible light beam so as to project a visible image onto the region of interest. 17. The apparatus according to claim 16, wherein the second radiation source is controlled so as to project the visible image onto the object responsively to the 3D map. 18. The apparatus according to claim 17, wherein the visible image is tailored to a shape of the object. 19. The apparatus according to claim 16, wherein the illumination module comprises a dichroic beam combiner, which aligns the infrared and visible light beams. 20. The apparatus according to claim 16, wherein the processor is configured to process the signals in order to measure a time of flight of light pulses to and from the object.
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이 특허에 인용된 특허 (4)
Joseph, John, Multibeam arrays of optoelectronic devices for high frequency operation.
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