A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of
A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure.
대표청구항▼
1. A system for measuring surface topography of a three-dimensional structure, the system comprising: an illumination unit configured to output an array of light beams, each light beam comprising a plurality of wavelengths;an optical assembly configured to receive the array of light beams from the i
1. A system for measuring surface topography of a three-dimensional structure, the system comprising: an illumination unit configured to output an array of light beams, each light beam comprising a plurality of wavelengths;an optical assembly configured to receive the array of light beams from the illumination unit and to focus the plurality of wavelengths of each light beam to a plurality of fixed focal lengths so as to illuminate the three-dimensional structure over a field of view; anda detector configured to measure a characteristic of light reflected from the three-dimensional structure for each of a plurality of locations in the field of view,wherein the array of light beams form spots on the three-dimensional structure over the field of view, and wherein a ratio of pitch to spot size for the spots is configured to inhibit cross-talk between the spots. 2. The system of claim 1, wherein the characteristic comprises an intensity of the light reflected from the three-dimensional structure. 3. The system of claim 2, wherein the detector comprises a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the three-dimensional structure over the field of view. 4. The system of claim 3, wherein each sensor element of the plurality of sensor elements is configured to measure the intensity of at least one wavelength of the light reflected from the three-dimensional structure. 5. The system of claim 1, wherein the plurality of wavelengths comprises wavelengths from 400 nm to 800 nm. 6. The system of claim 1, wherein the plurality of wavelengths comprises at least three spectral bands, and wherein the at least three spectral bands comprise overlapping wavelengths of light. 7. The system of claim 1, wherein the plurality of wavelengths comprises a continuous spectrum of wavelengths. 8. The system of claim 1, wherein the optical assembly is configured to focus the light beams to the plurality of focal lengths using at least one optical component with longitudinal chromatic aberration. 9. The system of claim 1, wherein the plurality of focal lengths covers a depth of at least 20 mm. 10. The system of claim 1, wherein the optical assembly is configured to focus the plurality of wavelengths to the plurality of focal lengths to a depth within a range from 10 mm to 30 mm relative to the optical assembly without relative movement of components of the optical assembly and components of the illumination unit. 11. A system for measuring surface topography of a three-dimensional structure, the system comprising: an illumination unit configured to output an array of light beams, each light beam comprising a plurality of wavelengths;an optical assembly configured to receive the array of light beams from the illumination unit and to focus the plurality of wavelengths of each light beam to a plurality of fixed focal lengths so as to illuminate the three-dimensional structure over a field of view; anda detector configured to measure a characteristic of light reflected from the three-dimensional structure for each of a plurality of locations in the field of view, wherein the characteristic comprises an intensity of the light reflected from the three-dimensional structure, the detector comprises a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the three-dimensional structure over the field of view, each sensor element of the plurality of sensor elements is configured to measure the intensity of at least one wavelength of the light reflected from the three-dimensional structure, and the plurality of sensor elements comprises a plurality of red sensor elements, a plurality of green sensor elements, and a plurality of blue sensor elements, each of the plurality of red sensor elements being configured to measure the intensity of a red light wavelength, each of the plurality of green sensor elements being configured to measure the intensity of a green light wavelength, and each of the plurality of blue sensor elements being configured to measure the intensity of a blue light wavelength. 12. The system of claim 11, wherein the plurality of sensor elements are arranged in a Bayer pattern or in a plurality of layers. 13. A method for measuring surface topography of a three-dimensional structure, the method comprising: generating an array of light beams, each light beam comprising a plurality of wavelengths;projecting each light beam onto the three-dimensional structure over a field of view, the plurality of wavelengths of each light beam being projected at a respective plurality of fixed focal lengths relative to an optical assembly;measuring a characteristic of light reflected from the three-dimensional structure for each of a plurality of locations; andoutputting the measured characteristic of light,wherein the array of light beams forms spots on the structure over the field of view, and wherein a ratio of pitch to spot size for the spots is selected to inhibit cross-talk between the spots. 14. The method of claim 13, wherein the characteristic comprises an intensity of the light reflected from the three-dimensional structure. 15. The method of claim 14, wherein the intensity of the light reflected from the three-dimensional structure is measured using a detector comprising a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the three-dimensional structure over the field of view. 16. The method of claim 15, wherein each sensor element of the plurality of sensor elements is configured to measure the intensity of at least one wavelength of the light reflected from the three-dimensional structure. 17. The method of claim 13, wherein the plurality of wavelengths comprises wavelengths from 400 nm to 800 nm. 18. The method of claim 13, wherein the plurality of wavelengths comprises at least three spectral bands, and wherein the at least three spectral bands comprise overlapping wavelengths of light. 19. The method of claim 13, wherein the plurality of wavelengths comprises a continuous spectrum of wavelengths. 20. The method of claim 13, wherein the light beams are focused to the plurality of focal lengths using at least one optical component with longitudinal chromatic aberration. 21. The method of claim 13, wherein the plurality of focal lengths covers a depth of at least 20 mm. 22. The method of claim 13, further comprising focusing of the plurality of wavelengths to the plurality of focal lengths to a depth within a range from 10 mm to 30 mm is performed without relative movement of components of an optical assembly and components of an illumination unit. 23. A method for measuring surface topography of a three-dimensional structure, the method comprising: generating an array of light beams, each light beam comprising a plurality of wavelengths;projecting each light beam onto the three-dimensional structure over a field of view, the plurality of wavelengths of each light beam being projected at a respective plurality of fixed focal lengths relative to an optical assembly;measuring a characteristic of light reflected from the three-dimensional structure for each of a plurality of locations, wherein the characteristic comprises an intensity of the light reflected from the three-dimensional structure, wherein the intensity of the light reflected from the three-dimensional structure is measured using a detector comprising a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the three-dimensional structure over the field of view, each sensor element of the plurality of sensor elements is configured to measure the intensity of at least one wavelength of the light reflected from the three-dimensional structure and wherein the plurality of sensor elements comprises a plurality of red sensor elements, a plurality of green sensor elements, and a plurality of blue sensor elements, each of the plurality of red sensor elements being configured to measure the intensity of a red light wavelength, each of the plurality of green sensor elements being configured to measure the intensity of a green light wavelength, and each of the plurality of blue sensor elements being configured to measure the intensity of a blue light wavelength; andoutputting the measured characteristic of light. 24. The method of claim 23, wherein the plurality of sensor elements are arranged in a Bayer pattern or in a plurality of layers.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (196)
Mitsuhiro Ishihara JP, Active confocal image acquisition apparatus and method of three-dimensional measurement using same.
Loran William (100 Thorndale Dr. ; #356 San Rafael CA 94903) Robinson Merritt A. (475 Fawn Dr. San Anselmo CA 94960), Apparatus for indirect dental machining.
Duret Francois (rue Paul Claudel Le Grand Lemps FRX) Duret nee Michallet Elisabeth (rue Paul Claudel Le Grand Lemps FRX) Thermoz Christian (2 ; place Victor Hugo Grenoble FRX), Apparatus for taking odontological or medical impressions.
Erdman Arthur G. (New Brighton MN) Rekow Elizabeth D. (Fridley MN) Riley Donald R. (Edina MN) Klamecki Barney (Minneapolis MN) Zhu Yang (St. Paul MN) Ahn Jeong-Ho (Seoul KRX), Automated high-precision fabrication of objects of complex and unique geometry.
Erdman Arthur G. (New Brighton MN) Rekow Elizabeth D. (Fridley MN) Riley Donald R. (Edina MN) Klamecki Barney E. (Minneapolis MN) Zhu Yang (St. Paul MN) Ahn Jeong-Ho (Seoul KRX), Automated high-precision fabrication of objects of complex and unique geometry.
Andreiko Craig A. (Alta Loma CA) Payne Mark A. (Whittier CA), Bracket placement jig assembly and method of placing orthodontic brackets on teeth therewith.
Marinaccio Paul J. (East Orleans MA) Nappi Bruce (Reading MA) Captain Khushroo M. (Cambridge MA) Lane Alan J. (Lexington MA), Contact digitizer, particularly for dental applications.
Acevedo Raul (Obi No. 144 ; Rio Piedras Heights Rio Piedras PR 00926), Dental articulator, new bite registration guide, and diagnostic procedure associated with stereodont orthodontic study m.
Phan, Loc X.; Chishti, Muhammad; Miller, Ross J.; Van Den Berg, H. Robert; Kuo, Eric; Ahn, Jae Hyun, Embedded features and methods of a dental appliance.
Andreiko Craig A. (Alta Loma CA) Payne Mark A. (Whittier CA), Method and apparatus for designing and forming a custom orthodontic appliance and for the straightening of teeth therewi.
Avila Ricardo Scott ; Avila Lisa Sobierajski ; Geiser Brian Peter ; Hatfield William Thomas ; Tillman Todd Michael, Method and apparatus for displaying 3D ultrasound data using three modes of operation.
Strasnick Steven L. (Mountain View CA) Tesler Joel D. (Cupertino CA), Method and apparatus for displaying data within a three-dimensional information landscape.
Riley Donald R. (Edina MN) Zhu Yang (St. Paul MN) Rekow Elizabeth D. (Fridley MN) Ahn Jeong-Ho (Lauderdale MN) Klamecki Barney (Minneapolis MN) Erdman Arthur G. (New brighton MN), Method and apparatus for manipulating computer-based representations of objects of complex and unique geometry.
Riley Donald R. (Edina MN) Zhu Yang (St. Paul MN) Rekow Elizabeth D. (Fridley MN) Ahn Jeong-Ho (Seoul MN KRX) Klamecki Barney (Minneapolis MN) Erdmann Arthur G. (New Brighton MN), Method and apparatus for manipulating computer-based representations of objects of complex and unique geometry.
Rekow Elizabeth D. (Fridley MN) Riley Donald R. (Edina MN) Erdman Arthur G. (New Brighton MN) Klamecki Barney (Minneapolis MN) Zhu Yang (St. Paul MN) Ahn Jeong-Ho (Seoul KRX), Method and apparatus for scanning and recording of coordinates describing three dimensional objects of complex and uniqu.
Moermann Werner H. (Hofstrasse 104 CH-8044 Zuerich CHX) Brandestini Marco (Gartenstrasse 10 CH-8702 Zollikon CHX), Method and apparatus for the fabrication of custom-shaped implants.
Brandestini Marco (Gartenstrasse 10 8702 Zollikon CHX) Moermann Werner H. (Zweiackerstrasse 57 8053 Zurich CHX), Method and apparatus for the three-dimensional registration and display of prepared teeth.
Maurice M. Ernst IL, Method and system for real time intra-orally acquiring and registering three-dimensional measurements and images of intra-oral objects and features.
Heitlinger Paul (Chemnitzer Strasse 15 6054 Rodgau 3 DEX) Rodder Fritz (Schulstrasse 1 6273 Waldems/Esch DEX), Method for the manufacture of dentures and device for carrying out the method.
Kuroda Takayuki (Yokohama JPX) Motohashi Nobuyoshi (Musashino JPX) Muramoto Mutsushi (Osaka JPX), Method of and apparatus for making a dental set-up model.
Duret Francois (Rue Paul Claudel Le Grand Lemps (Isere) FRX) Termoz Christian (2 ; Place Victor Hugo Grenoble (Isere) FRX), Method of and apparatus for making a prosthesis, especially a dental prosthesis.
Walker Peter S. (10 ; The Covert Northwood N.W. London MA GB2) Ewald Frederick C. (4 Black Oak Rd. Weston MA 02193), Method of designing and manufacturing a human joint prosthesis.
Duret Francois (Rue Paul Claudel Le Grand Lemps (Isere) FRX) Termoz Christian (2 ; Place Victor Hugo Grenoble (Isere) FRX), Method of making a prosthesis, especially a dental prosthesis.
Dehoff Barry D. (York PA) Grim Carlton L. (Red Lion PA) Liu Andrew T. C. (York PA) McGraw Jeffrey E. (Boiling Springs PA), Method of making a tooth mold.
van Nifterick Willem Frederick,NLX ; Quaak Johannis Adriaan,NLX, Method of manufacturing a prosthesis to be fixed to implants in the jawbone of a patient, and a system for manufacturing.
Derndinger Eberhard (Aalen DEX) Grosskopf Rudolf E. (Konigsbronn DEX) Knupfer Klaus (Essingen DEX), Optical device with an illuminating grid and detector grid arranged confocally to an object.
Abbatte Gerard P. (Buffalo NY) Cunat John J. (Snyder NY), Orthodontic anchor appliance and method for teeth positioning and method of constructing the appliance.
Coles Donna C. (c/o Dens Company ; 174 W. Live Oak Arcadia CA 91006) Honstein Jerry P. (6543 W. Circulo Dali Anaheim Hills CA 92807), Orthodontic appliance.
Andreiko Craig A. (Alta Loma CA) Payne Mark A. (Whittier CA), Orthodontic appliance and group standardized brackets therefor and methods of making, assembling and using appliance to.
Spencer William (4204 Windy Oaks Rd. Louisville KY 40241) Haskell Bruce (1628 Sutherland Dr. Louisville KY 40205), Orthodontic appliance for reducing tooth rotation.
Breads Peter R. (Grand Island NY) Abbatte Gerard P. (Buffalo NY) Warunek Stephen P. (West Seneca NY), Orthodontic finishing positioner and method of construction.
Breads Peter R. (Grand Island NY) Abbatte Gerard P. (Buffalo NY) Warunek Stephen P. (West Seneca NY), Orthodontic finishing positioner and method of construction.
Breads Peter R. (Grand Island NY) Abbatte Gerard P. (Buffalo NY) Warunek Stephen P. (West Seneca NY), Orthodontic finishing positioner and method of construction.
Abbatte Gerard P. (Buffalo NY) Breads Peter R. (Grand Island NY) Warunek Stephen P. (West Seneca NY) Willison Brian D. (Buffalo NY), Orthodontic positioner and methods of making and using same.
Martz Martin G. (Park Central Office Building ; Suite 301 ; 215 South Monarch St. Aspen CO 81611), Orthodonture appliance which may be manually installed and removed by the patient.
Andersson Matts (Hammarstroms Tappa 2 S-443 39 Lerum SEX) Tornquist Anders (Molndalsvagen 7 S-142 63 Goteborg SEX), Process and device for production of three-dimensional dental bodies.
Yoon Douglas C. ; Wilensky Gregg D. ; Neuhaus Joseph A. ; Manukian Narbik ; Gakenheimer David C., Quantitative dental caries detection system and method.
Curry, Douglas N.; Stowe, Timothy David; Maeda, Patrick Y., Single-pass imaging apparatus with image data scrolling for improved resolution contrast and exposure extent.
Watson Sherman L. (12716 NE. 7th Pl. Vancouver WA 98684) Jones Jimmie J. (4416 SE. 34th St. Portland OR 97202) Moore Richard W. (2103 NW. 272nd Ave. Camas WA 98607), Soft resilient interocclusal dental appliance, method of forming same and composition for same.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.