초록

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Abstract ▼ AI-Helper

Generating diagnostic test patterns for combinational circuits remain to be a very difficult problem. For example, ISCAS85 c7552 benchmark circuit has 100 million fault pairs, Thus, we need more sophisticated algorithm to get more information. A new diagnostic algorithm for test pattern generation i...

Generating diagnostic test patterns for combinational circuits remain to be a very difficult problem. For example, ISCAS85 c7552 benchmark circuit has 100 million fault pairs, Thus, we need more sophisticated algorithm to get more information. A new diagnostic algorithm for test pattern generation is suggested and implemented in this paper. DIATEST algorithm based on PODEM is also implemented for comparison to the new algorithm. These two algorithms have been applied to ISCAS85 benchmark circuits. Experimental results show that (1) both algorithms achieve fault pair coverage over 99%, (2) total test length of the new algorithm is much shorter than that of DIATEST, and (3) the new algorithm gives much more information used for making diagnostic dictionary, diagnostic decision tree or diagnostic test system despite DIATEST is faster than the new algorithm.