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NTIS 바로가기Applied microscopy, v.44 no.3, 2014년, pp.100 - 104
Kwon, Owoong (School of Advanced Materials Science and Engineering, Sungkyunkwan University) , Kim, Yunseok (School of Advanced Materials Science and Engineering, Sungkyunkwan University)
As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including e...
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