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NTIS 바로가기제어·로봇·시스템학회 논문지 = Journal of institute of control, robotics and systems, v.21 no.12, 2015년, pp.1115 - 1121
Fast inspection of solder ball bumps in ball grid array (BGA) is an important issue in the flip chip bonding technology. Particularly, semiconductor industry has required faster and more accurate inspection of micron-size solder bumps in flip chip bonding, as the density of balls increase dramatical...
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David McCann 2012, Advanced Packaging and Progress in 3D Integration, The ConFab 2012 Conference.
Shape Advanced Packaging and Progress in 3D Integration, The ConFab 2012 Conference.
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