초록

전기 임피던스 단층촬영 기법은 대상체 표면의 전극들을 통해 주입시킨 전류 데이터와 이에 유기되는 측정 전압 데이터를 기반으로 내부의 도전율 분포를 가시화하는 기법이다. 이 논문에서는 완전전극 모델을 사용한 해석적 방법의 해법을 유도하고 전압을 계산하였다. 그리고 기존의 수치적 해법인 유한 요소법과 경계 요소법을 사용하여 전압 데이터를 또한 계산하였다. 배경이 균질한 경우와 비균질한 경우에 대해 각 정문제 해법의 해를 실험 데이터 와 비교하였다. 그리고 평균 제곱근 오차를 계산하여 정문제 해법들의 오차를 비교분석하였다.

Abstract

Electrical impedance tomography is an imaging technique to reconstruct the internal conductivity distribution based on applied small currents and measured voltages through an array of electrodes attached on the boundary of a domain of interest. In this paper, an analytical solver with complete electrode model is derived and the analytical voltage data are calculated. Moreover, the voltage data are also computed with existing numerical solvers such as finite element method and boundary element method. The forward solutions using homogeneous and inhomogeneous conditions are compared with phantom experiments through the root mean square errors.

주제어

#electrical impedance tomography   #forward solver   #analytical method   #finite element method   #boundary element method  

참고문헌 (15)

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