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참고문헌 (7)

1. MIL-HDBK-217F, Military handbook: reliability prediction of electronic equipment(02-DEC-1991) 

2. F. Obeidat and R. Shuttleworth, "Reliability prediction of PV inverters based on MILHDBK- 217F N2," 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), pp. 1-6, Jun. 2015. 

3. A. S. Bahman, K. Ma, P. Ghimire, F. Iannuzzo, and F. Blaabjerg, “A 3-D-Lumped thermal network model for long-term load profiles analysis in high-power IGBT modules,” IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 4, No. 3, pp. 1050-1063, Sep. 2016. 

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4. R. Wu, P. D. Reigosa, F. Iannuzzo, L. Smirnova, H. Wang, and F. Blaabjerg, “Study on oscillations during short circuit of mw-scale igbt power modules by means of a 6-kA/1.1- kV nondestructive testing system,” IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 3, No. 3, pp. 756-765, Sep. 2015. 

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5. L. Smirnova, J. Pyrhonen, F. Iannuzzo, R. Wu, and F. Blaabjerg, "Round busbar concept for 30 nH, 1.7 kV, 10 kA IGBT non-destructive short-circuit tester," Power Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on, pp. 1-9, Aug. 26-28, 2014. 

6. H. Wang and F. Blaabjerg, “Reliability of capacitors for DC-link applications in power electronic converters-an overview,” IEEE Transacrtion on Industry Applications, Vol. 50, No. 5, pp. 3569-578, Sep. 2014. 

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7. H. Huang and P. A. Mawby, “A lifetime estimation technique for voltage source inverters,” IEEE Transactions on Power Electronics, Vol. 28, No. 8, pp. 4113-4119, Aug. 2013. 

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