최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기세라미스트 = Ceramist, v.22 no.4, 2019년, pp.357 - 367
변미랑 (한국기초과학지원연구원) , 김다영 (한국기초과학지원연구원) , 홍태은 (한국기초과학지원연구원)
Secondary Ion Mass Spectrometry(SIMS) is an analytical method that measures the distribution and concentration of elements or compounds by analyzing the mass of secondary ions released by irradiating ion beams with energy of hundreds eV to 20 keV on the sample surface. Unlike other similar analytica...
* AI 자동 식별 결과로 적합하지 않은 문장이 있을 수 있으니, 이용에 유의하시기 바랍니다.
A. Benninghoven, F.G.Rudenauer, and H.W.Werner, Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, Wiley, New York (1987)
R.G. Wilson, F.A.Stevie, and C.W.Magee, Secondary Ion Mass Spectrometry: A Practical Handbook For Depth Profiling And Bulk Impurity Analysis, Wiley (1989)
John C. Vickerman, Alan Brown, and Nicola M. Reed. "Secondary ion mass spectrometry: principles and applications", Oxford Science Publications (1989)
Vickerman, J.C. and Winograd, N., "SIMS-A precursor and partner to contemporary mass spectrometry" Int. J. Mass Spectrom., 377, [1], 568-579 (2015)
Liebl, H. and Herzog, R.F.K., "Sputtering ion source for solids", Journal of Applied Physics, 34, [9], 2893-2896 (1963)
J.A.McHugh, and A.W.Czanderna, "Methods of Surface Analysis", Oxford (1975)
Fred A. Stevie, "Secondary ion mass spectrometry: Applications for Depth Profiling and Surface Characterization", Momentum Press (2016)
Paul van der Heide, "Secondary Ion Mass Spectrometry", Willy (2014)
Alton, G.D., "Characterization of a cesium surface ionization source with a porous tungsten ionizer. I.", Rev. Scientific Instr, 59, [7] 1039-1044 (1988)
Coath, C.D., Long, J.V.P., "A high-brigtness duoplasmatron ion source for microprobe secondary-ion mass spectrometry", Rev. Scientific Instr, 66, [2], 1018-1023 (1995)
Mahoney, C.M., "Cluster Secondary Ion Mass Spectrometry: Principles and Applications", Wiley (2013)
Mair, G.L.R., "Liquid metal ion sources and their applications". International Journal of Mass Spectrometry and Ion Physics, 114, [1], 1-21 (1992)
최변각, "이차이온질량분석기의 구조와 원리", 한국기초과학지원연구원 (2019)
Dawson, P.H. "Quadrupoles for secondary ion mass spectrometry", International Journal of Mass Spectrometry and Ion Physics, 17, [4] 447-467 (1975)
J. C. Vickerman, David Briggs, "TOF-SIMS: Materials Analysis by Mass Spectrometry", IM Publications LLP (2013)
Neetu, K. and Bihani, S.G.L., "A review on mass spectrometry detectors". International Research Journal of Pharmacy, 3, [10], 33-42 (2012)
Wittmaack, K., "Primary-ion charge compensation in SIMS analysis of insulators", J. Appl. Phys., 50, [1] 493-497 (1979)
Migeon, H.N., Schuhmacher, M., Slodizan, G., "Analysis of insulating specimens with the Cameca IMS4f", Surf. Interface Anal. 16, 9-13 (1990)
P D.Briggs, and M.P.Seah, "Practical Surface Analysis", Wiley (1992)
McPhail, D. S. "Applications of secondary ion mass spectrometry (SIMS) in materials science", J. Mater. Sci., 41, [3], 873-903 (2006)
Tatsumi Ishihara, "Nanomaterials for Advanced Electrode of Low Temperature Solid Oxide Fuel Cells (SOFCs)", J. Kor. Ceram. Soc., 53 [5] 469-477 (2016)
Joon Hyung Shim, Joong Sun Park, Timothy P. Holme, Kevin Crabb, Wonyoung Lee, Young Beom Kim, Xu Tian, Turgut M. Gur, Fritz B. Prinz,"Enhanced Oxygen exchange and incorporation at surface grain boundaries on an oxide ion conductor", Acta Mater., 60 [1] 1-7 (2012)
Shankar Dutta, Akhilesh Pandey, Kajal Jindal, O. P. Thakur, Vinay Gupta, Ratnamala Chatterjee,"Optical properties of Pb $(Zr_{0.52}Ti_{0.48})O_3/BiFeO_3$ multilayers with ZnO buffer layer", Appl. Phys. A, 210 [1] 53-58 (2015)
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
오픈액세스 학술지에 출판된 논문
※ AI-Helper는 부적절한 답변을 할 수 있습니다.