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NTIS 바로가기한국표면공학회지 = Journal of the Korean institute of surface engineering, v.55 no.2, 2022년, pp.91 - 95
김현진 (울산대학교 첨단소재공학부) , 장진규 (울산대학교 첨단소재공학부) , 최재욱 (울산대학교 첨단소재공학부) , 이연학 (울산대학교 첨단소재공학부) , 허성보 (한국생산기술연구원 동남본부 첨단하이브리드생산기술센터) , 공영민 (울산대학교 첨단소재공학부) , 김대일 (울산대학교 첨단소재공학부)
ZnO single layer (60 nm thick) and ZnO with Ag interlayer (ZnO/Ag/ZnO; ZAZ) films were deposited on the glass substrates by using radio frequency (RF) and direct current (DC) magnetron sputter to evaluate the effectiveness of Ag interlayer on the optical visible transmittance and the conductivity of...
M. Yahya, M. R. Fadavieslam, The effects of argon plasma treatment on ITO properties and the performance of OLED devices, Opt. Mater., 120 (2021) 111400.
B, Barman, S. Kumar, V. Dutta, Fabrication of highly conducting ZnO/Ag/ZnO and AZO/Ag/AZO transparent conducting oxide layers using RF magnetron sputtering at room temperature, Mater. Sci. Semicond. Process, 129 (2021) 105801.
B. He, J. Xu, H. Z. Xing, C. R. Wang, X. D. Zhang, The effect of substrate temperature on high quality c-axis oriented AZO thin films prepared by DC reactive magnetron sputtering for photoelectric device applications, Superlattices Microstruct., 64 (2013) 319-330.
M. Alauddin, J. K. Song, S. M. Park, Effects of aluminum doping and substrate temperature on zinc oxide thin films grown by pulsed laser deposition, Appl. Phys. A, 101 (2010) 707-711.
S. B. Koo, C. M. Lee, S. J. Kwon, J. M. Jeon, J. Y. Hur, H. K. Lee, Study on aging effect of adhesion strength between polyimide film and copper layer, Met. Mater. Int., 25 (2019) 117-126.
S. H. Choe, S. B. Heo, J. K. Jang, H. J. Kim, J. W. Choi, Y. S. Kim, Y. M. Kong, D. Kim, Effect of electron irradiation on the optical and electrical properties of TIO/Ag/TIO films, J. Korean Soc. Manuf. Technol. Eng., 30 (2021) 410-414.
D. Kim, The structural and optoelectrical properties of TiON/Au/TiON multilayer films, Mater. Lett., 64 (2010) 668-670.
B. D. Cullity, Elements of X-ray diffraction, M. Cohen, Eds., Addison-Wesley Pub. Co., Boston, MA, USA (1978).
Y. S. Kim, J. Y. Choi, Y. J. Park, S. H. Choe, Y. M. Gong, D. Kim, Influence of film thickness on the electrical and optical properties of ZnO/Ag/SnO 2 tri-layer films, Korean J. Met. Mater., 57 (2019) 324-327.
S. Peng, T. Yao, Y. Yang, K. Zhang, J. Jiang, K. Jin, G. Li, X. Cao, G. Xu, Y. Wang, Influences of the RF power ratio on the optical and electrical properties of GZO thin films by DC coupled RF magnetron sputtering at room temperature, Physica B., 503 (2016) 111-116.
B. G. Bagley, Amorphous and liquid semiconductor, J. Tauc, Eds., Plenum Press, New York, USA (1974).
Y. Wang, W. Tang, L. Zhang, J. Zhao, Electron concentration dependence of optical band gap shift in Ga-doped ZnO thin films by magnetron sputtering, Thin Solid Films, 565 (2014) 62-68.
G. Haacke, New figure of merit for transparent conductors, J. Appl. Phys., 47 (1976) 4086.
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