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NTIS 바로가기Thin solid films, v.377/378, 2000년, pp.525 - 529
Kim, Jean-Jong (Department of Ceramic Engineering, Yonsei University, 134 Sinchon-dong, Seodaemun-ku, Seoul 120-749, South Korea) , Park, Hyung-Ho (Corresponding author.Tel.: +82-2-361-2853) , Hyun, Sang-Hoon (fax: +82-2-365-5882)
AbstractIn order to reduce the R–C time delay of ULSI circuits, interconnection materials with low resistance and/or interlayer films with low dielectric constant should be applied. A SiO2 aerogel film processed by spin-coating and supercritical drying has high porosity and large integral sur...
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