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[해외논문] Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon 원문보기

Journal of instrumentation an IOP and SISSA journal, v.15 no.1, 2020년, pp.P01019 - P01019  

Nakarmi, P. ,  Ostrovskiy, I. ,  Soma, A.K. ,  Retière, F. ,  Kharusi, S. Al ,  Alfaris, M. ,  Anton, G. ,  Arnquist, I.J. ,  Badhrees, I. ,  Barbeau, P.S. ,  Beck, D. ,  Belov, V. ,  Bhatta, T. ,  Blatchford, J. ,  Breur, P.A. ,  Brodsky, J.P. ,  Brown, E. ,  Brunner, T. ,  Mamahit, S. Byrne ,  Caden, E. ,  Cao, G.F. ,  Cao, L. ,  Chambers, C. ,  Chana, B. ,  Charlebois, S.A. ,  Chiu, M. ,  Cleveland, B. ,  Coon, M. ,  Craycraft, A. ,  Dalmasson, J. ,  Daniels, T. ,  Darroch, L. ,  Croix, A. De St. ,  Mesrobian-Kabakian, A. Der ,  DeVoe, R. ,  Vacri, M.L. Di ,  Dilling, J. ,  Ding, Y.Y. ,  Dolinski, M.J. ,  Doria, L. ,  Dragone, A. ,  Echevers, J. ,  Edaltafar, F. ,  Elbeltagi, M. ,  Fabris, L. ,  Fairbank, D. ,  Fairbank, W. ,  Farine, J. ,  Ferrara, S. ,  Feyzbakhsh, S. ,  Fontaine, R. ,  Fucarino, A. ,  Gallina, G. ,  Gautam, P. ,  Giacomini, G. ,  Goeldi, D. ,  Gornea, R. ,  Gratta, G. ,  Hansen, E.V. ,  Heffner, M. ,  Hoppe, E.W. ,  Hößl, J. ,  House, A. ,  Hughes, M. ,  Iverson, A. ,  Jamil, A. ,  Jewell, M.J. ,  Jiang, X.S. ,  Kar

초록이 없습니다.

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