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Microchemical journal, v.159, 2020년, pp.105446 -
Terlier, Tanguy (Advanced Analysis Center, Korea Institute of Science and Technology) , Lee, Kang-Bong (National Agenda Research Division, Korea Institute of Science and Technology) , Lee, Yeonhee (Advanced Analysis Center, Korea Institute of Science and Technology)
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Abstract Recognizing the chemical composition of samples or specimens from time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is particularly challenging. Although ToF-SIMS is a powerful tool for obtaining high-quality mass spectra, and produces a large raw dataset with rich chemical informa...
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