[논문]Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

Cho, Minji; Lee, Heechul; Woo, Doohyung

doi:10.3390/electronics9101603

[해외논문] Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems 원문보기

Electronics, v.9 no.10, 2020년, pp.1603 -

Cho, Minji (School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea) , Lee, Heechul (School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea) , Woo, Doohyung (School of Information, Communications and Electronics Engineering, The Catholic University of Korea, Gyeonggi-do 14662, Korea)

Abstract ▼ AI-Helper

In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%.

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