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NTIS 바로가기Electronics, v.9 no.7, 2020년, pp.1119 -
Chae, Seongje , Ahn, Chi Young , Park, Won-Kwang
We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters. For this purpose, we design an indicator function of OSM defined on a Lebesgue space to test the orthogonality relation betw...
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