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NTIS 바로가기Applied sciences, v.10 no.20, 2020년, pp.7066 -
Kim, Si Jun (Nanotech Optoelectronics Research Center, Yongin Gyonggi Province 16882, Korea) , Lee, Jang Jae (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University, Daejeon 34134, Korea) , Lee, Young Seok (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University, Daejeon 34134, Korea) , Yeom, Hee Jung (Korea Research Institute of Standards and Science, Daejeon 34113, Korea) , Lee, Hyo Chang (Korea Research Institute of Standards and Science, Daejeon 34113, Korea) , Kim, Jung-Hyung (Korea Research Institute of Standards and Science, Daejeon 34113, Korea) , You, Shin Jae (Applied Physics Lab for PLasma Engineering (APPLE), Department of Physics, Chungnam National University, Daejeon 34134, Korea)
The microwave planar cutoff probe, recently proposed by Kim et al. is designed to measure the cutoff frequency in a transmission (S21) spectrum. For real-time electron density measurement in plasma processing, three different types have been demonstrated: point-type, ring-type (RCP), and bar-type (B...
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