[논문]Life-Cycle Expectation Using Fault-Tree Analysis for Improved Hybrid Submodule in HVDC System

Kang, Feel-Soon; Song, Sung-Geun

doi:10.3390/electronics10020133

[해외논문] Life-Cycle Expectation Using Fault-Tree Analysis for Improved Hybrid Submodule in HVDC System 원문보기

Electronics, v.10 no.2, 2021년, pp.133 -

Kang, Feel-Soon (Department of Electronics and Control Engineering, Hanbat National University, Daejeon 34158, Korea) , Song, Sung-Geun (Energy Conversion Research Centre, Korea Electronics Technology Institute, Gwangju 61011, Korea)

Abstract ▼ AI-Helper

An improved hybrid submodule employs a direct current (DC) short current protection function to improve the reliability of a high-voltage direct current (HVDC) system. However, it increases the number of circuit components to implement the protection. So, we need to evaluate the relationship between the protection function and the increased number of circuit components to assess whether the improved hybrid submodule (IHSM) is suitable to practical application or not from the viewpoint of reliability. Although conventional part count failure analysis considers the type and the number of parts, it cannot reflect the operational characteristics of the submodule. To overcome this problem, we design a fault tree that reflects the operational characteristics of IHSM and calculates the failure rate by using MIL-HDBK-217F. By part count failure analysis (PCA) and fault-tree analysis (FTA), we prove the high reliability of IHSM compared to half-bridge, full-bridge, and clamped-double submodules.

참고문헌 (25)

Billinton A Security Based Approach to Composite Power System Reliability Evaluation IEEE Trans. Power Syst. 1992 10.1109/59.141688 7 65

상세보기
Choi, J., Kim, H., Cha, J., and Billinton, R. (2001, January 15-19). Nodal Probabilistic Congestion and Reliability Evaluation of a Transmission System under the Deregulated Electricity Market. Proceedings of the IEEE PES SM2001 Conference, Vancouver, BC, Canada.
Xu Reliability Modeling of MMCs Considering Correlations of the Requisite and Redundant submodules IEEE Trans. Power Deliv. 2018 10.1109/TPWRD.2017.2757607 33 1213

상세보기
10.1109/eGRID.2018.8598662 Alharbi, M., Isik, S., and Bhattacharya, S. (2018, January 12-14). Reliability Comparison and Evaluation of MMC Based HVDC Systems. Proceedings of the 2018 IEEE Electronic Power Grid (eGrid), Charleston, SC, USA.
Guo Reliability Analysis of MMCs Considering Submodule Designs with Individual or Series-Operated IGBTs IEEE Trans. Power Deliv. 2017 10.1109/TPWRD.2016.2572061 32 666

상세보기
Xu Reliability Analysis and Redundancy Configuration of MMC with Hybrid Submodule Topologies IEEE Trans. Power Elect. 2016 10.1109/TPEL.2015.2444877 31 2720

상세보기
Dong Neutral-Point-Shift-Based Active Thermal Control for a Modular Multilevel Converter Under a Single-Phase-to-Ground Fault IEEE Trans. Ind. Electron. 2019 10.1109/TIE.2018.2833019 66 2474

상세보기
Kang Fault-tree Analysis Based Life-cycle Expectation for Half-bridge Submodule in HVDC Trans. Korean Inst. Elect. Eng. 2020 10.5370/KIEE.2020.69.1.42 69 42

상세보기
Kang Life-cycle estimation of HVDC full-bridge sub-module considering operational condition and redundancy Trans. Inst. Korean Elect. Electron. Eng. 2019 23 1208
Kang Fault-tree based reliability analysis for paralleled half-bridge sub-module of HVDC Trans. Inst. Korean Elect. Electron. Eng. 2019 23 1218
10.1109/IPEC.2010.5544594 Marquardt, R. (2010, January 21-24). Modular Multilevel Converter: A Universal Concept for HVDC-Networks and extended DC-Bus-applications. Proceedings of the International Power Engineering Conference (IPEC), Sapporo, Japan.
Zhang Simulation analysis on submodule topology of modular multilevel converter Autom. Electr. Power Syst. 2015 39 106
Zhao A sub-module technology of MMC with DC fault ride-through capability Power Syst. Technol. 2015 38 106
Yang An Industry-Based Survey of Reliability in Power Electronic Converters IEEE Trans. Ind. Appl. 2011 10.1109/TIA.2011.2124436 47 1441

상세보기
Song Survey on Reliability of Power Electronics Systems IEEE Trans. Power Electron. 2013 10.1109/TPEL.2012.2192503 28 591

상세보기
Denson The history of reliability prediction IEEE Trans. Reliab. 1998 10.1109/24.740547 47 321

상세보기
Wang Overview of system reliability prediction method Aircr. Des. 2008 28 37
Li A brief analysis about the guide and standard of reliability prediction and estimation for electronic system and equipment Aeronaut. Stand. Qual. 2006 1 50
10.1109/QR2MSE.2013.6625547 Mou, H., Hu, W., Sun, Y., and Zhao, G. (2013, January 15-18). A Comparison and Case Studies of Electronic Product Reliability Prediction Methods Based on Handbooks. Proceedings of the International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), Chengdu, China.
Jones A comparison of electronic-reliability prediction models IEEE Trans. Reliab. 1999 10.1109/24.784270 48 127

상세보기
Cushin Comparison of Electronics-Reliability Assessment Approaches IEEE Trans. Reliab. 1993 10.1109/24.273574 42 542

상세보기
(2021, January 08). Reliability Prediction of Electric Equipment. Department of Defense, Washington DC, Tech. Rep. MIL-HDBK-217F, Dec. 1991. Available online: http://everyspec.com/MIL-HDBK/MIL-HDBK-0200-0299/MIL-HDBK-217F_14591.
10.1109/IC4.2015.7375644 Choudhary, K., and Sidharthan, P. (2015, January 10-12). Reliability Prediction of Electronic Power Conditioner (EPC) using MIL-HDBK-217 based Parts Count Method. Proceedings of the 2015 International Conference on Computer, Communication and Control (IC4), Indore, India.
Lambilly Failure Analysis of Power Modules: A Look at the Packaging and Reliability of Large IGBT’s IEEE Trans. Compon. Hybrids Manuf. Tech. 1993 10.1109/33.237930 16 412

상세보기
Valentine, N., Das, D., and Pecht, M. (2021, January 08). Failure Mechanisms of Insulated Gate Bipolar Transistors (IGBTs), NREL Photovoltaic Reliability Workshop, Available online: https://www.nrel.gov/pv/assets/pdfs/2015_pvmrw_131_das.pdf.

LOADING...

활용도 분석정보

상세보기

다운로드

내보내기

활용도 Top5 논문

해당 논문의 주제분야에서 활용도가 높은 상위 5개 콘텐츠를 보여줍니다.
더보기 버튼을 클릭하시면 더 많은 관련자료를 살펴볼 수 있습니다.

원문 보기

AccessON 원문보기

원문 URL 링크

DOI : 10.3390/electronics10020133 [무료]
Molecular Diversity Preservation International : 저널 > 논문 [무료]
AccessON : 저널

*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.

오픈액세스(OA) 유형

GOLD

오픈액세스 학술지에 출판된 논문

저작권 관리 안내

내보내기 메뉴

내보내기 구분

파일저장
인쇄
메일전송

구성항목

기본정보
상세정보

관리번호, 논문명, 저널/프로시딩명, 저자 , 발행년, 권, 호, 시작페이지, 끝페이지, 발행기관

저장형식

Text(ASCII format)
Excel format
RefWorks Direct Export
RIS format (for Reference Manager, ProCite, EndNote), Scholar's Aids, Mendeley

메일정보

받는사람 (필수): @
보내는사람 (선택): @
제목
내용: KISTI 검색결과 이메일 서비스

안내

총 건의 자료가 검색되었습니다.

다운받으실 자료의 인덱스를 입력하세요. (1-10,000)

검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다.

데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요)

다운로드 파일은 UTF-8 형태로 저장됩니다.
파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오.

Text(ASCII format)
Excel format

표제어: PCR

동의어: Packet Collision Rate

용어 설명 출처 목록 (6)

용어 설명: PCR은 세균 특이성이 있는 primer를 이용하여 적은 수의 세균이 있을지라도 쉽게 검출할 수 있는 유용한 방법이며, 이를 이용하여 구강 내 치면세균막이나 타액에서 직접 세균을 검출할 수 있게 되었다[8].

AI-Helper ※ AI-Helper는 을 사용합니다.

AI-Helper

안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

연합인증