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NTIS 바로가기IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society,, v.34 no.1, 2021년, pp.49 - 57
Kareem, Pervaiz (KAIST, School of Electrical Engineering, Daejeon, South Korea) , Shin, Youngsoo (KAIST, School of Electrical Engineering, Daejeon, South Korea)
Diversity of test patterns is important for many lithography applications. It is however difficult to achieve with sample layouts or by using a popular pattern generator. We propose a synthesis method of lithography test patterns. Each pattern is represented by a map of IPS (image parameter space) v...
Yang, Haoyu, Su, Jing, Zou, Yi, Ma, Yuzhe, Yu, Bei, Young, Evangeline F. Y.. Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning. IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society, vol.38, no.6, 1175-1187.
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