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NTIS 바로가기IEEE transactions on very large scale integration (VLSI) systems, v.29 no.3, 2021년, pp.512 - 518
Yang, Isaak (Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea) , Cho, Kwang-Hyun (Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea)
Timing error is now getting increased attention due to the high rate of error-occurrence on semiconductors. Even slight external disturbance can threaten the timing margin between successive clocks since the latest semiconductor operates with high frequency and small supply voltage. To deal with a t...
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Zhang, Yiqun, Khayatzadeh, Mahmood, Yang, Kaiyuan, Saligane, Mehdi, Pinckney, Nathaniel, Alioto, Massimo, Blaauw, David, Sylvester, Dennis. iRazor: Current-Based Error Detection and Correction Scheme for PVT Variation in 40-nm ARM Cortex-R4 Processor. IEEE journal of solid-state circuits, vol.53, no.2, 619-631.
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