[논문]Wafer Delay Analysis and Workload Balancing of Parallel Chambers for Dual-Armed Cluster Tools With Multiple Wafer Types

Ko, Sung-Gil; Yu, Tae-Sun; Lee, Tae-Eog

doi:10.1109/tase.2021.3061140

[해외논문] Wafer Delay Analysis and Workload Balancing of Parallel Chambers for Dual-Armed Cluster Tools With Multiple Wafer Types

IEEE transactions on automation science and engineering, v.18 no.3, 2021년, pp.1516 - 1526

Ko, Sung-Gil (Defense Acquisition Program Administration (DAPA), Gwacheon, South Korea) , Yu, Tae-Sun (Pukyong National University, Division of Systems Management and Engineering, Busan, South Korea) , Lee, Tae-Eog (Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea)

Abstract ▼ AI-Helper

We examine a scheduling problem for a dual-armed cluster tool that processes multiple similar wafer types concurrently. It has been recently proved that the well-known swap sequence, which is widely used for single wafer type processing, also minimizes the cycle time for concurrent processing. In this article, we wish to minimize wafer delays in a process chamber, which are critical to wafer quality degradation, while maintaining the minimum cycle time. In particular, we show that concurrent processing of wafers with different processing times complicates the analysis of wafer delays significantly, and the wafer delays can be remarkably reduced by finding a proper cycle plan which is the release sequence of different wafer types. We first characterize wafer delays for a given cycle plan by analyzing the circuits of the timed event graph (TEG) model. From this, we prove that concurrent processing of wafers may cause a significant workload imbalance between parallel chambers of a process step, and hence the wafer delays increase substantially. We present that the wafer delays are minimized by a cycle plan that evenly balances workloads between parallel chambers. We also propose how wafer loading task at each process step has to be postponed to meet wafer delay constraints while maintaining the minimum cycle time. Note to Practitioners—Wafer quality control has become an essential fab operational problem in semiconductor manufacturing industry. In cluster tools, which are dominantly being used for diverse wafer fabrication stages, it has been proven that the wafer delays within process chambers have a crucial impact on the wafer quality. Accordingly, modern fabs have introduced stringent quality control to regulate wafer delays in cluster tools. In this research, we propose a scheduling strategy to minimize the wafer delays when a cluster tool concurrently processes multiple wafer types. We first show that the release sequence of different wafer types significantly impacts the wafer delays under concurrent processing, and we then propose how these wafer delays can be minimized by finding the optimal wafer release sequence.

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