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[해외논문] Bayesian Optimization of MOSFET Devices Using Effective Stopping Condition 원문보기

IEEE access : practical research, open solutions, v.9, 2021년, pp.108480 - 108494  

Kim, Bokyeom (Korea Advanced Institute of Science and Technology, School of Electrical Engineering, Daejeon, South Korea) ,  Shin, Mincheol (Korea Advanced Institute of Science and Technology, School of Electrical Engineering, Daejeon, South Korea)

Abstract AI-Helper 아이콘AI-Helper

Current nanometer-scale metal-oxide-semiconductor field-effect transistor (MOSFET) devices exhibit short-channel, quantum, and self-heating effects, making modeling and analysis very complex. A few recent works have employed machine-learning (ML) techniques and neural networks (NN) to model the comp...

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