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NTIS 바로가기Journal of welding and joining = 대한용접·접합학회지, v.39 no.4, 2021년, pp.359 - 367
Kim, Mi-Song , Hong, Won Sik , Kim, Myeongin
In this study, thermo-compression(TC) and vacuum reflow(VR) bonding processes of fine pitch interconnection were optimized using Type 7 Sn-3.0Ag-0.5Cu solder paste. A chip with Cu pillar Sn-2.5Ag bumps and BT substrate with ENEPIG surface finish were used, and the thickness and the aperture ratio of...
Fine Pitch Surface Mount Technology Ahn 30 1995
Study of Interconnection Process for Fine Pitch Flip Chip Lee 234 2009
Kim, Mi-Song, Kang, Myoung-Seok, Bang, Jung-Hwan, Lee, Chang-Woo, Kim, Mok-Soon, Yoo, Sehoon. Interfacial reactions of fine-pitch Cu/Sn–3.5Ag pillar joints on Cu/Zn and Cu/Ni under bump metallurgies. Journal of alloys and compounds, vol.616, 394-400.
Recent Trends of Flip Chip Bonding Technology Choi 100
Kim, Sujong, Hong, Wonsik, Nam, Hyunbin, Kang, Namhyun. Growth Behavior of Intermetallic Compounds in Various Solder Joints Induced by Electromigration. Journal of welding and joining = 대한용접·접합학회지, vol.39, no.1, 89-102.
Back, Jong-Hoon, Yoo, Sehoon, Han, Deok-Gon, Jung, Seung-Boo, Yoon, Jeong-Won. Effect of Thin ENEPIG Plating Thickness on Interfacial Reaction and Brittle Fracture Rate of Sn-3.0Ag-0.5Cu Solder Joints. Journal of welding and joining = 대한용접·접합학회지, vol.36, no.5, 52-60.
Ha, S.S., Kim, D.G., Kim, J.W., Yoon, J.W., Joo, J.H., Shin, Y.E., Jung, S.B.. Interfacial reaction and joint reliability of fine-pitch flip-chip solder bump using stencil printing method. Microelectronic engineering, vol.84, no.11, 2640-2645.
Back, Jong-Hoon, Yoo, Sehoon, Han, Deok-Gon, Jung, Seung-Boo, Yoon, Jeong-Won. Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/0.1㎛-Ni thin ENEPIG solder joint. Journal of welding and joining = 대한용접·접합학회지, vol.35, no.6, 51-58.
Li, Junhui, Zhang, Yuexin, Zhang, Haoliang, Chen, Zhuo, Zhou, Can, Liu, Xiaohe, Zhu, Wenhui. The thermal cycling reliability of copper pillar solder bump in flip chip via thermal compression bonding. Microelectronics reliability, vol.104, 113543-.
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