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Journal of research of the National Institute of Standards and Technology, v.106 no.6, 2001년, pp.1013 - 1028
Wong-Ng, W. (National Institute of Standards and Technology, Gaithersburg, MD 20899-0001) , McMurdie, H. F. (National Institute of Standards and Technology, Gaithersburg, MD 20899-0001) , Hubbard, C. R. (National Institute of Standards and Technology, Gaithersburg, MD 20899-0001) , Mighell, A. D. (National Institute of Standards and Technology, Gaithersburg, MD 20899-0001)
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The Research Associateship program of the Joint Committee on Powder Diffraction-International Centre for Diffraction Data (JCPDS-ICDD, now known as the ICDD) at NBS/NIST was a long standing (over 35 years) successful industry-government cooperation. The main mission of the Associateship was to publi...
1 Hanawalt JD Rinn HW Frevel LK Chemical Analysis by X-Ray Diffraction Ind Eng Chem, Anal Ed 10 457 512 1938
2 Hull AW A New Method of Chemical Analysis J Am Chem Soc 41 1168 1175 1919
3 X-ray Diffraction Data for Chemical Analysis ASTM Bull 135 64 65 1945
4 Revised Card Index File of X-Ray Diffraction Data for Identification of Crystalline Materials to be Issued Soon ASTM Bull 160 18 19 1949
5 Powder Diffraction File (PDF), copyright by International Centre for Diffraction Data (ICDD) Newtown Square 12 Campus Blvd., Newtown Square, PA 19073-3273
6 Wong-Ng W Hubbard CR Stalick JK Evans EH Computerization of the ICDD Powder Diffraction Database. Critical Review of Sets 1 to 32 Powder Diffr 3 1 12 18 1988
7 Wong-Ng W Holomany M McClune WF Hubbard CR The JCPDS Database—Present and Future Adv X-Ray Anal 26 87 88 1983
8 Jenkins R Holomany M Wong-Ng W On the Need for Users of the Powder Diffraction File to Update Regularly Powder Diffr 2 2 84 87 1987
9 McMurdie HF Morris MC Evans EH Paretzkin B Wong-Ng W Methods of Producing Standard X-Ray Diffraction Powder Patterns Powder Diffr 1 1 40 43 1986
9a Hubbard CR Evans EH Smith DK Reference Intensity Ratio, I/I c , for Computer-Simulated Powder Patterns J Appl Crystallogr 9 169 174 1976
10 Hubbard CR Snyder RL RIR—Measurement and Use in Quantitative XRD Powder Diffr 3 2 74 77 1988
10a Hubbard CR Certificates for SRM 640
11 Snyder RL Hubbard CR Panagiotopoulos NC A Second Generation Automated Powder Diffractometer Control System Adv X-Ray Anal 25 245 260 1982
12 Pyrros NP Hubbard CR Powder-Pattern: A System of Programs for Processing and Interpreting Powder Diffraction Data Adv X-Ray Anal 26 63 72 1983
13 Dragoo AL Standard Reference Materials for X-Ray Diffraction, Part I. Overview of Current and Future Standard Reference Materials Powder Diffr 1 4 294 298 1986
14 Standard Reference Material 640a (1982), Silicon Powder X-Ray Diffraction Standard, produced by the Office of Standard Reference Materials, Natl. Inst. Stand. Technol., Gaithersburg, MD 20899.
15 Standard Reference Material 640b (1989), Silicon Powder X-Ray Diffraction Standard, produced by the Office of Standard Reference Materials, Natl. Inst. Stand. Technol., Gaithersburg, MD 20899.
16 Standard Reference Material 640c (2000), Silicon Powder X-Ray Diffraction Standard, produced by the Office of Standard Reference Materials, Natl. Inst. Stand. Technol., Gaithersburg, MD 20899. Current price will be quoted on request.
17 Cheary RW Coelho A A Fundamental Parameters Approach to X-Ray Line-Profile Fitting J Appl Crystallogr 25 109 121 1992
18 Standard Reference Material 675 (1982), Fluorophlogopite Powder X-Ray Diffraction Standard. To obtain, see procedure above for SRM 640c.
19 Wong-Ng W Hubbard CR Standard Reference Materials for X-Ray Diffraction. Part II. Calibration Using d -Spacing Standards Powder Diffr 2 4 242 248 1987
20 NIST Crystal Data, A Database with Chemical and Crystallographic Information. NIST Crystallographic Data Center, National Institute of Standards and Technology, Gaithersburg, MD 20899.
21 Stalick JK Mighell AD Crystal Data Version 1.0 Database Specifications NBS Technical Note 1229 1986
22 Mighell AD Hubbard CR Stalick JK NBS*AIDS80. A FORTRAN Program for Crystallographic Data Evaluation Natl Bur Stand (US) NBS Technical Note 1141 1981
22a Santoro A Mighell AD Determination of Reduced Cells Acta Crystallogr A26 124 127 1970
22b Hubbard CR Calvert LD The Pearson Symbol Bull Alloy Phase Diagram 2 2 153 1981
23 Jenkins R Holomany M “PC-PDF”: A Search/Display System Utilizing the CD-ROM and the Complete Powder Diffraction File Powder Diffr 2 4 215 219 1987
24 Phase Equilibria Diagrams Database (Phase Diagrams for Ceramists). Compiled in the Ceramics Division, National Institute of Standards and Technology; Published by The American Ceramic Society, 735 Ceramic Place, Westerville, Ohio 43081.
25 Rietveld HM A Profile Refinement Method for Nuclear and Magnetic Structures J Appl Crystallogr 2 65 71 1969
26 A. C. Larson and R. B. von Dreele, GSAS The General Structure Analysis System, US Government contract (W-7405-ENG-36) by the Los Alamos National Laboratory, which is operated by the University of California for the U.S. Department of Energy, VMS version 24.
27 Visser JW A Fully Automatic Program for Finding the Unit Cell from Powder Data J Appl Crystallogr 2 89 95 1969
28 Boultif A Louer D Indexing of Powder Diffraction Patterns for Low-Symmetry Lattices by the Successive Dichotomy Method J Appl Crystallogr 24 987 993 1991
29 Gelato LM Parthé E STRUCTURE TIDY—A Computer Program to Standardize Crystal Structure Data J Appl Crystallogr 20 139 143 1987
30 Mighell AD Karen (Himes) VL Compound Identification and Characterization Using Lattice-Formula Matching Techniques Acta Crystallogr A42 101 105 1986
31 Karen VL Mighell AD NIST*LATTICE—A Program to Analyze Lattice Relationships, Version of Spring 1991 NIST Technical Note 1290 1991 see also NBS Technical Note 1214 (1985)
32 Karen VL Mighell AD Converse Transformation Analysis J Appl Crystallogr 24 1076 1078 1991
33 Le Page Y MISSYM J Appl Crystallogr 21 983 984 1988
34 Bergerhoff G DIAMOND. Gerhard-Domagk-Strasse 1, 53121 Bonn, Germany 1996
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