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Cryogenics, v.36 no.5, 1996년, pp.325 - 331
Sreelakshmi, K. (Devices Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore 560 012, India) , Satyam, M. (Devices Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore 560 012, India)
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AbstractThis paper describes the measured electrical characteristics of JFETs in the temperature range from 300 K to 20 K. Also explained is an attempt to compute these characteristics at any temperature lower than 300 K knowing the characteristics at room temperature....
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