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NTIS 바로가기表面科學 = Journal of the Surface Science Society of Japan, v.28 no.4, 2007년, pp.223 - 226
大西 剛 (東京大学) , Mikk LIPPMAA (物性研)
Here we introduce a scanning reflection high-energy electron diffraction technique (Scanning RHEED), that is used to measure simultaneously multiple RHEED intensity variation curves as a function of position, azimuth angle, incident angle or combinations of all three, during epitaxial film growth on...
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